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Facility for Design, Simulation, MIcro- and NAnoFABrication of electronic devices and systems (IMT-MINAFAB)
National Institute for Research and Development in Microtechnologies - IMT Bucharest
Short link:
https://eeris.eu/
ERIF-2000-000A-1410
3211
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The Facility for Design, Simulation, MIcro- and NAnoFABrication of electronic devices and systems (IMT-MINAFAB) at the National Institute for R&D in Microtechnologies (IMT Bucharest) is an experimental facility - in operation since 2009 - covering the full development cycle for micro- and nano systems and devices: design-modeling-simulation, basic and advanced processing, complex characterization, device/system integration, and reliability testing. It consists of clean room and grey room areas ...
Miron Adrian
DINESCU
adrian.dinescu@imt.ro
PhD.
SCIENTIFIC TEAM
32
Bianca ADIACONITA
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Bogdan Ionut BITA
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Adina BOLDEIU
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George BOLDEIU
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Alina BUNEA
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Florin COMANESCU
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Silviu DINULESCU
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Raluca GAVRILA
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Octavian IONESCU
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Cristian KUSKO
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Mihaela KUSKO
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Mihai KUSKO
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Catalin MARCULESCU
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Stoian MARIUS
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Iuliana MIHALACHE
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Gabriel MOAGAR-POLADIAN
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Victor MOAGAR-POLADIAN
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George MUSCALU
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Oana Tatiana NEDELCU
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Alexandru- Cosmin OBREJA
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Paula OBREJA
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Rodica PLUGARU
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Marian Catalin POPESCU
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Melania POPESCU
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Munizer PURICA
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Antonio RADOI
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Cosmin ROMANITAN
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Monica SIMION
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Catalin TIBEICA
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Vasilica TUCUREANU
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Pericle VARASTEANU
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Dragos VARSESCU
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Micro and Nanotechnology Facilities
RI Domain of activity
Type Of RI:
Single sited RI
RI Life Cycle Status:
Active RI
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
X- ray difraction characterization for thin films
SERVICE DESCRIPTION:
• X-ray Powder Diffraction (XRPD), can use DTexUltra high speed SSD; • High resolution Powder Diffraction (polycrystals) - HRXRPD, using expanded range of monochromators: Ge (220) 2/4 bounce Ge(440) 4 bounce and the and the new CALSA analyzer - Ge(111) high performance compact multi-crystal single reflexion analyzer; • High resolution X-ray diffraction (HRXRD) (including multiple reflection HR-MRMCXRD Ge(220) 2/4 bounce monochromator, Ge(440) 4 bounce monochromator, Ge(220) 2 bounce analyzer, focussing/flat diffracted beam monchromator); • X-ray reflectometry (XRR, including HRMR XRR); • Grazing incidence diffraction (GIXRD); • Transmision diffraction&SAXS measurements; • In-plane grazing incidence diffraction (IPGID); • Small angle X-ray scattering (SAXS, USAXS); • Single crystal diffraction (SCD); Main equipment used: X-ray Thin film Difraction System (XRD) / SmartLab/Rigaku Corporation/ 2008
SERVICE PERSONS:
Cosmin ROMANITAN
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Electrochemical investigations
SERVICE DESCRIPTION:
A wide range of electrochemical characterizations, from classical cyclic voltammetry (CV), to electrochemical impedance spectroscopy (EIS). Main equipment used: Potentiostat/galvanostat system - AUTOLAB 302N/ Metrohm Autolab B.V./ 2010
SERVICE PERSONS:
Antonio RADOI
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DNA microarray slide, Protein microarray slide
SERVICE DESCRIPTION:
Production of high density DNA/ protein arrays on specialized slides for genetic and proteomic applications. Main equipment used: Micro-Nano Plotter - OmniGrid /Genomic Solutions Ltd./2005
SERVICE PERSONS:
Monica SIMION
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DNA/protein microarray slide analysis
SERVICE DESCRIPTION:
Reading and analysis of DNA/ protein arrays for genetic and proteomic applications. Main equipment used: Microarray Scanner - GeneTAC UC4/Genomic Solutions Ltd./2005
SERVICE PERSONS:
Monica SIMION
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Electrochemical analyses
SERVICE DESCRIPTION:
Materials and fabrication processes characterization. Characterization of electrochemical systems and physico-chemical phenomena of the corresponding interfaces. Bio-electrochemical systems characterization. Main equipment used: Electrochemical Impedance Spectrometer - PARSTAT 2273/ Princeton Applied Research/2008
SERVICE PERSONS:
Mihaela KUSKO
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Fluorimetry/ fluorescence measurements
SERVICE DESCRIPTION:
Measurements of steady state emission and excitation spectra (200- 850nm). Measurements of fluorescence lifetimes (10ps-10s) of fluorescent compounds. Main equipment used: Fluorescence Spectrometer - FLS920 /Edinburgh Instruments Ltd. /2010
SERVICE PERSONS:
Iuliana MIHALACHE
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High resolution electrochemical probe scanning
SERVICE DESCRIPTION:
→ Studies of heterogeneous electron transfer reactions → Characterization of thin films and membranes → Probing patterned biological systems Main equipment used: Scanning Electrochemical Microscope (SECM) – ElProScan/ HEKA Elektronik Dr. Schulze GmbH /2009
SERVICE PERSONS:
Mihaela KUSKO
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Particle size and zeta potential measurements
SERVICE DESCRIPTION:
Provides the highest degree of accuracy, sensitivity and resolution, regardless of the sample concentration or conductivity. • Dual 30 mW laser; • Size range from 0.6 nm to 7 μm; • Sample concentration ranging from 0.001% to 40% – no dilution necessary to perform zeta potential analysis on most samples thanks to the Forward Scattering through Transparent Electrode Technology (FST)*; • Zeta potential of solid flat surfaces or films; • Auto-titration available for suspension samples; Size Range: 0.6nm - 7µm Zeta Potential Range: -100mV - +100mV Concentration Range: 0.001% - 40% pH Range: 1 - 13 Measurement Temperature Range: 10°C - 90°C Environmental Operating Specifications: Temperature: 10°C - 40°C Humidity: 0% - 90% w/o condensation Light Source: Laser diode, 658nm, 30mW Scattering Angle: 15°, 30°, 160° Sample Cells: * Size cell for particle size (0.06mL, 0.9mL) * Flow cell for zeta potential (0.7mL) * High concentration cell for zeta potential (1mL) * Solid surface cell for zeta potential (0.7mL) Main equipment used: Zeta Potential and Submicron Particle Size Analyzer/Beckman Coulter/2008
SERVICE PERSONS:
Adina BOLDEIU
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Combined testing for reliability/durability of devices and microsystems: temperature, humidity, pressure, input voltage, vibrations, mechanical shocks.
SERVICE DESCRIPTION:
- CH160: Environmental testing: high/low temperature storage, damp heat, thermal cycling, thermal cycling + humidity; Main equipment used: CH160/Angelantoni/2007. CH250 T VT: Environmental testing: storage at high/low temperature, damp heat, thermal cycling, thermal cycling + humidity. Combined testing: environmental tests combined with vibrations. Electrical bias also possible. Main equipment used: CH250/Angelantoni/2009 - Testing of devices and microsystems with combined stresses: temperature + humidity + high pressure. Faster humidity tests, at elevated temperatures (above 100°C) and pressures. Main equipment used: EHS-211M/Espec/2008 - Fast temperature changes (thermal shocks) applied to the devices under test by means of a vertical-lift thermal shock chamber with separate hot and cold temperature zones. Electrical bias also possible. Main equipment used: TSE-11-A/Espec/2008 - Storage at high temperature (up to 220 oC), burn-in tests (electrical bias + temperature). Main equipment used: UFB400/Memmert/2008 - Drop test/mechanical shocks. Classical shock waves are produced by dropping a heavy table guided by polished shafts, while the DUT is fixed onto the falling table. Electrical bias possible during test. Main equipment used: 0707-20/MRAD/2007 - Combined testing: low pressure + high temperature.Testing at low pressure and high temperature. Testing during variation of pressure and temperature. Main equipment used: VO400/Memmert/2009 - Combined testing: vibrations + environmental conditions. Vibrations testing: sinusoidal, random, shocks. Combined testing: vibrations + environmental conditions. (with CH250 T VT/Angelantoni/2009). Electrical bias also possible. Main equipment used: TV 55240/LS-180/Tira/2009 - Slow/fast thermal cycling, thermal shock, characterization at temperature. Main equipment used: TP04300A/Temptronic/2007
SERVICE PERSONS:
Dragos VARSESCU
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Electrical Characterization of devices, materials, semiconductor processes
SERVICE DESCRIPTION:
DC I-V, C-V, pulse, and ultra-fast I-V characterization for material and semiconductor device parameters. Ultra-fast I-V measurements over a wide dynamic range to reduce the effects of device self-heating and trapped charge, study transient properties in non-volatile memory (NVM) devices, or avoid relaxation in device reliability tests like negative bias temperature instability (NBTI). C-V tests run as DC I-V tests. An extensive set of sample programs, test libraries, and built-in parameter extraction examples are included, as well as support for high voltage C-V, very low frequency C-V, differential DC bias, and quasistatic C-V measurements. Main equipment used: Semiconductor Characterization System - 4200S/C/Keithley; with Manual Probe Station - EP6/SüssMicroTec
SERVICE PERSONS:
Rodica PLUGARU
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George BOLDEIU
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Particle Image Velocimetry for microfluidic systems
SERVICE DESCRIPTION:
Mapping concentration or temperature distributions in micro-flows. Measurements in microfluidic systems in chemistry, bio-chemistry, medical devices, DNA analysis, electronic cooling systems, micro-mechanical systems, micro total-analysis systems. Imaging-based measurements in microfluidic systems. Main equipment used: Micro-PIV system/DANTEC Dynamics /2011
SERVICE PERSONS:
Catalin MARCULESCU
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FTIR spectroscopy
SERVICE DESCRIPTION:
Studies of chemical structures and processes. Examples: • Raw materials: liquid or solids. • Carbon family: CNT, Graphene • Film deposition: i.e: TiO2, InP, Si3N4, thiols on silicon substrates • Silicon processes • Sol-gel, co(precipitation), solide-state process: i.e ZnO, TiO2, YAG:Ce,Gd • Nanocomposite studies: CNT-PDMS, YAG:Ce,Gd-PMMA, ZnO-OA • Nanomedical applications – influence of nanoparticle on tumour cells, porous silicon as a biomaterial, dacarbazine (drug for cancer) • Quantum dot functionalized – Carbon-QD with BSA/HSA, ZnO-QD with SiO2 Main equipment used: FTIR spectrometer - Tensor 27/ Bruker Optics/2006
SERVICE PERSONS:
Vasilica TUCUREANU
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UV-Vis-NIR Spectroscopy
SERVICE DESCRIPTION:
Ideal for solids – films, powder, liquid - solvents, varnish, waxes, gels, pastes. Main equipment used: UV-Vis-NIR Spectrometer - AvaSpec-2048 TEC /Avantes/ 2006
SERVICE PERSONS:
Vasilica TUCUREANU
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High temperature processes
SERVICE DESCRIPTION:
Can be used for sintering, annealing, etc. Examples-practical applications: - Powder: TiO2, ZnO, YAG:Ce,Gd - Film deposition sintering: i.e: TiO2, ZnO/Si Main equipment used: Chamber furance - RHF 15/3 /CARBOLITE/2010
SERVICE PERSONS:
Vasilica TUCUREANU
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SEM imaging (topography, composition);
SERVICE DESCRIPTION:
• Ultra-high resolution characterization at high and low voltage in high vacuum: 1.6 nm @ 1 kV; • Low and very low kV backscattered electron imaging forcompositional characterization in high and low vacuum; • 150 x 150 mm high precision and stability piezo stage; • The ultimate characterization solution for charging and/or contaminating nano-materials or –devices; Main equipment used: Scanning Electron Microscope (SEM), with Energy Dispersive X Ray Spectrometer (EDAX) /TESCAN/ 2006
SERVICE PERSONS:
Bogdan Ionut BITA
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SEM imaging, ultra-high resolution, field emission.
SERVICE DESCRIPTION:
• Ultra-high resolution characterization at high and low voltage in high vacuum: 1.6 nm @ 1 kV; • Beam deceleration mode with sub-100 V and high surface sensitivity imaging; • Low and very low kV backscattered electron imaging forcompositional characterization in high and low vacuum; • Novel high stability Schottky field emission gun enabling a beam current up to 100 nA for analysis; • 150 x 150 mm, high precision and stability piezo stage; • True high resolution low vacuum FESEM, with a resolution of 1.8 nm @ 3 kV; • The ultimate characterization solution for charging and/or contaminating nano-materials or –devices; • Full prototyping solution with on-board 4 k x 4 k digital pattern generator, dedicated patterning software, fast beam blanker and gas chemistries; Main equipment used: Scanning Electron Microscope (SEM), ultra-high resolution - FEI Nova™ NanoSEM 630/FEI Company/2007
SERVICE PERSONS:
Marian Catalin POPESCU
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Studies of mechanical properties of materials on small scales or near surfaces with high spatial resolution
SERVICE DESCRIPTION:
High resolution mechanical characterization of a wide variety of materials (metals, semiconductors, ceramics, biocompatible materials etc), especially in the form of thin films, coatings and generally small volumes of material. The characterized properties include hardness, modulus, film adherence, wear behavior. Accuracy and repeatability of the measurements are guaranteed by implemented methods according to ISO 14577. The patented Continuous Stiffness Technique (CSM) yields the elastic modulus and hardness values as a function of depth in a single measurement (especially useful for the case of thin films) and allows characterization of the time dependent mechanical behavior of samples (e.g. polymers). Applications: The provided information is useful for developing and/or optimizing application specific materials and processes and also could be used as input data for running simulations of the material behavior by finite-element analysis. Main equipment used: Nano Indenter - G200/ Agilent Technologies/ 2008
SERVICE PERSONS:
Raluca GAVRILA
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Scanning Probe Microscopy characterization
SERVICE DESCRIPTION:
3D imaging of the topography and studying other physical properties of sample surfaces on a scale from microns down to the nanometric level. Examples: Surface morphology inspection, quantitative measurement of surface features at nanometric level, nano-surface texture/ roughness measurement. Standard applications: High-resolution surface profilometry, 3D surface metrology, grain and particle size analysis, surface cleaning and polishing studies, evaluation and optimization of thin films and coatings. Advanced characterization includes qualitative (mapping) or semi-quantitative characterization of various (mechanical, adhesive, electrical) properties. Main equipment used: Scanning Probe Microscope (SPM) - Ntegra Aura/ NT-MDT Co./2007
SERVICE PERSONS:
Raluca GAVRILA
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Confocal, AFM, Near field scanning optical microscopy, Raman spectroscopy and imaging.
SERVICE DESCRIPTION:
Confocal, AFM, Near field scanning optical microscopy, Raman spectroscopy and imaging. Main equipment used: Scanning Near-field Optical Microscope - Witec alpha 300S/Witec/2008
SERVICE PERSONS:
Cristian KUSKO
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Technological processes in inert atmosphere
SERVICE DESCRIPTION:
Preparation of different composites, spin coating of them in thin films on various substrates and thermal annealing in nitrogen atmosphere. Main equipment used: Special Laminar-Flow Recirculating Counter-Top Workstation (Glove box)/ Salare Inc./ 2008
SERVICE PERSONS:
Paula OBREJA
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RAMAN Spectroscopy
SERVICE DESCRIPTION:
Analysis/investigations of solids, liquids and solutions for: chemical identification, characterization of molecular structures; to determine the composition and phase (crystalline/amorphous) of semiconductor materials; environmental stress on a sample and crystal quality and composition of alloy semiconductors (A3B5, A2B6); oxides thin films; polymers and polymer nanocomposites characterizations; nanostructured layers and carbon and oxides micro/nano structures characterization ( oxide semiconductor nanowires and microrods, carbon nanotubes, graphene ) and co-localized AFM-Raman measurements. Main used equipment: High Resolution Raman Spectrometers - LabRAM HR 800/ Horiba Jobin Yvon/20016
SERVICE PERSONS:
Munizer PURICA
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Florin COMANESCU
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Spectroscopic Ellipsometry
SERVICE DESCRIPTION:
Analysis and characterization of the nanometric thin films, interfaces, multilayer structures from different materials – dielectrics, conductive oxides, polymers, semiconductors. By modeling, simulation and fitting optical models to measured data are determined optical constant ( n-refraction index , k- extinction coefficient ) and thin films thickness for a single layer and multilayer structures. Main used equipment: SE 800 XUV SPECTROSCOPIC ELLIPSOMETER / SE 800 XUV/2004
SERVICE PERSONS:
Munizer PURICA
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Florin COMANESCU
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CAD, design, modelling and simulation for passive photonic and nonliniar components by FDTD (Finite-Difference Time-Domain) numerical method
SERVICE DESCRIPTION:
The software is based on the “finite difference time domain” (FDTD) numerical method which calculates Maxwell\s equations solutions in time and space with boundary conditions, defined by the structure to be simulated for dielectric and metallic systems such as optical fibers, optical waveguides, photonic and micro-optical components, metamaterials, plasmonic systems. The software contains modules of design structure, calculation and results analysis and is based on physical models for materials considering dispersion (Drude, Lorentz, Sellemeier, Drude – Lorentz) and non-liniar effects (non-liniarity of second order, Kerr model, Raman model). Software used: Opti FDTD 13.0.2 Acquisition: Optiwave Corporation Canada (2016)
SERVICE PERSONS:
Mihai KUSKO
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CAD, design, modelling and simulation for optical waveguides and complex photonic integrated circuits by BPM method (beam propagation method).
SERVICE DESCRIPTION:
Optiwave BPM (beam propagation method) works in the paraxial approximation for small angles and calculates the wave distribution of the electromagnetic field propagating in optical fibers and optical waveguides, for couplers, beam splitters, photonic interferometers and other photonic systems. The software contains modules of design structure, calculation and results analysis. Software used: OptiBPM 13 Acquisition data: Optiwave Corporation Canada (2016)
SERVICE PERSONS:
Mihai KUSKO
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Optical design software
SERVICE DESCRIPTION:
Zemax software is based on geometrical optics and models classical optical components such as lenses, spherical and aspherical mirrors, prisms and complex optical systems (optical objectives, optical instruments). The software contains modules of design, calculation and results analysis. Software used: ZEMAX Acquisition data: Zemax Corporation (2010)
SERVICE PERSONS:
Cristian KUSKO
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2D/3D design and simulation of photonic components using FDTD (Finite-Difference Time-Domain) and FETD (Finite Element Time Domain)
SERVICE DESCRIPTION:
OmniSim software is used for modeling, design and simulation of complex photonic components based on FDTD (Finite-Difference Time-Domain) and FETD (Finite Element Time Domain) numerical methods. The software allows the study of electromagnetic field interaction with linear, non-liniar and dispersive systems such as optical waveguides, photonic crystals, metamaterials, metallic nanoparticles. Software used: OmniSim Acquisition data: Photon Desing UK (2016)
SERVICE PERSONS:
Cristian KUSKO
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Design software for diffraction grating-based waveguides and optical fibers
SERVICE DESCRIPTION:
Diffraction grating based devices software OPTIGrating uses coupled modes theory (CMT) and transfer matrix method for simulation, modeling and design for systems such as Bragg reflectors, grating based optical filters, dispersion compensators, sensors based on optical fibers and optical waveguides, wavelength multiplexors/de-multiplexors. Software used: OPTIGrating Acquisition data: Optiwave Corporation Canada
SERVICE PERSONS:
Cristian KUSKO
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Semiconductor Heterostructure Modeling Software for optical systems with heterostructures and quantum wells from AIIIBV compounds.
SERVICE DESCRIPTION:
OptiHS offers studies optical properties for AIIIBV systems based on heterostructures and multiple quantum wells – casting, dispersion, modal characteristics of optical waveguides. The software considers radiative transitions between excitonic and valence bands, indirect transitions inter-band assisted by phonons (impurities), anomal dispersion including direct transitions, axial anisotropy of complex permittivity in layers featuring quantum wells. Software used: OptiHS Acquisition data: Optiwave Corporation Canada (2005)
SERVICE PERSONS:
Cristian KUSKO
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Software for optical properties modeling of AIIIBV heterostructures based photonic and optoelectronic devices.
SERVICE DESCRIPTION:
LaserMod software models the optical properties of AIIIBV heterostructures considering the geometric and physical (optical and electronic) properties of materials, for photonic and optoelectronic systems such as modulators, optical waveguide switches based on carrier injection, semiconductor lasers and optical amplifiers, VCSEL vertical cavity lasers, DFB lasers, Fabry-Perot laser diodes. Software used: LaserMOD Acquisition data: Rsoft Inc. UK (2009)
SERVICE PERSONS:
Cristian KUSKO
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Rapid Prototyping and model creation
SERVICE DESCRIPTION:
- realization of molds for implants; - realization of molds for automotive industry, rubber industry (envelopes for tyres), plastics industry, optical industry (special lenses and special mirrors), medicine (prosthetics); - realization of fix, mobile or semi-mobile mechanical components for specific applications, including robotics; - realization of microfluidics structures and circuits (channels of several hundreds of microns diameter, connected in complex 3D geometries) containing pipes, valves, micropumps (at milimetric and centimetric scale); - realization of joining elements (screws, etc.) at milimetric scale; - realization of customized encapsulations for different type of MEMS structures; - realization of MEMS models for testing their concept and working principle; Main equipment used: EOSFormiga P100/ EOS GmbH/2008 .............. - Using R11 resin is ideal for creating master patterns in Rubber Molding applications - suitable for Electrical Housing - e-shell 200 and e-shell 300 resins where developed especially for parts of Hearing Aid Industries. - PIC 100 is for producing high quality parts in the Jewelry market for production capacity direct investment castin, optimally suitable for producing precious metal castings. - RC25 NanoCore is ideal for applications requiring superior stiffness and high heat deflection temperature, such as automotive components, pump housings and impellers, wind tunnel test parts, light reflectors, injections molds, hard chrome plating, et al. - Realization of fix, mobile or semi-mobile mechanical components for specific applications, including robotics; - Realization of microfluidics structures and circuits (channels of several hundreds of microns diameter, connected in complex 3D geometries) containing pipes, valves, micropumps (at milimetric and centimetric scale); - Realization of customized encapsulations for different type of MEMS structures; - Realization of MEMS models for testing their concept and worki
SERVICE PERSONS:
Gabriel MOAGAR-POLADIAN
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Design and optimization of microwave and millimeter wave components and circuits using 3D electromagnetic modeling coupled with linear and non-linear circuit analysis and optimization
SERVICE DESCRIPTION:
CST Microwave Studio is used for 3D electromagnetic modeling, design and optimization of microwave and millimeter wave components and circuits such as filters, antennas, transmission lines, substrate integrated waveguides, metamaterials, dielectric lenses etc. A variety of modeling techniques (Finite Integration Technique (FIT), Method of Moments (MoM), Finite Element Method (FEM)) and solvers (time domain, frequency domain, eigenmode, integral equation solver, multilayer solver, asymptotic solver) can be used depending on the design task. Alternatively, the Mentor Graphics HyperLynx 3D EM SSD software package can also be used. NI AWR Design Environment – Microwave Office is used to integrate the electromagnetic model with circuit analysis, where both linear and nonlinear microwave components can be included (Schottky diodes, heterojunction bipolar transistors, HEMT devices etc.). The software includes advanced optimization techniques such as Pointer, Random, Genetic or Simplex. The result of the design process includes the mask layout design of the component/circuit. RF-MEMS (micro-electro-mechanical) components are designed multi-disciplinary, including mechanical, electromagnetic, thermal and electronic aspects. Software used: • CST Microwave Studio • NI AWR Design Environment – Microwave Office • Mentor Graphics HyperLynx 3D EM SSD
SERVICE PERSONS:
Alina BUNEA
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Radiation characteristic and input matching bandwidth measurement for microwave and millimeter wave antennas (8 GHz – 110 GHz)
SERVICE DESCRIPTION:
The antennas can be probed on wafer or using coaxial cables. The input matching bandwidth is determined based on S-parameter measurements (Vector Network Analyzer Anritsu 37397D – for the 0.04-110 GHz frequency range – and Anritsu MS46122A-040, for the 0.001- 43.5 GHz frequency range). The 2D (E- and H-plane) radiation characteristics are measured with the antenna under test (AUT) used either as emitter or receiver antenna (depending on the type and size of the AUT) and a standard gain horn antenna on the other end. The antenna gain is estimated based on the measured radiation characteristics over the operating frequency range. Software used: Main equipment used: • Vector Network Analyzer (VNA) Anritsu 37397D/ Anritsu/2007 • Vector Network Analyzer (VNA) Anritsu MS46122A-040/ Anritsu/ 2016 • PSG Analog Signal Generator Agilent E8257C 250 kHz – 50 GHz/ Agilent/2007 • Anritsu MS2668C 9 kHz – 40 GHz/ Anritsu/2007
SERVICE PERSONS:
Alina BUNEA
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Experimental characterization of microwave and millimeter wave Tx/Rx systems and main parameter evaluation up to 110 GHz
SERVICE DESCRIPTION:
The experimental setups are centered on the Synthetized Signal Generator (PSG Analog Signal Generator Agilent E8257C 250 kHz – 50 GHz, with OML extension modules up to 110 GHz) and the spectrum analyzer (Anritsu MS2668C 9 kHz – 40 GHz, with mixers extending the frequency range up to 110 GHz). The necessary antennas (including a wide variety of standard horn antennas), connectors, absorbent materials are selected accordingly. The tangential signal sensitivity is used to measure the receiver sensitivity. The radiated power and spectral purity can be estimated for the transmitters. Main equipment used: • PSG Analog Signal Generator Agilent E8257C 250 kHz – 50 GHz/ Agilent/2007 • Anritsu MS2668C 9 kHz – 40 GHz/ Anritsu/2007 • Low-noise voltage preamplifier SR560/Stanford Research Systems/ • Oscilloscope Tektronix DPO2024/Tektronix/
SERVICE PERSONS:
Alina BUNEA
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Microwave and millimeter wave components and circuits characterization, with device and circuit parameter extraction based on measurement results (up to 110 GHz)
SERVICE DESCRIPTION:
Depending on the device under test (DUT), S-parameter measurements are performed in optimum conditions with regard to the power level and frequency resolution. The measurements are performed using the Vector Network Analyzer Anritsu 37397D (on wafer measurements for the 0.04-110 GHz frequency range) and Anritsu MS46122A-040 (coaxial connector based measurements for the 0.001- 43.5 GHz frequency range). For active circuits, DC bias is provided and IV characteristics are recorded using a Semiconductor Characterization Station (SCS Keithley-4200). The model parameters of the DUT can be extracted based on equivalent circuit modeling using NI AWR Microwave Office. For accurate characterization of passive and active components of Microwave (Monolithic) Integrated Circuits, dedicated on-wafer de-embedding structures are designed. Software used: •NI AWR Design Environment – Microwave Office Main equipment used: Vector Network Analyzer (VNA) Anritsu 37397D/ Anritsu/2007 • Vector Network Analyzer (VNA) Anritsu MS46122A-040/ Anritsu/ 2016 • Semiconductor Characterization Station - SCS Keithley-4200/Keithley/2008
SERVICE PERSONS:
Alina BUNEA
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Computer Aided Design, Computer Aided Engineering, Rapid Prototyping
SERVICE DESCRIPTION:
Simulation services, comprising Multiphysics domains, highly nonlinear material models and physics phenomena, using explicit and implicit finite element simulation. Main software used: ANSYS engineering simulation software package ANSYS 18.1/ Ansys, Inc. USA/ 2017. ANSYS is a general purpose software, used to simulate interactions of all disciplines of physics, structural, vibration, fluid dynamics, heat transfer and electromagnetic for engineers. It can perform all the above mentioned simulations static case or in time dependent case, ranging to high transient and dynamic case ANSYS can work integrated with other used engineering software on desktop by adding CAD and FEA connection modules. It has the following features: ANSYS can import all kinds of CAD geometries (3D and 2D) from different CAD software's and perform simulations, and also it has the capability of creating one effortlessly. ANSYS has inbuilt CAD developing software's like Design Modeler and Space Claim which makes the work flow even smoother. ANSYS has the capability of performing advanced engineering simulations accurately and realistic in nature by its variety of contact algorithms, time dependent simulations and non linear material models. ANSYS has the capability of integrating various physics into one platform and perform the analysis. Just like integrating a thermal analysis with structural and integrating fluid flow analysis with thermal and structural, etc., ANSYS now has featured its development into a product called ANSYS AIM, which is capable of performing multi physics simulation. It is a single platform which can integrate all kinds of physics and perform simulations. ANSYS has its own customization tool called ACT which uses python as a background scripting language and used in creating customized user required features in it. ANSYS has the capability to optimize various features like the geometrical design, boundary conditions and analyse the behavior of the p
SERVICE PERSONS:
George BOLDEIU
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Victor MOAGAR-POLADIAN
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Design, modelling, simulation and optimization of micro-electro-mechanical (MEMS) and microfluidic systems in the field of micro-nano-bio/info technologies
SERVICE DESCRIPTION:
Based on dedicated software tools, optimization solutions in terms of design specifications are ensured for increasing performances of MEMS and microfluidic microsystems as cantilevers, membranes, microgrippers, valves, micropumps, microchannels, mixers, filters, sensors. This approach by virtual optimization includes 2D (layout) and 3D design based on microfabrication steps, modelling and simulation of a lage area of physical phenomena at microscale, including coupled effects: computational fluid dynamics, diffusion, electrokinetics, mixing, fluid-structure interaction, mechanical, thermal, electric, piezoelectric and electro-thermo-mechanical phenomena.The equipment used for these analysis is COVENTORWARE 2014, which is dedicated to microscale effects. Main softwares used: COVENTORWARE 2014 – software package dedicated to design, modelling and simulation for MEMS and microfluidics.It contains modules for design (2D layout, 3D models generator) and simulation modules for main physical phenomena in microsystems functionalities. DESIGNER Module: 2D layout editor, materials property editor and database, process editor based on semiconductor technology steps and automatic 3D model generator. ANALYZER - a multi-physics field solver based analysis framework. MEMS Modules: • MemElectro: electrostatic analysis • MemMech: mechanical, modal, thermal analysis, piezoelectric, piezoelectric, modal analysis • CoSolve: coupled electro-thermo-mechanical • MemPZR: piezoresistive analysis • MemHenry: coupled magnetic-structural analysis Microfluidic Modules: • MemCFD: fluid dynamics • NetFlow: electrokinetic flow (electrophoresis, electroosmosis, diffusion) • SwichSim: electrokinetic flow with field switching analysis • ReactSim: chemical reaction in microchannels / microreactors • MemFSI: Fluid-Structure Interaction • Bubble/Sim and DropSim: two-phase flow
SERVICE PERSONS:
Oana Tatiana NEDELCU
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Freeze drying procedures for all samples suited to be freeze dried
SERVICE DESCRIPTION:
Freeze drying services. Main equipment used: CoolSafe 110-4 PRO Teflon/ LaboGene/2018
SERVICE PERSONS:
Stoian MARIUS
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Surface Plasmon Resonance studies of bio-molecular interactions
SERVICE DESCRIPTION:
Investigations of: biosensors ,conducting polymers; enzymes; membrane proteins; DNA - DNA interactions; protein - virus interactions; peptide - antibody interactions, using Surface plasmon resonance phenomenon. Main equipment used: Autolab Twingle SPR/ Metrohorn Autolab BV/ 2010
SERVICE PERSONS:
Melania POPESCU
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Pericle VARASTEANU
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Hydrothermal treatment of thin films based on graphene aerogel nanocomposites using sol-gel method.
SERVICE DESCRIPTION:
Preparation of graphene aerogel thin films by hydrothermal treatment using a flat stainless steel high-pressure reactor. The work temperature is up to 230oC and pressure up to 10 bar. The thickness of films can be varied between 50nm up to 5 mm depending of volume used in sol-gel stage. The interior housing is made of PTFE for easy delamination of wet aerogels after thermal treatment. Main equipment used: 4 inch high-pressure stainless steel flat reactor for hydrothermal treatment
SERVICE PERSONS:
Alexandru- Cosmin OBREJA
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Freeze-drying (lyophilization) treatment for carbon-based aerogels.
SERVICE DESCRIPTION:
Freeze-drying of carbon based wet aerogels using a lyophyliser with cooling temperature down to -110oC and vacuum pressure up to 0,02 mbar for complete evaporation of wet contaminants. Main equipment used: SCANVAC CoolSafe 110-4 Pro (Labogene)
SERVICE PERSONS:
Alexandru- Cosmin OBREJA
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Strain mapping by DIC
SERVICE DESCRIPTION:
High resolution mechanical characterization of local strain (strain mapping) by Digital Image Correlation (DIC). High resolution camera and Ncorr (MATLAB) program.
SERVICE PERSONS:
Catalin TIBEICA
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Nano and micro vibrations measurements
SERVICE DESCRIPTION:
o Non-contacting vibration measurements on micro devices, MEMS and cantilevers o Determining the vibrational spectrum o Determining the vibrational shapes (planar vibrations) o Measurement of the resonance frequencies o Measurement of the static deflection of membranes, cantilevers and other MEMS structures Main equipment used: Nano Vibration Analyzer / SIOS Meßtechnik GmbH / 2019
SERVICE PERSONS:
George MUSCALU
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Silviu DINULESCU
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2D/3D bioprinting for medical applications
SERVICE DESCRIPTION:
Microfluidic platform fabrication from PDMS, using fugitive ink (Pluronic) Conductive path printing using carbon based inks Organ-on-a-Chip Bioprinting Using Carbohydrate Glass Organ-on-a-Chip Bioprinting Using Pluronic Bioprinting Collagen for Layered Tissues Bioprinting Hard Tissues Using PLGA Bioprinting Hard Tissues Using PCL (Polycaprolactone) FRESH/Embedded Bioprinting Bioprinting Silicone Custom inks printing Main equipment used: Allevi 1 Bioprinter/Allevi, Inc/2020
SERVICE PERSONS:
Catalin MARCULESCU
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Electrochemical characterization of materials and electrochemical sensors
SERVICE DESCRIPTION:
- Cyclic Voltammetry (CV) measurement; - Electrochemical Impedance Spectroscopy (EIS) measurements: Nyquist Diagram and Bode Diagram Main equipment used: Autolab PGSTAT204 / METROHM AUTOLAB AG. Netherlands /2020
SERVICE PERSONS:
Bianca ADIACONITA
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Technological Services
Mechanical tensile/compressive/3-point bending characterization
SERVICE DESCRIPTION:
Mechanical tests up to 500 N (±0.1%), 500 mm (±0.13mm), 1 - 1000 mm/min (±0.2%). Main equipment used: Tensile and compression tester - MultiTest 2.5-i/ Mecmesin/2018
SERVICE PERSONS:
Octavian IONESCU
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Research Equipment
X-ray Thin film Difraction System (XRD) / SmartLab/Rigaku Corporation/ 2008
CATALOG NAME:
SmartLab®
DESCRIPTION:
Ultra high resolution triple axis multiple reflection. • 9kW rotating anode (45kV, 200mA), up 200mm wafer samples, vertical goniometer, independent theta - theta arms, horizontal sample mount, Euler cradle (chi, phi, omega independent axis), in-plane arm, DTexUltra 1D high speed real time detector (SSD–Silicon multistrip); • Automatic software alignment (or manual user computer controlled alignement) of the optics modules and sample for each measurement; • Bragg-Brentano (+1D DTexUltra SSD detector), parallel beam (multilayer mirror), different monochromators/analyzers (Ge(220) crystals with two and four bounce reflections, Ge(440) four bounce reflection, graphite C(0002) analyzer bent/flat,etc.), X-Y micro area mapping unit-phase composition, strain&stress, tilt&twist, lattice parameter modifications/values Δd/d=10-7–10-9, depth distributions of phase composition, strain, etc;
PRODUCER:
Rigaku Corporation, Japan
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
500.001 € - 1.000.000 €
DATA SHEET:
Potentiostat/galvanostat system - AUTOLAB 302N/ Metrohm Autolab B.V./ 2010
CATALOG NAME:
Autolab PGSTAT302N - High Performance Potentiostat
DESCRIPTION:
http://www.metrohm-autolab.com/Products/Echem/NSeriesFolder/PGSTAT302N
PRODUCER:
Metrohm Autolab B.V.
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Micro-Nano Plotter - OmniGrid /Genomic Solutions Ltd./2005
CATALOG NAME:
Genomics Solutions Omnigrid 300 High-throughput Microarray
DESCRIPTION:
DNA and protein microarrays on slides. Omni Grid Micro Plotter can dip into a source plate and spot a given volume of sample solution onto a solid surface (e.g. glass slide, silicon substrate).
PRODUCER:
Genomic Solutions Ltd., UK
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Microarray Scanner - GeneTAC UC4/Genomic Solutions Ltd./2005
CATALOG NAME:
GeneTAC UC-4 Microarray Scanner/Analyzer
DESCRIPTION:
Equipment used for reading DNA and Protein microarray chips. It offers high resolution scanning across the entire surface of standard microarray substrates. The system has two lasers - green (532nm) and red (635nm) - coupled with high performance optics, optimized to maximize collection of fluorescence signal while minimizing the damage caused by photobleaching.
PRODUCER:
Genomic Solutions Ltd., UK
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Electrochemical Impedance Spectrometer - PARSTAT 2273/ Princeton Applied Research/2008
CATALOG NAME:
Potentiostat/Galvanostat/FRA - PARSTAT 2273
DESCRIPTION:
The PARSTAT 2273 consists of (i) hardware capable of ± 10 V scan ranges, 2 A current capability (1.2 fA current resolution), 100 V compliance, >1013 Ω input impedance, <5 pF of capacitance and 10μHz to 1 MHz built in analyzer for impedance measurements; (ii) Electrochemistry PowerSuite software required for data analysis and ZSimpWin - EIS modeling software package.
PRODUCER:
Princeton Applied Research, UK
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorescence Spectrometer - FLS920 /Edinburgh Instruments Ltd. /2010
CATALOG NAME:
FLS920 Fluorescence Spectrometer
DESCRIPTION:
Equipped with a steady state fluorescence module, a time-correlated single-photon counting (TCSPC) module for decays between 10ps – 50μs (Fluorescence Lifetime) and a multi-channel scaling (MCS) module for decays between 400ns – 10s (Phosphorescence Lifetime). The system uses a 450W Xe lamp as excitation source and f/4.2 Czerny-Turner double grating monochromators with standard 250/500nm blaze and 1800 tr/mm diffraction gratings. Accessories are available to run a variety of samples: holders for cuvettes (thermostated), films and powders. Also a 150 mm diameter integrating sphere is used for absolute quantum yield and reflectivity measurements. S/N ratio: 10.000:1, as measured on Raman spectrum of pure water at 350 nm excitation wavelength, with 1 second integration time and 5mm spectral bandwidth.
PRODUCER:
Edinburgh Instruments Ltd., UK
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning Electrochemical Microscope (SECM) – ElProScan/ HEKA Elektronik Dr. Schulze GmbH /2009
CATALOG NAME:
:> HEKA ElProScan
DESCRIPTION:
Electrochemical Probe Scanner for various investigations of electrochemical active surfaces. Three main units: a positioning system, a pipotentiostat/Galvanostat and a data acquisition system. Components: • Bipotentiostat/Galvanostat PG 340; • Low current preamplifiers (allow HR low-noise recordings in the low pA range); • High precision real time controlled positioning system; Resolution: in XY - 100 nm or 15 nm; in Z: 100 nm + fast real time controlled Z-piezo (5 nm resolution) and 100 mm scan range, closed loop regulated. • Software POTPULSE with SCAN extension • Real-Time Computer System with real-time processing boards, counter and data acquisition modules.
PRODUCER:
HEKA Elektronik Dr. Schulze GmbH, Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Zeta Potential and Submicron Particle Size Analyzer/Beckman Coulter/2008
CATALOG NAME:
DelsaNano C
DESCRIPTION:
DelsaNano C is used to determine: ● Particles size, using photon correlation spectroscopy (PCS), by measuring the rate of fluctuations in laser light intensity scattered by particles as they diffuse through a fluid. ● zeta potential, using electrophoretic light scattering (ELS), by measuring electrophoretic movement of charged particles under an applied electric field. The DelsaNano also can measure zeta potential (or surface charge) of a solid surface or film. Zeta potential is derived from measuring the mobility distribution of a dispersion of charged particles as they are subjected to an electric field. Depending on the concentration of ions in the diluent, either the Smoluchowski (for high ionic strengths) or Huckel (for low ionic strengths) equations are used to obtain the zeta potential from the measured mobilities. In addition to zeta potential of particles, zeta potential of bare, treated or coated solid surfaces such as glass, metal, metal oxide, ceramics, etc. in liquid can be also measured. ● pH Titration System - DelsaNano AT, having the possibility to calculate IEP automatically - Plot of zeta potential versus pH is displayed automatically during the pH titration measurement
PRODUCER:
Beckman Coulter, USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Climatic chambers: CH160/Angelantoni Test Technologies/2007; CH250 T VT/ Angelantoni Test Technologies /2009
CATALOG NAME:
CH160; CH250 T VT
DESCRIPTION:
CH160: Climatic chamber for environmental testing. CH250 T VT: Climatic chamber for environmental testing. Can be used also for combined tests: environmental conditions + vibrations together with TV 55240/LS-180/Tira/2009. Electrical bias also possible. Main specs: Capacity 250 l Temperature range -40oC … +180oC Humidity range 10 … 95% RH (up to 95oC)
PRODUCER:
Angelantoni Test Technologies /Italy
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Highly Accelerated Stress Test chamber (HAST) - EHS-211M/Espec/2008
CATALOG NAME:
EHS-211M
DESCRIPTION:
HAST chamber used for highly accelerated stress test - combines temperature, humidity and high pressure. Electrical bias also possible. Main specs: Capacity: 18 liters Temperature range: 105...142oC Humidity range: 75%…100% RH Pressure range: 0.02…0.196 MPa Details: http://www.espec.com/na/products/model/ehs_211m
PRODUCER:
Espec/Japan
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal shock chamber - TSE-11-A/Espec/2008
CATALOG NAME:
TSE-11-A
DESCRIPTION:
Vertical-lift thermal shock chamber with separate hot and cold temperature zones. Electrical bias also possible during test. Two chambers of 11 liters each: Low temp chamber -65oC .. 0oC High temp chamber +60oC .. +200oC Details: http://www.espec.com/na/products/model/tse_11_a
PRODUCER:
Espec/Japan
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Universal oven with electrical testing - UFB400/Memmert/2008
CATALOG NAME:
UFB400
DESCRIPTION:
Four universal ovens used for high temperature storage (up to 220 oC) or burn-in tests (electrical bias + temperature). Capacity: 53 l.
PRODUCER:
Memmert/Germany
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Free fall shock machine - 0707-20/MRAD/2007
CATALOG NAME:
0707-20
DESCRIPTION:
Produces classical shock waves by dropping a heavy table. The device under test is fixed onto the falling table. Electrical bias possible during test. - Maximum acceleration: 4500 g - Maximum specimen weight: 9,071 kg
PRODUCER:
MRAD/USA
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum oven - VO400/Memmert/2009
CATALOG NAME:
VO400
DESCRIPTION:
Vacuum oven used for storage at low pressure and high temperature or testing at variation of pressure and temperature. Main specs: Capacity 49 l Temperature range 20 ... 200°C Pressure range 10 ... 1100 mbar Details: https://www.memmert.com/products/heating-drying-ovens/vacuum-oven/VO400/
PRODUCER:
Memmert/Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Electrodynamic vibration system with thermal and electrical tests – TV 55240/LS-180/Tira/2009
CATALOG NAME:
TV 55240/LS-180
DESCRIPTION:
Vibrations test system with three major modes: sinusoidal, random and shock. Main specs: Rated peak force Sine/Random/Shock 4000/4000/8000 N Frequency range DC-3000 Hz Max. rated travel Pk-Pk 50.8 mm Max. velocity Sine/Random/Shock 1.7/1.7/2.0 m/sec Max. acceleration Sine/Random/Shock 59/59/119 g Max. weight tested 100 kg Can also be used together with CH250 T VT/Angelantoni/2009 for combined tests: environmental conditions + vibrations. Electrical bias during test is also an option. Details: http://www.tira-gmbh.de/en/vibration-test-system/vibration-test-systems/standard-systems/vibration-test-systems-4-kn-to-15-kn/
PRODUCER:
Tira/Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Mobile Thermal Airstream System - TP04300A/Temptronic/2007
CATALOG NAME:
TP04300A
DESCRIPTION:
High power airstream system that delivers controlled temperature with speed and precision. Temperature can be controlled between -80 and +225°C. Typical temperature transition rate: -55˚ to +125˚C: approximately 7 seconds +125˚ to -55˚C: approximately 20 seconds Details: http://temptronic.com/MobileTemp/MobileTemp09.htm
PRODUCER:
Temptronic/USA
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Semiconductor Characterization System - 4200S/C/Keithley; with Manual Probe Station - EP6/SüssMicroTec
CATALOG NAME:
Keithley 4200-SCS Semiconductor Characterization System; Easyprobe EP6.
DESCRIPTION:
Fully programmable for on-wafer/structure sourcing and measuring of DC voltage and current simultaneously. 4200-SMU power: 2.2W (max.105mA, 210V). Per SMU preamplifier: 4200-PA with maximum measurement resolutions: 0.1fA, 5mV. The optional Model 4210-CVU C-V Meter plugs directly into the chassis for measuring capacitances from femtofarads (fF) to microfarads (μF) at frequencies from 1kHz to 10MHz. Quickly configure linear or custom C-V, C-f, and C-t sweeps with up to 4096 data points. A built-in diagnostic tool ensures the integrity of open and short corrections and connections to the DUT, displaying readings in real time. Shielded manual probe station with 4 triaxial cable manipulators. Measurements on wafers and substrates up to 150 mm (6“). Positioning resolution: 3µm. Details: http://www.tek.com/keithley-semiconductor-test-systems.
PRODUCER:
Keithley|Tektronix; Suss MicroTec
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (2651.2 kb)
Micro-PIV system for Microfluidics (Particle Image Velocimetry) / Dantec Dynamics / 2011
CATALOG NAME:
Dantec Dynamics MicroPIV
DESCRIPTION:
Particle Image Velocimetry (PIV) is a robust technique for measuring fluid velocity. This workstation is designed for microscopic imaging applications. The method is an optical, non-intrusive technique measuring the movement of small tracer particles by means of a camera and pulsed laser light. With this technique the flow velocity fields are mapped in 2D.
PRODUCER:
DANTEC Dynamics/France
PRODUCTION YEAR:
2011
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (1900.21 kb)
FTIR spectrometer - Tensor 27/ Bruker Optics/2006
CATALOG NAME:
FTIR spectrometer Tensor 27/ Bruker Optics
DESCRIPTION:
NIR source - HeNe laser (633 nm); Interferometer RockSolidTM; ATR monoreflection–ZnSe crystal, ATR multiple reflection (25) at 3 angle reflections (30°, 45° and 60°) – KRS 5 crystal, liquid cell for transmission and ATR multiple units (windows: KRS, ZnSe, quartz), specular reflection unit at 11° fixed angle, holders for polarizers (360° rotation) for transmission and specular reflection units, manual hydraulic press. Spectral Range: 4000-400 cm-1, resolution: 0.5 cm-1, Wavenumber Accuracy: 0.01 cm-1
PRODUCER:
Bruker Optics
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV-Vis-NIR Spectrometer - AvaSpec-2048 TEC /Avantes/ 2006
CATALOG NAME:
AvaSpec-2048 TEC, Avantes
DESCRIPTION:
Thermo-Electric Cooled Fibre Optic Spectrometer. Spectral Range: 200-1100 nm; Resolution: 0.5 nm; Deuterium-Halogen light source, 215-1700 nm, incl. TTL shutter; Detector: 2048 pixel TE cooled CCD detector, DCL-UV/VIS-Detector collection lens to enhance sensitivity; Accessories: CUV-UV/VIS (Cuvette Holder, 10 mm path, includes 2 UV/VIS/NIR collimating lenses and cover); Software: AvaSoft-Full Automatic system.
PRODUCER:
Avantes
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Chamber furance - RHF 15/3 /CARBOLITE/2010
CATALOG NAME:
RHF - High Temperature Chamber Furnace 15/3
DESCRIPTION:
Chamber capacity: 2.9 liters, Heating elements: 4 silicon carbide, maximum operating temperature 1500°C, temperature controller with 8 segment pairs, each a ramp and a dwell.
PRODUCER:
CARBOLITE Gero Limited
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning Electron Microscope (SEM), with Energy Dispersive X Ray Spectrometer (EDAX) /TESCAN/ 2006
CATALOG NAME:
Tescan VEGA LMU II
DESCRIPTION:
General purpose scanning electron microscope, tungsten heated filament. Maximum resolution 5nm@30kV, SE and BSE detectors, low vacuum working mode up to 250Pa. Movements, motorized: X= 80 mm, Y= 60 mm, Z= 47 mm. PG- 6 MHz, high-speed pattern generation hardware, 16 bit DAC vector scan beam deflection, 2 ns writing speed resolution, TTL and 100 V blanking signal drivers.
PRODUCER:
Tescan Orsay Holding/Czech Republic
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning Electron Microscope (SEM), ultra-high resolution - FEI Nova™ NanoSEM 630/FEI Company/2007
CATALOG NAME:
FEI Nova™ NanoSEM 630
DESCRIPTION:
High-quality nanoscale research SEM tool, with field emission gun. Used for a variety of applications that involve sample characterization, analysis, prototyping, and S/TEM sample preparation. Superior low voltage resolution and high surface sensitivity imaging in the range of Ultra high Resolution Field Emission Scanning Electron Microscopes (UhR FE-SEM). Low-vacuum imaging capabilities for advanced nanoscale characterization on charging and/or contaminating nanotech materials. Offers tools for nanoprototyping, including an on-board digital pattern generator and dedicated patterning software, a high speed electrostatic beam blanker, gas injection systems for direct electron beam writing of nanostructures and its high stability 150 mm piezo stage.
PRODUCER:
FEI Company/USA
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Nano Indenter - G200/ Agilent Technologies/ 2008
CATALOG NAME:
Agilent Nano Indenter G200
DESCRIPTION:
Instrument for characterizing the mechanical properties of materials at the nano and micro scales, mainly by performing nanoindentation experiments, but also by other modes of testing such as scratch testing.
PRODUCER:
Agilent Technologies, now Keysight Technologies /USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (282.22 kb)
Scanning Probe Microscope (SPM) - Ntegra Aura/ NT-MDT Co./2007
CATALOG NAME:
Ntegra Aura
DESCRIPTION:
Scanning Probe Microscope which enables several related techniques for high resolution imaging and measuring of surfaces. The properties which could be characterized depending on the chosen technique. Measurements could be done in ambient atmosphere or in controlled gaseous atmosphere. Non-linearity, XY with closed-loop sensors = 0.15% . Max. scan area: 100x100 microns.
PRODUCER:
NT-MDT Co./Russia
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (8262 kb)
Scanning Near-field Optical Microscope - Witec alpha 300S/Witec/2008
CATALOG NAME:
ALPHA300 S
DESCRIPTION:
The flexibility of this equipment and its operation modes allows a large variety of applications in nanotechnology and nanosciences : It allows the optical characterization (in both transmission and reflection mode) of various samples (nanostructures, biological samples, polymers) with a resolution of 50-90 nm in visible spectral range with the possibility of extension in the infrared spectral range. Working in the collection or photon scanning tunneling microscope (PSTM) mode the alpha 300S SNOM allows the imaging of propagating optical field in various metalic and dielectric waveguides providing a powerful method to caracterize and investigate nanophotonics and nanoplasmonic structures and devices. Also the AFM module working in both contact and alternative contact modes (with posibility of extension to magnetic force measurements and pulsed force mode) allows the topografical and chemical characterization of various surfaces and nanostructures. Applications: imaging the optical properties of a sample with resolution below the diffraction limit with applications in nanotechnology, nanophotonics, nanooptics and plasmonics; Materials research and polymers Single molecule detection; Life sciences; Fluorescence characterizations
PRODUCER:
Witec, Germany
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (7234.16 kb)
Special Laminar-Flow Recirculating Counter-Top Workstation (Glove box)/ Salare Inc./ 2008
CATALOG NAME:
LFR-2500
DESCRIPTION:
LFR-2500 is a glove box, constructed from non corrosive white stress-relieved polypropylene special for nitrogen atmosphere, equipped with pre-filters, HEPA and carbon filters, pass-through portal, glove ports with gloves, spin coater, hot plate and nitrogen gun.
PRODUCER:
Salare Inc./USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (352.48 kb)
High Resolution Raman Spectrometers - LabRAM HR 800/ Horiba Jobin Yvon/20016
CATALOG NAME:
LabRAM HR 800
DESCRIPTION:
LabRAM HR 800 is an integrated micro-Raman system, high stability bench-top for reproducible Raman measurements at high, medium or even low spectral resolution. The microscope is coupled confocal to a 800 mm focal length spectrograph equipped with two switchable gratings. - High spectral resolution (0.3 cm-1/pixel at 633 nm) - Large spectral range of Raman shift from 50 to 4000 cm-1 ideal for organic and inorganic species. - Integrated with the Atomic Force Microscopy (AFM) for sample characterization at the nanometer scale - Lab Spec Software for control the instrument, data acquisition, data manipulation and mapping options
PRODUCER:
HORIBA JOBIN YVON /France
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (2773.72 kb)
SE 800 XUV SPECTROSCOPIC ELLIPSOMETER / SE 800 XUV/2004
CATALOG NAME:
SE 800 XUV
DESCRIPTION:
The SE 800 XUV is a high performance spectroscopic ellipsometer in the UV/VIS range featuring both fast data acquisition and full spectral resolution. The high measurement precision of Ψ and ∆ spectra is further improved by tracking the computer controlled motorized polarizer. • Spectral range: 240 –800 nm • Micro-spot diameter: 200 m • X-Y mapping option • Operating Software: SPECTRARAY II/WINDOWS
PRODUCER:
SENTECH Instruments GmbH , Berlin, Germany
PRODUCTION YEAR:
2004
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (2702.67 kb)
3D Printer- EOS Formiga P100/ EOS GmbH/2008
CATALOG NAME:
EOSFormiga P100
DESCRIPTION:
Performance: - minimum feature width: 500 microns - laser beam positioning accuracy: 50 microns - maximum build volume: 200 mm x 250 mm x 330 mm - minimum layer thickness: 100 microns - laser beam scanning beam: maximum 5 m/s - vertical build speed: minimum 10 mm / hour The 3D Printer based on selective laser sintering is placed in a specially designed and arranged room. It is used for production of different structures, at normal and at milimetric or mesoscale.
PRODUCER:
EOS GmbH
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (142.53 kb)
Perfactory 3 Mini Multi Lens
CATALOG NAME:
EnvisionTEC
DESCRIPTION:
Performance: - minimum feature width: 500 microns - laser beam positioning accuracy: 50 microns - maximum build volume: 200 mm x 250 mm x 330 mm - minimum layer thickness: 100 microns - laser beam scanning beam: maximum 5 m/s - vertical build speed: minimum 10 mm / hour The P3 Mini Multi Lens is a customizable production tool capable of resolutions down to 16 microns. This high precision produces the finest detail with constant high build speeds. With a choice of three lens configurations, additional lenses can also be purchased, adding to the versatility of this 3D printer..
PRODUCER:
EnvisionTEC, Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (319.43 kb)
Freeze dryer - Liofilizator
CATALOG NAME:
CoolSafe 110-4 PRO Teflon
DESCRIPTION:
Digital display of the condenser temperature and pressure; Acrylic vacuum chamber suitable for almost all sample requirements; Available with 4-litre condenser capacity and temperature option of -110°C; Easy draining with built-in valve, allowing removal of water after a completed freeze-drying session; Easy operation with a built-in vacuum valve connecting the condenser and vacuum pump and allowing the condenser to cool down and the vacuum pump to warm up separately, ensuring an efficient start-up sequence. https://www.labogene.com/CoolSafe-4-15L-Freeze-Dryers
PRODUCER:
LaboGene, Denmark
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (6.69 kb)
Tensile and compression tester - MultiTest 2.5-i/Mecmesin/2018
CATALOG NAME:
MultiTest 2.5-i
DESCRIPTION:
Ballscrew-driven motorised test frame. Performs computer-controlled tensile/compressive characterizations in axial and 3-point configurations. Speed: 1 - 1000 mm/min (±0.2%). Displacement: 500 mm (±0.13mm per 300mm; resolution: 0.01 mm). Available loadcell: 500 N (±0.1%; resolution: 1:6500).
PRODUCER:
Mecmesin/UK
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
DATA SHEET:
Download data sheet file (1617.03 kb)
Nano Vibration Analyzer
CATALOG NAME:
Nano Vibration Analyzer
DESCRIPTION:
The Nano Vibration Analyzer is a fiber-coupled laser interferometric vibrometer integrated in a precision technical microscope. It is excellently suitable for measurements of dynamic properties and static displacements of micro structures, MEMS and cantilevers. It can measure frequencies up to 5MHz with an amplitude resolution of 5 pm and a scan field range of 50 mm by 50 mm. Two microscope magnifications are available: 10x and 50x.
PRODUCER:
SIOS Meßtechnik GmbH, Germany
PRODUCTION YEAR:
2019
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
50.001 € - 100.000 €
DATA SHEET:
Download data sheet file (587.01 kb)
Allevi 1 Bioprinter
CATALOG NAME:
Allevi 1 Bioprinter
DESCRIPTION:
The Allevi 1 features a small footprint all while boasting one of the widest material capabilities on the 3D bioprinter market. It comes with Allevi’s patented CORE print head, which has a temperature range of 4°C to 160°C as well as Blue Light (405 nm) and UV Light (365 nm) photocrosslinkers. The print head is also exchangeable, allowing users to swap heads as future print heads are released. Additionally, the Allevi 1 offers auto-calibration for glass slides, petri dishes and well-plate printing. Allevi 1 main features: Biomaterial printing: Hydrogels, Bioceramics, Silicones, Thermoplastics, Cells, etc. Extruder heating and cooling: Temperature range of 4°C – 160°C
PRODUCER:
Allevi, Inc., USA
PRODUCTION YEAR:
2020
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
10.001 € – 50.000 €
DATA SHEET:
Download data sheet file (68.19 kb)
Autolab PGSTAT204 - Compact and modular potentiostat/galvanostat
CATALOG NAME:
AUT204.S
DESCRIPTION:
The PGSTAT204 combines the small footprint with a modular design. The instrument includes a base potentiostat/galvanostat with a compliance voltage of 20 V and a maximum current of 400 mA. The potentiostat has been expanded with one additional module, the FRA32M electrochemical impedance spectroscopy (EIS) module. For high current applications, the PGSTAT204 can be complemented with the BOOSTER10A. This increases the maximum current to 10 A. The PGSTAT204 is an affordable instrument which can be located anywhere in the lab. Analog and digital inputs/outputs are available to control Autolab accessories and external devices are available. The PGSTAT204 includes a built-in analog integrator. In combination with the powerful NOVA software it can be used for most of the standard electrochemical techniques. The Autolab PGSTAT204 is 15 x 26 x 20 cm3 for 4.1 kg.
PRODUCER:
METROHM AUTOLAB AG. Netherlands
PRODUCTION YEAR:
2020
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
10.001 € – 50.000 €
DATA SHEET:
Download data sheet file (54.47 kb)
Phone:
+40-21 269 07 70 ext 19
Fax:
+40-21 269 07 72
Erou Iancu Nicolae
,
126A
,
Voluntari
077190
,
Ilfov
Romania
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