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Research Department for Condensed Matter Physics and Advanced Materials
National Institute of Materials Physics
Short link:
https://eeris.eu/
ERIF-2000-000G-0707
4763
Visits
The department is currently divided into 5 research laboratories, dealing with: -Multifunctional Materials and Structures The laboratory is dedicated to the research of oxidic materials and nanostructures with an emphasis on functionality and applications. A wide range of properties of the materials are studied, including here dielectric , ferroelectric, piezoelectric, optic and transport, for bulk materials, thin films and nanostructures. -Magnetism and Superconductivity The...
Lucian
Pintilie
pintilie@infim.ro
Dr.
SCIENTIFIC TEAM
27
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Petre BADICA
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Mihaela BAIBARAC
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Gabriel BANCIU
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Cristina BESLEAGA-STAN
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Mihai CIOCA
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Magdalena Lidia CIUREA
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Lucian DIAMANDESCU
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Ionut ENCULESCU
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Monica ENCULESCU
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Andrei GALATANU
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Catalin-Aurelian GALCA
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Paul GANEA
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Victor KUNCSER
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Sergiu Vasile NISTOR
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Ioana PINTILIE
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Neculai PLUGARU
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Silviu POLOSAN
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Nicoleta PREDA
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Mihai SECU
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George STAN
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Anca STANCULESCU
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Adelina STANOIU
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Cristian Mihail TEODORESCU
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Valentin Serban TEODORESCU
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Alin VELEA
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Irina ZGURA
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Micro and Nanotechnology Facilities
RI Domain of activity
Materials Synthesis or Testing Facilities
RI Domain of activity
Analytical Facilities
RI Domain of activity
Type Of RI:
Single sited RI
RI Life Cycle Status:
Active RI
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
Deposition of thin films, various materials, various techniques
SERVICE DESCRIPTION:
Thin films of materials with various properties (metallic, dielectric, ferroelectric, semiconductor, magnetic, superconductor, polymer, etc.) can be deposited by various techniques such as spin-coating, electrochemical, evaporation, sputtering, laser ablation, molecular beam epitaxy. A consistent effort is to grow epitaxial films with perovskite structures, as well as hybride perovskites for photovoltaic applications.
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Preparation of nano-objects
SERVICE DESCRIPTION:
Various nano-objects (nanotubes, nanowires, nanoribbons, nanopowder, nanocrystals) can be prepared using template and template-less techniques.
SERVICE PERSONS:
Nicoleta PREDA
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Preparation of bulk ceramic materials and complex metal-ceramic structures
SERVICE DESCRIPTION:
Bulk ceramic materials can be prepared by classical sintering, spark plasma sintering, microwave sintering and hot pressing.
SERVICE PERSONS:
Andrei GALATANU
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Deposition of semiconductor thin films and multilayer structures
SERVICE DESCRIPTION:
Magnetron sputtering equipment provided with in-situ techniques for surface analysis (spectroscopic Auger electron - AES), low energy electron diffraction - LEED and ellipsometry thickness and profile monitoring.
SERVICE PERSONS:
Magdalena Lidia CIUREA
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Preparation of metallic compounds and alloys in form of ribbons, thin films or bulk
SERVICE DESCRIPTION:
Obtaining metallic or intermetallic materials, with various magnetic, magnetoelectric, magnetocaloric, thermoelectric, magnetoresistive or shape memory properties, as: • bulk materials (~ 5 g per batch) by induction melting, electrical arc or tri-arc melting, the later with equipment with an included pulling system for single crystals growing by Czochralski method (variable speed 0.02 - 8 mm / hour). • strips of variable dimensions by Melt spinner (~ 10 g per batch\by induction or resistive melting) • thin films by RF sputtering.
SERVICE PERSONS:
Victor KUNCSER
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Materials synthesis by powder metallurgy
SERVICE DESCRIPTION:
Materials and composites for specific applications, realized by mechanical alloying and assisted sintering techniques: • refractory materials and composite • extra-hard materials and composites based on C or diamond materials, metallic materials (steel, alloys) strengthened by oxide dispersions. • thermoelectric materials, superconductors, multiferroic, dielectrics. Components can be made with different shapes, in a relatively short processing time and with a small number of intermediate steps. Nanostructured materials, composites with various inserts, functional gradient materials or multilayered materials can be obtained
SERVICE PERSONS:
Andrei GALATANU
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Thermal annealing in non-corrosive atmosphere
SERVICE DESCRIPTION:
Se pot prepara noi materiale (hidruri, nitruri) pornind de la metalele constituente și gaze sau amestecuri de gaze. De asemenea, se pot trata termic straturi subțiri și pulberi în atmosfera de gaze necorozive (hidrogen, azot, metan, dioxid de carbon, argon) la presiuni ce depăsesc 100 atmosfere și temperaturi de sute de grade Celsius, necesare pentru obținerea de materiale neconvenționale. Astfel se obțin compusi inovativi cu optimizarea proprietaților magnetice (creșterea coercitivitații pentru magneți permanenti), electrice (conductivitate), optice (absorbție specifică), mecanice (duritate). Procesarea noilor materiale se poate realiza prin interfațarea aparatului de tratament termic cu o nisă cu atmosferă protectoare de argon (<1 ppm O2, < 1 ppm H2O), permitând evitarea expunerii în orice moment (dacă este necesar) a materialelor la oxigen și umiditate, în special pentru nanoparticule metalice ușor oxidabile și hidruri.
SERVICE PERSONS:
Victor KUNCSER
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Metallic, inorganic and organic films by vaccum deposition
SERVICE DESCRIPTION:
The preparation of metallic supports for studies by surface enhanced Raman scattering (SERS) and surface enhanced infrared absorption spectroscopy (SEIRA). Inorganic or organic films can be also prepared. A thickness controller is also available.
SERVICE PERSONS:
Mihaela BAIBARAC
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Deposition of large area multilayer organic heterostructures by thermal vacuum evaporation
SERVICE DESCRIPTION:
Small molecule and oligomers organic compounds and metals can be deposited by thermal vacuum evaporation method on a large area (up to10x10 cm). This equipment permits the preparation of single/multilayer organic heterostructures. Also, can be prepared doped organic layers by co-deposition. The thickness and the uniformity of the layers are controlled during the deposition process.
SERVICE PERSONS:
Anca STANCULESCU
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Processing materials in clean rooms
SERVICE DESCRIPTION:
In the "Cleanroom" laboratory, with the necessary infrastructure in terms of high performance, can be performed the synthesis and characterization of nanostructured materials, with complex equipment for the preparation and characterization of samples. The Cleanroom of NIMP, consists of 2 rooms class 1000 and respectively 100, provides sample preparation of functional nanostructured materials and structures based on these materials and / or achievement of the following operations: • photolithography and nanoimprint; • substrate cleaning and chemical etching; • Surface processing samples with electron beam, ion beam; • Thermal Evaporation deposit thin layers with / without electron beam; • Preliminary characterization
SERVICE PERSONS:
Ionut ENCULESCU
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Preparation of piezoelectric active materials and elements
SERVICE DESCRIPTION:
Materiale piezoceramice sub formă de elemente piezoceramice sinterizate și polate se folosesc în toate domeniile industriale și domestice sub diverse forme și dimensiuni, începând cu cele mai simple cum sunt buzerele sau banalele aprinzătoare de gaz și până la cele mai sofisticate folosite în microrobotică, în industria aerospațială, sub formă de micromotoare piezoelectrice și actuatori de deplasare fină. Foarte larg utilizate sunt traductoarele de putere pentru băi de spălare cu ultrasunete, pentru suduri de folii metalice sau mase plastice, pentru diverse aplicații în domeniul auto și în prelucrarea prin abraziune activată cu ultrasunete. De asemenea sunt tot mai intens utilizate în medicină, atât pentru terapie cât și pentru microchirurgie.
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Microwave components-design, fabrication and characterization
SERVICE DESCRIPTION:
SERVICE PERSONS:
Gabriel BANCIU
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Photocatalytic materials
SERVICE DESCRIPTION:
Photocatalysts are commonly semiconducting materials, characterized by filled valence band and empty conduction band which therefore can act as photoactive materials for redox and charge-transfer processes. For practical relevance, they have to be chemically and biologically inert, photo stable, nontoxic and inexpensive, capable to use the solar radiation for water and air decontamination (organic pollutants, bacteria, viruses etc.). Among many semiconductors (ZnO, WO3, -Fe2O3, SrTiO3, CeO2, CdS, ZnS, GaN etc.) TiO2 is the most studied and used because it fulfils all of the above requirements and exhibits adequate conversion values. In order to increase the activity in visible light (the main part of solar radiation) cation and anion doped and codoped photocatalysts were synthesized and tested with promising results. Our expertise consists both, in the synthesis of doped and codoped TiO2 or ZnO based photocatalysts by solvothermal route, sol gel and mechanochemistry, as well as in fast testing of photocatalytic activities, by using the Photocatalytic checker PCC-2 (ULVAC-Japan).
SERVICE PERSONS:
Lucian DIAMANDESCU
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Superconductor materials-MgB2 disks
SERVICE DESCRIPTION:
Temperature superconducting below 39 KG, which is the critical temperature of pure material, Tc. Applicability is placed between 12 K and 30 K and magnetic fields below 15 T.
SERVICE PERSONS:
Petre BADICA
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Complex system for electrical characterization
SERVICE DESCRIPTION:
The experimental complex system for electrical characterization system serves to measure magneto-transport, electrical, electro-optical, parametric, high Z, DC, RF, photoelectric, ferroelectric and microwave properties on materials and structures. This infrastructure contains: - Four Janis cryostats, each with 4 optical windows, dedicated to measure in different temperature ranges from minimum 10 K to maximum 800 K. All cryostats are connected to turbo-molecular vacuum pumps. - Two Gratting Monochromators Oriel, wavelengths 200-6000 nm for photoelectric effect measurements. - Several light sources: Xe lamps, incandescent lamps , ceramic elements, laser diodes with different wavelengths of 266 nm (10 mW), 355 nm (10 mW), 473 nm (50 mW), 671 nm (50 mV) and 2700 nm (10 mV) and choppers for modulating the illumination frequency from 40 Hz to 4 kHz, for photoelectric effect measurements. - Five Keithley electrometers with incorporated sources for voltages up to 1000 V. Currents as low as 10 fA can be measured with these electrometers. - Two Lock-In amplifiers for measuring modulated signals, frequencies: 1 mHz to 100 kHz. - System for measuring Hall effect with a 2T electro-magnet for measuring the free carrier density and mobility. - Four RC bridges (Agilent and Hioki) and one Impedance Analyzer HP 4194A with up to 42V incorporated voltage sources for capacitance/conductance/impedance/admitance measurements with frequencies in the 10Hz-40 MHz range. - Keithley System for measuring differential conductivity and/or resistivity with small noise under small power conditions. The system consists in a programmable current source (DC and AC) and a nanovoltmeter. - System for electrical characterization of solar cells containing: 1) One VeraSol-2 LED Class AAA Solar Simulator, Factory certified IEC, ASTM, JIS AAA rated ; 2 x 2 inch output beam size; Variable output adjustment from 0 to 1.0 sun; User settable spectral control; 2) Keithley 2001B System SourceMet
SERVICE PERSONS:
Ioana PINTILIE
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Investigation of the electrically active defects in materials and structures
SERVICE DESCRIPTION:
The electrically active defects generated during the growth, implantation, processing or irradiation are those that has a direct impact on the electrical properties of the materials, multilayer structures and complex devices. Their detection (surface, interface or volume) and characterization is essential for improving the growth and processing technologies. The infrastructure contains one HERA-DLTS HE-1030 and four TSC and TDRC Systems for detection and characterization of electrically active defects located inside materials and structures, including those located at the interfaces between different materials. With these measurement systems one can determine the concentration of electrically active defects, the energy levels introduced by them in the forbidden band of the material and the capture of sections of the charge carriers. The HERA-DLTS HE-1030 system is based on measurements of 1 MHz capacitance transients with temperature and it is sensitive to defects generated in concentration as low as 108 cm-3 being an unique facility in our country. The TSC and TDRC systems are based on current measurements during temperature scans with constant heating rate (sample in quasiequilibrium) and is applicable for the detection and characterization of defects in concentration larger than 1010 cm-3.
SERVICE PERSONS:
Ioana PINTILIE
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Device and materials characterization in the microwave domain up to 500 GHz
SERVICE DESCRIPTION:
Caracterizări antene (caracteristica de directivitate) în camera anecoică 900 MHz – 40 GHz • Caracterizări diporți, parametri repartiție amplitudine și fază 10 MHz – 67 GHz • Caracterizări structuri în ghid în banda 75 GHz – 500 GHz • Caracterizări dielectrice a materialelor cu pierderi reduse și permitivitate electrică ridicată prin metoda Hakki-Coleman • Caracterizări materiale prin metoda perturbațiilor în cavitate rectangulară mod TE106 în banda X • Caracterizări materiale (precizie ridicată pentru lichide) cu metoda reflectometrică Agilent 85070 banda 0,5 – 40 GHz • Simularea 3-D și 2-D a răspunsului electromagnetic pentru dispozitive / structuri de microunde folosind pachetele software CST Studio Suite (incluzând CST Microwave Suite și Antena Magus) precum și Ansoft HFSS și Ansoft Designer.
SERVICE PERSONS:
Gabriel BANCIU
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Investigation of temperature dependent properties by modern thermal differential analysis, scanning calorimetry and mass spectrometry
SERVICE DESCRIPTION:
Analizele complexe oferă informații despre procesele fizico-chimice care au loc în materiale sub acțiunea temperaturii: descompuneri termice, cristalizări, transformări polimorfe, topiri, fierberi, sublimări; toate aceste informații având un rol hotărâtor în optimizarea tehnologiilor de procesare a materialelor. De asemenea, sunt evidențiate cu exactitate temperaturile de producere a reacțiilor chimice. Institutul dispune de derivatografe care acoperă un domeniu larg de temperaturi, analizele se pot face în atmosfere variate, cu viteze de încălzire diferite. Un avantaj extrem de important îl reprezintă faptul că dispunem de un spectrometru de masă cuplat la derivatograf care permite o analiză riguroasă a gazelor rezultate din procesele de descompunere termică, cu rol esențial în stabilirea completă a formulelor chimice caracteristice materialelor investigate. Totodată, beneficiem de existența unui soft profesional de termocinetică ce permite o analiză minutioasă a datelor experimentale, completând lista parametrilor utili necesari realizării unei procesări corecte de material: pot fi calculate entalpiile de formare ale diferitilor compuși, energiile de activare, tipurile și ordinele de reactie care au loc, și nu în ultimul rând, pot fi realizate simulări ale unor variante de procesare.
SERVICE PERSONS:
Victor KUNCSER
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Determination of the thermal properties of materials (Debye temperature, specific heat, entropy variation)
SERVICE DESCRIPTION:
The method measures the heat absorbed and released from a sample by monitoring the resulting changes depending on temperature. During a measurement, a known amount of heat is applied to constant power for a fixed period of time, and this warming period is followed by a cooling period for the same timeframe. Depending on sample properties and contacts thermal method uses one or two time constants. Data from the sample and support are analyzed in one of these models and allow the extraction of Debye temperature, describing the phonon contribution.
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Transport properties measurements at low temperatures
SERVICE DESCRIPTION:
Field and temperature dependencies of thermal conductivity, electrical resistivity, Seebeck coefficient and termoelectric figure of merit can be measured at temperatures from 2K up to 400 K and in magnetic fields up to 14 T (the highest constant field available in Romania !)
SERVICE PERSONS:
Victor KUNCSER
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Magnetometry
SERVICE DESCRIPTION:
Echipamente moderne de înaltă performanță și sensibilitate (Magnetometru SQUID, VSM) permit caracterizarea completă a proprietaților magnetice ale eșantioanelor, în câmpuri magnetice de până la 14 T și într-un domeniu extins de temperatură (2 - 1000 K). Magnetometria optică de tip Kerr este dedicată studiului efectelor magnetice specifice ce se manifestă pe suprafața materialelor până la adâncimi de 0.1 μm și la interfețe, deci adecvată analizei straturilor subțiri și multistraturilor). O caracterizare magnetică integrală este absolut necesară pentru materialele utilizate în realizarea de senzori, actuatori, medii de înregistrare magnetică, dar și motoare, generatoare, electromagneți, transformatoare, ecranări magnetice. Se pot efectua următoarele tipuri de determinări: dependența de temperatură a proprietaților magnetice (magnetizare remanentă și la saturație, susceptibilitate magnetică DC și AC, câmp coercitiv, câmp de anizotropie pe monocristale, valori ale momentelor magnetice), cicluri de histerezis, valori ale energiei magnetice (BH)max, temperatura de ordonare magnetică (TC sau TN). Prin utilizarea echipamentului MOKE se pot determina rapid: cicluri de histerezis la temperatura camerei pe straturi subțiri de materiale magnetice moi (în câmp de până la 0.5 T), distribuțiile unghiulare ale axei de ușoară magnetizare și tipuri de cuplaje magnetice între straturi (pentru multistraturi).
SERVICE PERSONS:
Victor KUNCSER
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Characterization of superconducting materials
SERVICE DESCRIPTION:
SERVICE PERSONS:
Petre BADICA
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Modeling and simulation using DFT
SERVICE DESCRIPTION:
Substantially improving the properties of a material, bulk, surface or interface, as well as the development of materials with new properties required by technologically advanced applications, can be achieved now by using the power of computing of computational clusters, at costs below those involved in the classical experiment methods. In addition, the design of materials by computational methods allows the introduction of separate elements that characterize the chemical and structural of a material, thus enabling the determination of the specific effects of each ingredient. In NIMP there is fundamental scientific basis (know-how) as well as material basis, both in continuous development, which enables addressing diverse topics of materials design, starting from atomistic level. Using these computational capabilities we can provide design of materials and structures services, with properties specific to an application determined by the customer. Existing expertise covers: • materials for hydrogen storage; • electro-catalysts and catalysts; • materials and structures for solar energy conversion; • electrolytes for high-capacity batteries; • materials for lighting devices with solid state; • material to convert heat into electricity.
SERVICE PERSONS:
Neculai PLUGARU
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Materials characterization by UV-VIS-NIR spectroscopy
SERVICE DESCRIPTION:
Studies of UV-VIS-NIR spectroscopy in the spectral range 175-3300 nm on samples in the liquid, powder and film state can be performed.
SERVICE PERSONS:
Mihaela BAIBARAC
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Materials characterization by FTIR spectroscopy
SERVICE DESCRIPTION:
Studies of FTIR spectroscopy in the spectral ranges 50-680 and 370-7500 cm-1 on the samples in the liquid, powder and thin films can be performed.
SERVICE PERSONS:
Mihaela BAIBARAC
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Materials characterization by FTRaman spectroscopy
SERVICE DESCRIPTION:
The characterization of powders, crystals and thin films by Raman scattering spectroscopy can be carried out using as excitation laser source a YAG: Nd laser (1064 nm) in the spectral ranges (50; 3600) cm-1 and (-100; -2000) cm-1 in the backscattering geometry.
SERVICE PERSONS:
Mihaela BAIBARAC
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Materials characterization by photoluminescence spectroscopy
SERVICE DESCRIPTION:
Studies of photoluminescence (PL) in visible and near infrared range, at room temperature and liquid nitrogen temperature, on samples in the state of liquids, powders and thin films can be performed. PL time decay measurements using as excitation sources pulsed laser diode: 440 nm, 375 nm and UV LED 280 nm can be carried out, as well.
SERVICE PERSONS:
Mihaela BAIBARAC
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Thermoluminescence and applications
SERVICE DESCRIPTION:
Geological dating, archaeological authentification, retrospective dosimetry can performed based on the measurements of the light emitted by the samples (minerals, especially silicates) during the heating, i.e. thermoluminescence.
SERVICE PERSONS:
Mihai SECU
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Probing nanostructured materials using polarized light
SERVICE DESCRIPTION:
A) using spectroscopic ellipsometer Measurements: reflection ellipsometry, transmission ellipsometry, generalized ellipsometry (Anisotropy, Retardance, Birefringence), reflectance/transmittance, scaterrometry, depolarization, Mueller Matrix, temperature range -160 to 600 C (only reflection ellipsometry) Spectra analysis results: thickness, refractive index, extinction coefficient, absorption coefficient, dielectric function, band gap, critical point energies, electrical parameters for degenerate semiconductors (resistivity/conductivity, carrier density, scattering time, carrier mobility), linear birefringence and linear dichroism, magneto-optical effects, Verdet constant, Faraday rotation, eletro-optical effects, phase transition temperatures, material density (relative with respect to sister-like samples) B) using MOKE Measurements: Magneto-Optical Kerr Effects (only Kerr rotation) of ferromagnetic films/multilayers Analysis results: Kerr rotation, hysteresis loops, saturation, remanence, coercivity, magnetic anisotropy C) using Circular Dichroism Spectrometer Measurements (spectroscopic scan, time scan, temperature scan): circular dichroism; magnetic circular dichroism (1.5 T); absorption, fluorescence, temperature range -80 to 500 K Analysis results: (organics) determination if a protein is folded, secondary structure (α-helix, β-sheet), changes in structure upon mutagenesis, stability (pH stability, denaturant stability, temperature, buffers, addition of stabilizers), changes in the conformation of a protein upon protein-protein interaction; (inorganics) magneto-optical effects
SERVICE PERSONS:
Catalin-Aurelian GALCA
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Victor KUNCSER
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Silviu POLOSAN
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Contact angle measurements
SERVICE DESCRIPTION:
Measuring the contact angles with the temperature variation in the 20-400 ° C range. • Measurement of the surface / interfacial tension in the 20-200 ° C range. • Measurement of the surface energies of solids in the 20-400 ° C temperature variation.
SERVICE PERSONS:
Irina ZGURA
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IR spectra of homogeneous/inhomogeneous, heterogeneous or molecular materials
SERVICE DESCRIPTION:
Characterization of microscopic regions of solid samples (as compact, powder or paste) and liquid samples by means of characteristic infrared absorptions. Fast scanning allows to study the kinetics of certain chemical reactions of a dynamic process during the material synthesis or the distribution of certain compounds on a surface.
SERVICE PERSONS:
Paul GANEA
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Broadband Dielectric Spectroscopy
SERVICE DESCRIPTION:
Characterization of electrical properties of organic/inorganic materials either dielectric, piezoelectric, ferroelectric or pyroelectric. Fundamental studies of phase transitions, dielectric relaxation, interfacial polarization, electrochemical processes.
SERVICE PERSONS:
Paul GANEA
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SEM analysis
SERVICE DESCRIPTION:
Morphological determinations: shape and particles size, nanowires and nanotubes, surfaces morphology. Compositional determinations: elemental chemical analysis by EDS technique, composition map tracing by EDS cartography
SERVICE PERSONS:
Monica ENCULESCU
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EPR spectroscopy
SERVICE DESCRIPTION:
Electron paramagnetic resonance (EPR) spectroscopy detects chemical species and point defects with unpaired electrons (paramagnetic centers) in semiconductor and insulating materials (bulk and nanostructures), glasses, ceramics, polymers, biological compounds etc. - Characterization of the paramagnetic centers: nature, valence, structure, localization, concentration, stability, production and recombination mechanisms. - Information about the host material, using the paramagnetic centers as local probes: local structure and symmetry, presence of local strains, degree of lattice disorder, mechanisms of structural and chemical transformations.
SERVICE PERSONS:
Sergiu Vasile NISTOR
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Materials characterization by Moessbauer spectroscopy
SERVICE DESCRIPTION:
Complex investigation by Mössbauer spectroscopy is providing unique data about the crystalline and non-crystalline phases containing iron (up to the limit of 0.2-0.5%), Fe location in the network, valence state and spin, as well as magnetic, local distortion and the degree of ordering as well as the role of these characteristics on the catalytic, conductive, magnetic properties or specific to the area of direct impact of materials in fields where these properties determine the use. This type of professional services is unique in Romania, at the peak of the global standard, and has been developed since the past 50 years. It is a highly effective method in chemistry and catalysis, providing complex characterization of oxides based on iron, in metallurgy, including study and monitoring of corrosion in the characterization of magnetic materials in general, the whole range of sizes (from bulk systems at the nanoscale type nanoparticles, thin films and multilayer), with outstanding applications in nanoelectronics. Appropriate measurements can be made upon request: • measurements in bulk crystalline or amorphous samples, coordinative complexes, metal-organics, doped polymers, vitreous structures (glasses), dust, corrosion products • investigations on nanoparticle systems including for bio-medical applications • investigation on nanometric thin films, bands, multi-layers • temperature effects, the external magnetic field, irradiation • highlight reproductibility and endurance.
SERVICE PERSONS:
Victor KUNCSER
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Surface/interface properties investigation by X-ray photoelectron spectroscopy and related techniques
SERVICE DESCRIPTION:
Analysis of experimental data through complex "deconvolution" procedures, extracting complex stoichiometry, identification of surface contaminants, hybridization of carbon or oxygen mode. • Assistance in the elaboration of scientific papers. The group has considerable experience of publishing, including in ISI journals with high impact factor (Angewandte Chemie, Journal of the American Chemical Society, ChemCatChem, ChemSusChem, J. Catal., ACS Applied Materials and Interfaces, Green Chemistry). • Support in the development of national and international projects in the field. Group members have led so far, projects worth approx. 100 million lei, with national funding, EU (structural funds or FP6-7), bilateral contracts.
SERVICE PERSONS:
Cristian Mihail TEODORESCU
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Powders structural investigations by X-ray diffraction
SERVICE DESCRIPTION:
We perform X-ray diffraction (XRD) analyses on polycrystalline materials using a Bruker D8 Advance X-ray diffractometer in parafocusing geometry. We offer identification and quantitative determination of crystalline phases in powders, bulk samples or coatings. Deeper insight into the atomic structure can be obtained by precise determination of the lattice constants (for instance their variation due to doping elements, strain, or thermal treatment), refinement of atomic positions in the unit cell, determination of the average crystallite size and preferred orientation of crystallites. We can perform all the above analyses also at non-ambient temperatures ranging from -180 C (liquid nitrogen) to 450 C, using the temperature chamber MRI TC-Wide Range. This allows in-situ studies of lattice modifications and phase transformations in this temperature range.
SERVICE PERSONS:
George STAN
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Synthesis of hybrid nano-composites and structures
SERVICE DESCRIPTION:
Chemical synthesis of the semiconducting crystals in un-doped and doped state (for example PbI2) and of different nanoparticles such as ZnO, ZnS, PbI2, CdS, graphene oxide and reduced graphene oxide can be carried out. Synthesis of composites based on the carbon nanoparticles (carbon nanotubes, graphene oxide and reduced graphene oxide) and insulating and conducting polymers can be performed by chemical and electrochemical ways.
SERVICE PERSONS:
Mihaela BAIBARAC
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Solar cells characterization
SERVICE DESCRIPTION:
The efficiency of solar cells can be evaluated by using a calibrated solar simulator.
SERVICE PERSONS:
Cristina BESLEAGA-STAN
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Synthesis and characterization of chalcogenid materials
SERVICE DESCRIPTION:
SERVICE PERSONS:
Alin VELEA
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Deposition of organic materials and bio-molecules by Langmuir-Blodgett
SERVICE DESCRIPTION:
Monolayers and multilayers from small molecule, polymers, monomers and biological materials can be obtained on solid substrates by Langmuir-Blodgett method.
SERVICE PERSONS:
Anca STANCULESCU
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Optical micro-spectroscopy
SERVICE DESCRIPTION:
Optical imaging and spectroscopical characterization of various luminescent objects with different sizes down to the microns range.
SERVICE PERSONS:
Mihai SECU
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Complex characterization of gas sensors under simulated infield conditions
SERVICE DESCRIPTION:
1. resistance/work function measurements under computer controlled toxic and explosive atmospheres (CO, CH4, NO2, H2S, NH3, SO2) - sensing potential evaluation; calibration sheets for domestic/industrial sensors. 2. catalytic activity output of sensor components (substrate, electrodes, and sensitive layers). 3. temperature calibration of sensor substrates.
SERVICE PERSONS:
Adelina STANOIU
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Fluorescence spectroscopy with quantum efficiency
SERVICE DESCRIPTION:
Optical characterization of various luminescent materials by using UV and IR excited fluorescence, excitation, fluorescence lifetimes and quantum efficiency.
SERVICE PERSONS:
Mihai SECU
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Thermophysical properties at high temperatures
SERVICE DESCRIPTION:
Characterization of temperature dependent properties of materials: thermal diffusivity, specific heat, thermal conductivity from room temperature up to 1100 C; thermal expansion coefficient from room temperature up to 1600 C; electrical conductivity and Seebeck coefficient from room temperature up to 800 C.
SERVICE PERSONS:
Andrei GALATANU
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Complex characterization by using gamma resonant spectroscopy (Mössbauer spectroscopy)
SERVICE DESCRIPTION:
Mössbauer Spectroscopy is a spectroscopic method based on the recoil-free, resonant absorption and emission of low energy gamma rays (Mössbauer effect) in solids. The method allows us the study of hyperfine interactions in solids containing 'Mössbauer elements' e.g. Fe, Sn, Eu etc. The detection limit of this method is ~ 10-8 eV. Based on the hyperfine parameters obtained from Mossbauer spectra one can obtain useful information in different scientific fields. In the following, a couple of successful applications are highlighted: valence state, electronegativity, ligand effects, chemical kinetics, corrosion, catalysis; magnetization states, superparamagntic effects, local environment, structure and the relative phase ratio; phase transitions studies understanding the structure and function of iron containing enzymes and bio materials; amorphous and nano material's study, physical metallurgy, monitoring and the optimization process of alloys and special steels preparation; in geology for identifying the composition of iron- containing specimens including meteorites, Moon and Mars rock samples; cosmology (gravitational red shift, second-order transverse Doppler effect predicted by the theory of relativity), due to the very high energy resolution, etc.; study of surfaces (0-300 nm) by means of the conversion electron detection (CEMS).
SERVICE PERSONS:
Lucian DIAMANDESCU
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Microstructural characterization by conventional Transmission Electron Microscopy
SERVICE DESCRIPTION:
• Morphological determination: shape and size of inorganic nanoparticles, nanowires/nanotubes, thin films, characterization of extended defects (dislocations, planar defacets). • Microstructural determinations: identification of crystalline phases, through electron diffraction, distribution of crystalline phases in heterogeneous samples (thin films, alloys). • Compositional determinations: chemical elemental analysis using EDS technique
SERVICE PERSONS:
Valentin Serban TEODORESCU
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Deposition of bioactive coatings (hydroxyapatite, bioglass) on 2D and 3D objects
SERVICE DESCRIPTION:
Fabrication of adherent magnetron sputtered ceramic and glass coatings with osteoconductive properties for the bio-functionalization of dental, cranial, or orthopedic metallic implants.
SERVICE PERSONS:
George STAN
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Deposition of highly c-axis textured aluminum nitride films for microelectronics
SERVICE DESCRIPTION:
Low temperature reactive radio-frequency magnetron sputtering synthesis of highly c-axis textured aluminum nitride thin films with piezoelectric/pyroelectric properties for the development of microelectronics devices.
SERVICE PERSONS:
George STAN
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Pull-out adhesion testing of thin films, coatings, varnishes, and paints
SERVICE DESCRIPTION:
Measuring the bonding strength of compact (non-porous) thin films, coatings, varnishes, and paints with dedicated testers, equipped with test elements having diameters from 2.8 to 20 mm. The method complies with ISO 4624, ASTM D 4541, EN 1542 and ASTM C633 standards.
SERVICE PERSONS:
George STAN
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Deposition of thin films of large organic molecules and bio-molecules
SERVICE DESCRIPTION:
SERVICE PERSONS:
Anca STANCULESCU
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IR adsorption spectra
SERVICE DESCRIPTION:
SERVICE PERSONS:
Paul GANEA
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Wide-band dielectric spectroscopy
SERVICE DESCRIPTION:
SERVICE PERSONS:
Paul GANEA
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Raman spectroscopy applied to materials
SERVICE DESCRIPTION:
The characterization of powders, crystals and thin films by Raman scattering spectroscopy can be carried out using the following excitation laser sources: (a) Argon laser (the main lines at 514.5 nm and 488 nm), (b) Krypton laser (lines at 647.1 nm and 676. 4 nm) and (c) solid lasers (633 and 562 nm) in the spectral ranges (50; 3500) cm-1 and (-3500; -50 )cm-1. All measurements can be performed using a con-focal Olympus BX41 microscope at different temperatures ( from -196 to 6000⁰ C).
SERVICE PERSONS:
Mihaela BAIBARAC
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Testing of materials for applications in the field of the energy storage, electrochemical sensors and corrosion processes
SERVICE DESCRIPTION:
For the applications in the field symmetrical/non-symmetrical supercapacitors and rechargeable batteries are available the following experiments: cyclic voltammetry, charge/discharge galvanostatic studies and electrochemical impedance spectroscopy studies. Studies of cyclic voltammetry, electrochemical impedance spectroscopy and chrono amperometry can be carried out for the applications in the field of electrochemical sensors. In order to assess main parameters of corrosion, namely corrosion current density, corrosion potential, anodic and chatodic Tafel slopes and corrosion rate, polarization curves of metals immersed in different solutions can be also carried out.
SERVICE PERSONS:
Mihaela BAIBARAC
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Execution of mechanical and electronic parts for research equipments
SERVICE DESCRIPTION:
Small mechanical components as well as specialized electronic boards can be executed in the mechanical workshop of the institute.
SERVICE PERSONS:
Mihai CIOCA
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Thin films structural investigations by X-ray diffraction
SERVICE DESCRIPTION:
We perform, isotropic, textured, or epitaxial thin films analyses, using a Bruker D8 Advance high resolution X-ray diffractometer, provided with parallel, monochromatized X-ray beam. We can perform nondestructive and precise thickness measurements of films and multilayers (crystalline or amorphous), starting from a few nanometers up to 100 nm, by X-ray reflectometry (XRR). The films should have mirror-like smoothness of the surface and interfaces. The surface and interface roughness, and films densities can be also determined. For hetero-epitaxial films: we determine the in-plain orientations, the epitaxial relationship between film and substrate or within multilayers, in-plan strain and stress, etc.
SERVICE PERSONS:
George STAN
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Luminescent Phosphors characterization
SERVICE DESCRIPTION:
Complex characterization of luminescent phosphors (solids or liquids) by using photoluminescence, diffuse reflectance, quantum yield and colorimetric analysis (chromatic parameters CIE)
SERVICE PERSONS:
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Research Equipment
Pulsed Laser Deposition (PLD) Workstation for thin layer deposition, fitted with in-situ Reflection High Energy Electron Diffraction (RHEED) analysis system
CATALOG NAME:
DESCRIPTION:
Pulsed Laser Deposition System - PLD for deposition of oxide materials thin films and multilayers, especially ferroelectrics and multiferroics. Specifications: excimer laser KrF 248 nm Four 2" targets with permanent rotation and 5 axis PC controlled motion substrate temperature: ≤ 1000°C high vacuum 10-7 mbar high-pressure RHEED system for in-situ characterization included The Reflection High Energy Electron Diffraction –RHEED is a technique that can be used during the thin film growth to characterize the surface of crystalline materials and to monitor the deposition of each atomic layer.
PRODUCER:
Surface
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Magnetron Sputtering Equipment with in-situ surface analysis techniques : AES, LEED
CATALOG NAME:
DESCRIPTION:
(1) – deposition chamber (four DC and RF magnetrons); (2) & (2‘) – UV-VIS-NIR ellipsometer ((2) – in situ monitoring and (2’)- ex situ characterization); (3) – Auger and LEED facilities; (4) – Step profiler (1) Deposition chamber: Confocal sputtering chamber 2 off 2kW, 800 Volt DC Power supplies for sputtering 1 off 600 watt, 13.56Mhz RF sputter power supply 1 off 300 watt, 13.56Mhz RF sputter power supply for wafer Bias Hot stage for 150 mm wafers to 850 °C; Film uniformity +/-5%; Repeatability <2%. Sputter chamber Load Lock: Infra red wafer degas system 1000 watts. (2 )Ellipsometer M-2000V (W3-03-U-XE): The M-2000 for in-situ monitoring and process control. Spectral range: 370 - 1000 nm (390 wavelengths), for dielectrics, organics, and amorphous semiconductors. (3) Auger and LEED system: (UHV vacuum, 1 x 10-10 torr, analysis chamber) LEED Auger Load Lock (for independent LEED operation) Vacuum gauging to 5 x 10-9 torr
PRODUCER:
Surrey NanoSystems Ltd., Omicron
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Cryostatic system with closed circuit compressor
CATALOG NAME:
DESCRIPTION:
It is used for electrical/photoelectrical measurements with variable temperature from ~10 K up to 350 K.
PRODUCER:
Janis
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
DLTS system
CATALOG NAME:
DESCRIPTION:
Used for trap investigation in semiconductor materials.
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Optical cryostat with closed cycle compressor
CATALOG NAME:
CCS-150
DESCRIPTION:
PRODUCER:
Janis
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vectorial network analyzer with accessories and extension up to 500 GHz, including probe station for microcontacting
CATALOG NAME:
DESCRIPTION:
For materials investigation into the microwave domain.
PRODUCER:
Agilent
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thin film deposition system, magnetron RF-sputttering
CATALOG NAME:
DESCRIPTION:
For deposition of metal thin films.
PRODUCER:
Surrey NanoSystems Ltd.
PRODUCTION YEAR:
2013
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Colorant continuum laser
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal annealing facilities
CATALOG NAME:
DESCRIPTION:
• High Temperature Furnaces • Annealing at temperatures up to 1650°C • Annealing furnace in vacuum and in controlled atmosphere • Controlled heating in ramp
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Impedance/Gain analyzer
CATALOG NAME:
4294A
DESCRIPTION:
PRODUCER:
HP
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Characterization system for ferroelectric materials
CATALOG NAME:
Premier II
DESCRIPTION:
PRODUCER:
Radiant Technology
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Cluster for surface science, including MBE deposition chamber, XPS/UPS/AES analysis and STM microscope
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Specs
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spectroscopic Ellipsometer
CATALOG NAME:
Variable Angle Spectroscopic Ellipsometer (VASE)
DESCRIPTION:
wavelength range: 200 nm to 1700 nm ( 6.2 to 0.73 eV); Computer controlled angle of incidence: 35 to 90 degrees; reflection ellipsometry, transmission ellipsometry, generalized ellipsometry (Anisotropy, Retardance, Birefringence), reflectance/transmittance, scaterrometry, depolarization, Mueller Matrix; Windows WVASE acquisition and analysis software; sample translation automated (mapping) 150 mm X 150 mm; Instec heat stage (-160 to 600 C);
PRODUCER:
J.A. Woollam Co.
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Computer cluster for numerical simulations
CATALOG NAME:
HP Bladesystem
DESCRIPTION:
60 cores 6X96 GB RAM Storage HP P2000 G3 2 TB effective
PRODUCER:
HP
PRODUCTION YEAR:
2011
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
AFM microscope with PFM facility
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Asylum research
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Complex system for Hall measurement and electric/photoelectric characterization of materials
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
MiniMOKE
CATALOG NAME:
miniMOKE
DESCRIPTION:
A compact instrument with integrated dedicated electronics for measurements of Magneto-Optical Kerr Effects (only Kerr rotation); magnetic information of ferromagnetic films/multilayers; laser diode (630 nm); bipolar power supply; maximum 0.5 Tesla; the angle of incidence = 45 degrees; Longitudinal MOKE; saturation, remanence and coercively from measured hysteresis loops; magnetic anisotropy by rotation of the sample around its surface normal;
PRODUCER:
Anderberg & Modéer Accelerator AB (AMACC)
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Optical microscope with polarized light
CATALOG NAME:
DESCRIPTION:
• Optical microscope M1000 with Total Interference Contrast (TIC) option • Determination of film thicknesses larger than 30 nm • Option for working in polarized light • CCD camera
PRODUCER:
ZEISS
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Potentiostat/Galvanostat, model Voltalab 80
CATALOG NAME:
DESCRIPTION:
Measured potential ranges: ±2, 4, 8, 15V cu a best resolution of 60 µV, measured current – highest range 1A and lowest range 10 nA wit best resolution of 300 fA, scan rate 0.01- 20 V s-1, maximum frequency 100 kHz and minimum frequency 1 mHz, frequencies /decade 5, 10 and 20, resolution for electrochemical impedance studies being of 1205-250 µV. This equipment is endowed with a speed control unit for rotative disc electrodes (100 to 5000 rpm with an accuracy on rpm of ±0.1%).
PRODUCER:
Radiometer Analytical
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
RF-DC magnetron sputtering system
CATALOG NAME:
DESCRIPTION:
• Sputtering system with 4 targets and simultaneous deposition from 3 targets • Base pressure: 10-9 mbar • Heating substrate up to 900 °C • Rotating sample holder • Option to clean the substrate by plasma confinement • Airlock for rapid manipulation of the sample • Power: 500W; working frequency: 13,56MHz; controlled atmosphere
PRODUCER:
INTERCOVAMEX
PRODUCTION YEAR:
2013
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (56.26 kb)
TEM JEOL 200CX
CATALOG NAME:
JEOL 200CX
DESCRIPTION:
Transmission Electron Microscope Point resolution 0.4 nm; High-tilt range +/-60o; Double tilt goniometer; Single tilt heating holder RT – 1000oC; Single tilt cooling holder -200oC – RT; Configuration : • W filament, 200 kV maximum accelerating voltage • EDS Unit: IXRF Systems • CCD Cameras: Keen View • PC acquisition and processing of image and spectral data using iTEM and IXRF platforms
PRODUCER:
JEOL Ltd., Japan
PRODUCTION YEAR:
1982
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Melt spinner
CATALOG NAME:
DESCRIPTION:
• Source for RF currents (P = 4 kW) • Minimum amount of metallic precursors of 5 g • Vacuum chamber down to 10-3 mbar • Protective and overpressure Ar atmosphere, rotating Cu well up to 3000 rotations per minute
PRODUCER:
Buhler
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal transfer system in AC magnetic field
CATALOG NAME:
DESCRIPTION:
• Heating system in AC magnetic field for studying magnetic colloids • 3 coils for AC fields of different frequencies • High intensity current source • Optical fiber thermometers and acquisition storage data for the evolution of temperature in time • 0.1 K in resolution at 10 Hz repletion rate
PRODUCER:
AMBRELL LTD
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Differential calorimeter and accessories
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2004
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Differential Scanning Calorimeter
CATALOG NAME:
DESCRIPTION:
• -180 oC – 700 oC • Crucible volume: 30-100 μl • medium: air; inert gas; vacuum: 10-2 torr • Scanning rate: 0.01-100 oC/min • The different measurement modules (DTA, DSC, TGA) can be adapted interchangeably around the same structure • Determination of onset, peak, inflection and end temperatures • Transformation enthalpies: analysis of peak areas • Evaluation of crystallization, glass transition analysis
PRODUCER:
Netzsch, Germany
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal properties measurement system – Diamond Thermogravimeter
CATALOG NAME:
DESCRIPTION:
• High temperature range: 20 oC – 1550 oC • Crucible volume: 30-100 μl • medium: air; inert gas; vacuum: 10-2 torr • Scanning rate: 0.01-100 oC/min • The different measurement modules (DTA, DSC, TGA) can be adapted interchangeably around the same structure • Determination of onset, peak, inflection and end temperatures • Transformation enthalpies: analysis of peak areas • Evaluation of crystallization, glass transition analysis
PRODUCER:
Perkin Elmer
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Mass spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
X-ray diffractometer in thin films setting
CATALOG NAME:
D8 Advance
DESCRIPTION:
Short description of apparatus: A high resolution X-ray diffractometer, with vertical goniometer, equipped with a copper target X-ray tube and scintillation detector. The goniometer setting (a Göbel mirror, and a Ge (220) double monochromator) provides a parallel, highly monochromatized X-ray beam. Analyses: Thin films analyses (isotropic, textured, or epitaxial). Grazing incidence measurement for isotropic films, rocking curves for textured films, analyses of hetero-epitaxial films and single crystals (determination of the in-plain orientations, the epitaxial relationship between film-substrate or within multilayers, in-plan strain and stress, etc.). Nondestructive and precise thickness measurements of films and multilayers (crystalline or amorphous), starting from a few nanometers up to 100 nm, by X-ray reflectometry. The surface and interface roughness, and films densities can be also determined.
PRODUCER:
BRUKER-AXS Germany
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thin film deposition system
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spark plasma sintering
CATALOG NAME:
DESCRIPTION:
• Direct (pulsed) current heating • Impulse bursts programmable • Maximum furnace temperature: 2400 °C • Maximum working temperature: 2200 °C • Increasing temperature max 400 °C/min. • Max. force 50 kN or max. pressure 200 bar • Max. stroke distance: 85 mm • Ar or N2 sintering
PRODUCER:
FCT, Germany
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Microwave Sintering
CATALOG NAME:
DESCRIPTION:
• Work space: 135 mm x 135 mm x 135 mm • 6 magnetrons, maximum power 4.8 kW • Frequency: 2450 MHz • Maximum sintering temperature: 1700 °C • Ar, N2 sintering or vacuum (~10-3 mbar) • Susceptors for pre-heating of difficult materials • Arbitrary samples shapes • also metallic materials
PRODUCER:
LINN, Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Hot pressing system and accessories
CATALOG NAME:
DESCRIPTION:
• Maximum batch furnace temperature: 2300 °C • Maximum "hot press" temperature: 2200 °C • Increasing temperature at 100 °C/min. • Max. stroke force 100 kN, above 1000 °C • Max. stroke distance: 4" with F = 44 N • Ar or vacuum sintering (10-3 mbar)
PRODUCER:
MRF, USA
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Measurement system for electrical characterization in clean room
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2013
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Luminescence spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Circular Dichroism Spectrometer
CATALOG NAME:
J-815 Circular Dichroism Spectrometer
DESCRIPTION:
circular dichroism- range between 163-900 nm; magnetic circular dichroism (MCD) in a magnetic field of 1.5 Tesla; Cryostat for MCD and absorption- temperature range between 80-500 K; fluorescence measurements- range 200-900 nm
PRODUCER:
JASCO, INC
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluoreescence spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
System for dielectric spectroscopy with temperature controller. Two modules: Low Frequencies (LF), High Frequencies (HF)
CATALOG NAME:
Low Frequencies (LF): “ALPFA-A High Performance Frequency Analyzer”; High Frequencies (HF): “E4991A, RF Impedance/Material
DESCRIPTION:
The equipments provide fast accurate measurement of dielectric/electric properties of liquids and solids over a range of prescribed frequencies and temperature. The Software supports the independent variables frequency, temperature, dc-bias, and time. These four variables can be arranged in arbitrary order. The Novocontrol ALPHA-A analyzer is an impedance measurement system specially optimized for material measurements. It is based on the ALPHA-A mainframe with an internal two channel frequency response analyzer and several test interfaces for impedance measurement. The ALPHA system can measure impedance from 0.01Ω to 1x10 ^14Ω with an accuracy in loss factor tan (δ) <3x10 ^-5. The frequency range is 30μHz to 20MHz. Due to the analyzers with high input impedance, dielectric samples with extreme low conductivity can be measured even at low frequencies with high precision. Due to the wide impedance range, conductive samples can be measured with high accuracy, too. Ranges: Ac voltage10 ^-4÷3V; Dc-bias -40 ÷ +40V. Software for acquisition, processing and presentation of data for the calculation of the characteristic material parameters, such as permittivity, electrical conductivity, dielectric loss, the harmonic terms (for materials with nonlinear behavior). The Agilent E4991 uses a coaxial line reflection technique and can measure impedance from 0.1Ω to 5x10 ^4Ω with a resolution in loss factor tan (δ) <2x10 ^-3. The frequency range is 1MHz to 3GHz. For dielectric measurements, the sample is placed in the Novocontrol RF sample cell which is connected by the Novocontrol RF low loss extension line to the connector of the E4991. Ac voltage range: 10 ^-3÷1V; Software for acquisition, processing and presentation of data for the calculation of the characteristic material parameters. The Novocontrol Quatro Cryosystem controllers provide to set or ramp the temperature. The sample temperature can be controlled between -150÷400°C with a stabilization accuracy b
PRODUCER:
Novocontrol Technologies GmbH; Novocontrol Technologies GmbH and Agilent Technologies
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Cryogenic magnet with closed cycle cooling
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Hall and resistivity measurement system
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Machine lathe with numerical control and other machines for metal work
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Closed cycle Moessbauer cryostat
CATALOG NAME:
DESCRIPTION:
• Temperature dependent Mossbauer spectroscopy in transmission geometry • Close cycle He cryostats for measurements down to 4.5 K • Ovens for measurements up to 1200 K • 57Co (Rh matrix) source • Drive unit with constant acceleration
PRODUCER:
SEE-Co, USA
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Physiosorption system
CATALOG NAME:
ASAP 2020
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Automatic system for cycling measurements for hydrogen storage, with accessories
CATALOG NAME:
DESCRIPTION:
• Volumetric Sievert apparatus • High performance quantitative analysis of the solid-gas reactions • Hydrogenation treatments can be performed on thin films to improve the crystallinity, to reduce the oxidation degree
PRODUCER:
Advanced Material Corporation, Pittsburgh, USA
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Work station in inert atmosphere
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vibrating sample magnetometers
CATALOG NAME:
DESCRIPTION:
• 1.5 K-300 K and up to 9 T • Sensitivity: 10-5 emu (VSM) and 10-7 emu (AC) • 4 points measurement for resistivity for up to 4 samples • 6 points measurement for Hall effect • furnace for high temperature magnetometry up to 600 K
PRODUCER:
Cryogenics Limited, UK
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorescence spectrometer with quantum efficiency accessory
CATALOG NAME:
DESCRIPTION:
Allows a full optical characterization of various luminescent materials by using UV or IR excited fluorescence, excitation, fluorescence lifetimes and quantum efficiency.
PRODUCER:
HORIBA Jobin-Yvon
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.64 kb)
FTIR Imaging System
CATALOG NAME:
SPOTLIGHT 400 FT-IR Imaging System, SPECTRUM 100 FT-IR
DESCRIPTION:
The infrared imaging system is a versatile instrument for analyzing small size materials. Ability to rapidly collect the images of large areas of the samples at high spacial resolution (down to 10 microns). 1) SPECTRUM 100 FT-IR spectrometer, performs measurements in the transmission/reflection. Software for acquisition, control and analysis. 2) SPOTLIGHT 400 FT-IR imaging microscope. Pixel size:50 μm, 25μm, 6.26μm. High performance MCT detector cooled with liquid nitrogen. Allow to select the size of the scanned area. Moving table with two axes for scanning achievement (mapping); the table movement is programmable with a resolution of 10μm. The device has two working modes: a) Point Mode. Spectral range:10500÷500 cm ^-1; b) Image Mode. Spectral range: 7800÷650cm ^-1. Software for acquisition, control and analysis.
PRODUCER:
Perkin Elmer
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Excitation lasers for Raman spectroscopy (Ar, Kr, Cobolt lasers)
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermometric system for Raman spectroscopy
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV/VIS/NIR spectrofotometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Raman spectrometer
CATALOG NAME:
RFS 100
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FT microscope and accessories
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FTIR spectrofotometer and accessories
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Sphere and system for diffuse reflectivity measurements
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Surface science cluster, including MBE chamber, XPS analysis and STM (detached to Elletra Trieste)
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum evaporation systems
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum evaporation machine with glove box and accessories
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning optical microscope
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning electron microscope with accessories
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorescence spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorescence microscope
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV-VIS spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Varian
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorolog Spectrofluorimter with extension for IR domain
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Various thin film deposition systems (vacuum and e-beam evaporation, sputtering)
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Monochromators
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Solar simulator
CATALOG NAME:
Verasol
DESCRIPTION:
PRODUCER:
Newport
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Tensiometer KRUSS
CATALOG NAME:
DSA 100
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Dozimetric system
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal Constants Analyzer
CATALOG NAME:
DESCRIPTION:
• Laser Flash system (Nd-GGG) • Infrared detector InSb • Tubular furnace, termocouple measurement • Measurement temperature range : 20 - 1100 °C • Thermal diffusivity: 0.01-1000 mm2/s • Thermal conductivity: 0.1-2000 W/m/K • Specific heat by a differential method • Multilayers sample measurement • Nondestructive investigations • Flexible measurement, fully automatic • Integrated software for analysis
PRODUCER:
Netzsch
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Q-band EPR spectrometer ELEXSYS E500Q
CATALOG NAME:
DESCRIPTION:
- CW Q-band EPR spectrometer with E560 ENDOR accessory Specifications: - Frequency: 34 GHz; - Temperature range: 3.8 K - 300 K; - Magnetic field range: 0.03 T - 1.8 T; - Sensitivity: 10^9 spins/Gauss; - Effective RF range: 1- 250 MHz.
PRODUCER:
BRUKER BIOSPIN GMBH
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thermal expansion measurement system
CATALOG NAME:
DIL 402 C
DESCRIPTION:
► DIL402 C ► Measurement path ± 2.5 mm ► Sensitivity24 bit ► 2 resolutions: 0.125 nm/digit,1.25 nm/digit ► Contact pressure 15-45 cN ► Tube sample carrier, aluminum oxide ► Sample length: max. 25 mm ► Sample diameter: max 19 mm ► Atmosphere: inert gases, reactive gases (non-toxic, non-flammable), vacuum ► Temperature range: RT to 1600 C ► Flexible measurement, fully automatic ► Integrated software for analysis
PRODUCER:
Netzsch, Germany
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Automatic liquid He plant Cryomech LHeP18
CATALOG NAME:
DESCRIPTION:
- Liquid helium plant with helium recovery system; - 18 l of liquid helium per 24 h.
PRODUCER:
Cryomech Inc.
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Mossbauer spectrometers with accessories, including CEMS
CATALOG NAME:
DESCRIPTION:
• Conversion Electron Mossbauer Spectroscopy for surface analysis • Possibility to apply external fields • Ovens for temperature dependent measurements • 57Co (Rh matrix) source • Measurements both in perpendicular geometry (with the gamma radiation perpendicular to the sample plane) and at different orientations • Home made gas flow proportional counter • Spectrometer working with sinusoidal waveform • Depth selectivity by Monte-Carlo method
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Equipment for ionic thinning (TEM sample preparation)
CATALOG NAME:
Gatan PIPS
DESCRIPTION:
The PIPS™ ion mill is a user-friendly, tabletop Precision Ion Polisher System designed to produce high quality, TEM specimens with large electron transparent areas. The PIPS™ incorporates patented Whisperlok® stage, 2 unique penning ion guns with 10° to -10° milling angles, variable energy milling (down to 100eV), liquid nitrogen specimen cooling and an oil-free vacuum system for ultra-clean specimen processing.
PRODUCER:
Gatan Inc., USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (914.3 kb)
Autoclave for high pressure
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Various small equipment for electrical characterization (multimeters, electrometers, RLC bridges, etc.)
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Integrated systems for deposition of Langmuir-Blodget films
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
X-band EPR spectrometer EMXplus
CATALOG NAME:
DESCRIPTION:
- CW X-band EPR spectrometer Specifications: - Frequency range: 9.2 – 9.9 GHz; - Temperature range: 90 K - 500 K; - Magnetic field range: 0.05 T - 1.8 T; - Sensitivity: 2.5 x 10^9 spins/Gauss.
PRODUCER:
BRUKER BIOSPIN GMBH
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Portable EPR spectrometer CMS 8400
CATALOG NAME:
DESCRIPTION:
- Compact - portable cw X-band EPR spectrometer Specifications: - Frequency range: 9.1 – 9.6 GHz; - Temperature range: 85 K - 473 K; - Magnetic field range: 0.01 T - 0.65 T; - Sensitivity: 8 x 10^13 spins/T.
PRODUCER:
ADANI
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spectrophotometer SPECORD 250 Plus
CATALOG NAME:
DESCRIPTION:
- Double beam spectrophotometer; - Spectral range: 190 – 1100 nm; - Diffuse reflectance accessory with integrating sphere.
PRODUCER:
Analytic Jena
PRODUCTION YEAR:
2011
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum deposition system- (Spectros from Kurt J. Lesker –UK) coupled with glove-box (Labstar Model from MBraun-Germany)
CATALOG NAME:
DESCRIPTION:
Characterstics: 1. Film thickness uniformity for both metals and organics better than +/-5% across the 100 mm square substrate; 2. host/dopant ratio control up to 100-1 with an accuracy of 0.01nm/sec. Utilization for preparation of: 1. Pure and doped organic thin films; 2. Metallic thin films; 3. Organic heterostructures. Applications: Organic solar cells; OLED; organic TFT; organic sensors.
PRODUCER:
Spectros from Kurt J. Lesker –UK; Labstar Model from MBraun-Germany
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Langmuir-Blodgett instrument KSV 2000 System 2 (From KSV Instruments (-Finland)
CATALOG NAME:
DESCRIPTION:
Characteristics: Film balance measuring range: 0-250 mN/m; Film balance resolution: N/m; Programmable compression speed: 0.01-800mm/min; Deposition speed: 0.1-85 mm/min or 0.2-170 mm/min; PH control and subphase thermostatation by external bath 0-200 oC . Utilization: for the deposition of organic and biological LB films and multilayer with controlled thickness and composition on solid substrates. Applications: non-linear optics, nano-photonics, organic conductors and magnets
PRODUCER:
KSV Instruments
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Dozimetric system TLD 3500
CATALOG NAME:
DESCRIPTION:
DESCRIPTION: Used for the study of the radiation induced defects in various solid materials and related applications: geological dating, authentification, retrospective dosimetry, detection of irradiated foodstuff .The mineral samples (especially silicates) are extracted by using complex physico-chemical procedures. Correlation with calibrated irradiation sources allows determination of the irradiation dose or geological dating.
PRODUCER:
Harshaw
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.21 kb)
Optical microspectroscopy equipment
CATALOG NAME:
DESCRIPTION:
Used for the optical imaging and optical spectroscopy characterization of various luminescent objects and microstructures.
PRODUCER:
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.2 kb)
Gas Mixing System with accessories
CATALOG NAME:
1315-5
DESCRIPTION:
The flow system is completely computer controlled, has 8 gas flow channels and can be operated in linear/switch mode. Every channel consists of a mass flow controller, a vaporizer, two valves and can be operated with high purity gases from bottles or with liquid’s vapors. The simulated infield atmospheres obtained by properly adjusting the mixing gases with relative humidity (traceable by Testo 625 hygrometer) up streaming the sensor’s chamber. The maxim total flow is 200 sccm, accurately checked by Digital debitmeter Alltech. The computer controls the gas dozing through the system from ppb to ppm and data acquisition via D/A plug-in card (PCL 727) and A/D-card (PCL 812), in real-time. An additional USB-IEEE bus interface card is used for communication with Keithley equipment.
PRODUCER:
UE
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.37 kb)
Keithely 6517 Electrometer
CATALOG NAME:
1315-5
DESCRIPTION:
Low noise high precision high resistance meter used especially for evaluation the electrical resistance changes of the sensors being highly resistive. The device has low current scanner card which allows measuring up to 9 sensors simultaneously.
PRODUCER:
USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.27 kb)
Mc-Allister KP-6500 Kelvin Probe
CATALOG NAME:
1315-5
DESCRIPTION:
The Kelvin probe is based on vibrating capacitor principle, where one plate is considered to be the KP-metallic tip and the other one the sensitive surface layer. When the metallic tip is in electrical contact with the sensitive layer, a Contact Potential Difference (CPD) is established being equal with the work function differences between the tip and the sample. A backing potential is applied and the circuit is balanced (null-condition). When the surrounding atmospheric conditions are changing the circuit is un-balanced and the relative changes in the work function of the sample are recorded (e.g. the metallic tip is inert to the gases).
PRODUCER:
USA
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.35 kb)
Innova 1314 photoacoustic gas analyzer
CATALOG NAME:
1315-5
DESCRIPTION:
Used for evaluation of the on-line catalytic activity of substrate, electrodes, and sensitive materials. By measuring the up-stream and down-stream gas concentrations the exact amount of gas conversion (decomposition) can be evaluated for the each sensor component separately.
PRODUCER:
USA
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.27 kb)
Pyrometer IN 5-L plus
CATALOG NAME:
1315-5
DESCRIPTION:
Used for determining the Temperature = f (voltage) curve for various types of heater provided sensors.
PRODUCER:
USA
PRODUCTION YEAR:
2013
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.23 kb)
Thermal properties measurement system - TG/DTA/DSC Thermogravimeter
CATALOG NAME:
DESCRIPTION:
• Temperature range: 20 oC – 1750 oC • Crucible volume: 30-100 μl • medium: air; inert gas; vacuum: 10-2 torr • Scanning rate: 0.01-100 oC/min • The different measurement modules (DTA, DSC, TGA) can be adapted interchangeably around the same structure • Determination of onset, peak, inflection and end temperatures • Transformation enthalpies: analysis of peak areas • Evaluation of crystallization, glass transition analysis
PRODUCER:
Setaram
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
X-ray diffractometer in powder setting
CATALOG NAME:
D8-ADVANCE
DESCRIPTION:
Short description of apparatus: The goniometer is configured in Bragg-Brentano parafocusing geometry, with vertical goniometer. The diffractometer is equipped with a ceramic, copper target X-ray tube. A molybdenum target tube is also available, if high scattering vector range measurement is needed. Two detectors are available: a NaI(Tl) scintillation counter for conventional measurements, and a linear detector (LynxEye-type) with an angular window of 2°, providing a collection rate about 100 times higher than that of the scintillation counter, designed for high speed, quality measurements. A temperature chamber MRI TC-Wide Range for in situ measurements between -180°C and 450°C. Analyses: Qualitative and quantitative phase analyses on polycrystals. Deeper insight into the atomic structure by precise determination of the lattice constants, average crystallite size, Rietveld structure refinement, preferred orientation, etc.
PRODUCER:
BRUKER-AXS Germany
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
PCC-2 Photocatalysis Evaluation Checker
CATALOG NAME:
PCC-2 Photocatalysis evaluation checker
DESCRIPTION:
The PCC-2 checker measures the changes in absorbance, as a result of decomposition by photocatalysis, of a pigment coated on the tested material, allowing the degree of activity to be determined and evaluated. It uses a light source whose measurement wavelengh is fixed at 660 nm to detect the decomposition of an organic pigment (Methylene Blue) coated on the material to be evaluated (ex TiO2 surface). From a connected PC, on can choose UV or visible light irradiation, during photocatalytic tests. This checker is an upgraded tool that is essential for the research of deposition techniques, setting up of production process, material control and quality.
PRODUCER:
ULVAC –Riko, Inc. 1-9-19 Hakusan, Midori-ku, 226-006 Yokohama, Japan
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.04 kb)
Multi-target RF- and DC-magnetron sputtering deposition system for biocompatible coatings
CATALOG NAME:
UVN-75R1
DESCRIPTION:
Sputtering coating plant dedicated to the implant coating fabrication, equipped with two magnetron large area (diam. 4 inches) guns, a substrate clean-up position by glow discharge, in situ substrate heating and biasing facilities, and planetary rotation of the substrate.
PRODUCER:
VACMA
PRODUCTION YEAR:
1972
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Pull-out tensile adhesion testers
CATALOG NAME:
Models: GM01/6.3kN & PAThandy/1kN manual tensile pull testers
DESCRIPTION:
Manual hydraulic tensile adhesion testers dedicated to the measure of bonding strength of thin films, coatings, varnishes, and paints. The equipments and method comply with ISO 4624, ASTM D 4541, EN 1542 and ASTM C633 standards.
PRODUCER:
DFD Instruments
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Multiview 4000 SNOM/SPM System (NANONICS)
CATALOG NAME:
DESCRIPTION:
For optical characterization of organic, biological and inorganic samples combining Near Field Optical Microscopy with Scanning Probe Microscopy offering simultaneously optical and topographical information with a minimal preparation of the sample; Main technical characteristics: Dual Optical Microscope working in up-right and inverted mode; Confocal Microscopy facilities; NanoFountainPen for writing and chemical delivery and removing at the nanometer. Imaging resolution for NSOM: 50 nm; Scanner resolution: <0.05 nm (Z) and <0.15 nm (XY). Fields of utilisation: material science, nanotechnology (nano-photonics and nano-optics), biology, medicine (detection of the most minuscule surface structures of transparent and opaque samples).
PRODUCER:
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spin-coater deposition equipment Chemat Technology KW-4 A
CATALOG NAME:
DESCRIPTION:
Utilization: to coat substrate with diameter range from 40-60 mm. Applications: material science, nanotechnology Characteristics: Oil-less diaphragm vacuum pump, Dispenser and, 1.5 and 2 inch chucks; Dual speed controls, continuous speed adjustement Individual timers.
PRODUCER:
Sigma-Aldrich (USA)
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum evaporation system for organic thin films deposition
CATALOG NAME:
DESCRIPTION:
Utilization: for organic thin films deposition. Applications: electronics, optoelectronics, photovoltaic cells and organic sensors. Characteristics: -Alcatel turbo molecular pump; -pressure <1.5x10-5 mbarr; -the themperatute in the deposition chamber is monitored by a thermocouple and a Keithley 2000 Multimeter; -equiped with a Deposition Controller - Sigma Instruments SQC-330;
PRODUCER:
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Experimental set-up for I-V and photoconduction measurements
CATALOG NAME:
DESCRIPTION:
Utilization: Plotting the I-V characteristics and the current-wavelength dependence in different heterostructures. Aplications: material characterization for organic electronics and optoelectronics. Comprise: 1. Chopper (Stanford Research System, Model SR 540 chopper controller); 2. Monochromator System (Oriel Cornerstone, Model 130 1/8 m) with computer interfaces and 5 diffraction gratings (spectral range: 180-650 nm; 200-1600 nm; 1100-5000 nm; 4.5-20 m); 3. Lock-in nanovoltmeter 232 B; 4. Picoammeter Keithley 6487; 5. Multimeter Keithley 2000 with IEEE 488 6 interface. 6. Sample fixation system and uses perpendicular contact geometry (in 2 or 4 points).
PRODUCER:
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FT Raman spectrophotometer RFS 100/S
CATALOG NAME:
DESCRIPTION:
Excitation source: YAG:Nd laser ( 1064 nm), power 500 mW, horizontally polarized (H), resolution 1 cm-1, spectral range 50-3600 cm-1 (Stokes shift), -100…-2000 cm-1 (anti-Stokes shift), backscattering measuring geometry.
PRODUCER:
Bruker
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FTIR spectrophotometer, Vertex 70 model
CATALOG NAME:
DESCRIPTION:
This spectrophotometer is accessorized with an ATR device. IR spectra can be recorded in the standard spectral range: 370 ….7500 cm-1 and in far IR range: 50 ….680 cm-1 with a resolution of 2 cm-1.
PRODUCER:
Bruker
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV-VIS-NIR spectrophotometer, model Lambda 950
CATALOG NAME:
DESCRIPTION:
Equipment is endowed with tungsten and deuterium lamps as excitation sources and with an integrating sphere and a universal reflectance accessory as accessories. The absorption spectra can be recorded in the spectral range 175-3300 nm with a resolution of 0.05 nm in UV-VIS spectral range and of 0.2 nm in NIR range.
PRODUCER:
Perkin Elmer
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fluorolog-3 spectrophotometer, model FL3-221- cu accesoriu
CATALOG NAME:
DESCRIPTION:
This equipment has an 450 W Xe lamp as excitation source for VIS range and an emission signal detector at room temperature R928P side-on photomultiplier tube (180-850 nm nm). Performances of this equipment are: i) excitation range 240-600 nm, and emission range 290-850 nm. For photoluminescence (PL) decay measurements, pulsed laser diodes at 440 nm; 375 nm and UV LED for 280 nm are available for option of TCSPC LIFETIME in order to assess PL lifetime in the range 200ps-100fs. NIR PL studies can be performed with the NIR extension, which has an InGaAs detector. Sistemul de vid inaintat cu pompa turbomoleculara(model EBT 63 F, firma: EBARA Precision Machinery Europe- GmbH) si pompa de vid preliminara uscata(model ISP 90-SV Anest Ywata)- Anul: 2018
PRODUCER:
Horiba Jobin Yvon
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Origaflex multi- channels potentiostat/galvanostat
CATALOG NAME:
DESCRIPTION:
This equipment has three different power channels (500 mA, 1 A and 5 A). The applied voltage is 15 V. Current ranges 5nA to 500 mA and 50µA to 5A. The measured current is from 50 µA to 5A with a best resolution of 1.5 nA. For Li rechargeable batteries, a M-Brawn glove box is available, too.
PRODUCER:
OrigaLys
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Metallic, inorganic and organic films by vaccum deposition
CATALOG NAME:
DESCRIPTION:
Operating in vacuum of 10 -6 bar and bar with two vacuum evaporation nacelles and endowed with a thickness measurement system of deposited layers.
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Photoconductivity setup
CATALOG NAME:
DESCRIPTION:
This setup has as radiation sources a 300 W Xenon arc lamp (Oriel) and a 100 W tungsten lamp (Narva), two monochromators: Cornerstone 130 (Oriel Instruments) and H20 UV (Jobin Yvon), a photoconductivity cell (in which sample is mounted and irradiated): cryostat VPF-100 (Janis) with cryogenic temperature controller model 325 (Lake Shore); an oil-free turbo pump station TS-75-D (Janis) for pumping into cryostat vacuum space, a regulated DC power supply: GPR-30H10D (300V/1A Gw Instek) and instruments for signal measurements: DMM 4050 digital multi meter (Tektronix), a Cary 401 electrometer (Varian) and a picoammeter model 6485 (Keithley).
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Mechanical workshop
CATALOG NAME:
DESCRIPTION:
The mechanical workshop has several tools for working metals, plastic, graphite, ceramics. This allows execution of small mechanical components for research equipments. Two engineers, one specialized in mechanical design and execution, the other specialized in electronic design and execution, and two skilled technicians can help with execution of mechanical components and small electronic boards.
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Surface Area and Porosimetry Analyzer ASAP 2020 (Micromeritics)
CATALOG NAME:
DESCRIPTION:
The Analyzer performs the characterization of micro and nanoporous materials with high resolution and accuracy. It can be used for analyizing a wide variety of adsorptives including the evaluation of hydrogen, methane or carbon dioxide storage capacity of materials.
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Rapid thermal processing system AnnealSys AS-MICRO
CATALOG NAME:
DESCRIPTION:
- Low cost 2-inch Rapid Thermal Processing system for research and development applications. - Quartz tube process chamber with stainless steel flanges - Extended temperatures range: • Room temepratures to 1250 oC • Ramp rates up to 300 oC/s on 2 inch silicon wafer - Fast digital PID controller with full PC control for setting the parameters • Extremely accurate and stable temperature control (± 1oC) - N type thermocouple and optional optical pyrometer • N type sheated thermocouple for long lifetime on the temperature control range • Pyrometer for high temperatures processes (temperature range 700 oC to 1250 oC) - Standard vacuum and gas mixing capability (optional high vacuum capability) • Standard configuration with vacuum capability, vacuum valve and vacuum gauge • One purge gas line and up to 4 procceses gas lines with digital mass flow controllers • Excellent control of the process atmosphere - Robust control system and multi user software • PC + PLC configuration with Ethernet comunication: no risk in case of PC failure • Same software for the control of all Annealsys systems. Easy automatic software upgrade • Each user can have a personal folder with his data • Enhanced dignostic mode
PRODUCER:
AnnealSys
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Horizontal Split Tube Furnace HZS (three zone)
CATALOG NAME:
DESCRIPTION:
- 1200°C maximum operating temperature; - Heated lengths: 3-zone 450mm; - Accepts work tubes with outer diameters up to 60 mm; - Sophisticated digital controllers 3216P1, multi-segment programmers; - Over-temperature protection; - Work tube package for vacuum atmospheres 60 OD 50 ID x 900mm; - Quartz tube process chamber with stainless steel flanges
PRODUCER:
CARBOLITE Gero Limited
PRODUCTION YEAR:
2017
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Materials characterization by photoluminescence spectroscopy
CATALOG NAME:
DESCRIPTION:
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spectrophotometer for luminescent phosphors characterization: fluorescence and quantum yield (QY), diffuse reflectance and colorimetric parameters (CIE)
CATALOG NAME:
DESCRIPTION:
The equipment is composed by a fluorescence spectrophotometer coupled with an integrating sphere (6 inch diameter) by using optical fibers. It can be used for complete characterization of solid (powders) or liquid phosphors: photoluminescence, diffuse reflectance, quantum yield (QY) and colorimetric analysis (chromatic parameters CIE)
PRODUCER:
HORIBA Jobin-Yvon
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (10.48 kb)
Infrared spectrometer
CATALOG NAME:
DESCRIPTION:
FTIR spectrophotometer coupled with an infrared optical microscope, Cary 600 from Agilent Technologies, which has: i) for FTIR spectrophotometer a Michelson interferometer with dynamic alignment and potassium bromide beamspliter (KBr), spectral range 350-9000 cm- 1 and the resolution <0.06 cm-1; ii) in the case of the microscope, a mercury-cadmium-tellurium detector, standard binocular head with minimum 10x eyepiece and 15x minimum microscope objective, built-in video camera, German ATR crystal, IR polarizers, automatic test mass and motorized microscope aperture.
PRODUCER:
Agilent Technologies
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Complex System for Electrical, Photoelectrical, Memory, Hall and Magnetoresistance Characterization
CATALOG NAME:
DESCRIPTION:
Janis cryostat CGS-450 (10 – 500 K); Keithley electrometer 6517A (1 fA – 20 mA, 10 μV – 200 V, 50 Ω – 1016 Ω) with internal voltage source (0 ÷ ± 1000 V); Source measurement unit Keithley 2612 A (100 nA – 1,5 A in DC current with 2 pA resolution and 100 nA ÷ 10 A in pulsed regime with 2 pA resolution; 200 mV÷ 200 V with 5 μV resolution); Voltage source Agilent E3631A (6 V, ± 25 V); RLC bridge Agilent E4980A with internal voltage source (20 Hz – 2 MHz; ± 42 V voltage source); Rigol oscilloscope DS2102A (2 channels; 100 MHz; 2 GSa/s; 14 Mpts memory); Keysight signal generator 33500B (20 MHz; 10 Vpp; pulse generator of 2.9 ns); Keithley resistivity measurements unit 8009 (volume resistivities up to 1018 Ωcm and surface resistivities up to 1017 Ω/square); Newport monochromator MS257™ (250 –3000 nm); Light source (Xe lamps, 450 si 1000 W); Stanford SR 540 light chopper (40 – 4000 Hz); double Stanford lock-in amplifier SR 830 (1mHz – 102,4 kHz; sensitivity 2nV – 1 V); Temperature controller LakeShore 331; Janis magnetic cryostate (4K – 300K); LakeShore electromagnet EM4-HVA (2,5 T) with dedicate power source 642 (0 -70A) and temperature controller LakeShore 331S; Closed circuit cooling system Neslab Thermoflex 2500 (2200 W, 5 – 40oC) Voltage source Agilent E3631A (0 ± 25 V, 5 A); Voltage source Agilent E3644A (0 ± 20 V, 8 A); Agilent 34401A multimeter; Vacuum equipment (10-6 torr); LabView 8.5 measurements software.
PRODUCER:
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spectroradiometer CS 2000
CATALOG NAME:
Spectroradiometer CS 2000
DESCRIPTION:
This polychromatortype spectroradiometer has the ability to measure 100,000:1 contrasts. Featuring premiere top level capacity, the CS-2000 spectroradiometer is designed to pick-up incredibly low luminance ranges that reach 0.003 cd/m2. The CS-2000 records highly accurate measurements. This spectroradiometer’s signal processing technologies and optical design give you accurate measurements of luminance and chromaticity levels, including extremely low levels. The instrument calculates measurements in only 5 seconds. The spectroradiometer measurement calculation abilities free you of the need to work with electrical and mechanical noise elements. Enjoy stable measurements displayed across the CS-2000 screen. There’s a capability to use LCDs to display readings on this spectroradiometer with a low 2% polarization error. Choose between 1°, .2°, or .1° optimum angle that are compatible with used application. It’s possible to work with the instrument in a variety of work environments as the instrument has a temperature range that extends from 5° to 35°C
PRODUCER:
Konica Minolta
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
USB spectrometer 2000
CATALOG NAME:
USB spectrometer 2000
DESCRIPTION:
Modular USB spectrometers are versatile, general-purpose UV-Vis-NIR spectrometers for absorption, transmission, reflectance, emission, color and other applications. Their compact size, robust optoelectronics and easy modularity make them the most popular spectrometers in the world, supporting thousands of applications, from research and life sciences to education and materials identification.
PRODUCER:
Ocean Optics
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Integrating Spheres
CATALOG NAME:
Integrating Sphere with SM05PD1BÂ Si Detector (350 to 1100 nm) and 3 or 4 Ports
DESCRIPTION:
The IS200 Integrating Sphere is a general purpose integrating sphere enabling high sensitivity measurements of optical signals. An Integrating Sphere evenly spreads the incoming light by multiple reflections over the entire sphere surface. This makes it the ideal instrument for many applications such as laser power, flux, reflectance and radiance measurements. The Input and Output Ports can be equipped with fiber adapters or closed with the coated Port Plugs (included); the Detector Port is recessed to avoid direct light exposure from the incidental light to the active area of the photodiode. The sphere is manufactured from PTFE based bulk material that has high reflectivity in the 250 - 2500 nm wavelength range (see /Specs/Â tab for details) and is resistant to heat, humidity, and high levels of radiation. This reflective surface provides a specific roughness and diffusive reflection properties and should not be cleaned using solvents, as this could damage the inner surface. We only recommend using compresed air for cleaning the inner surface of the integrating spheres. The sphere is compatible with Thorlabs' SM05 (0.535"-40) thread standard as well as our 30 mm cage systems, thereby enabling easy integration into existing setups.
PRODUCER:
Thorlabs
PRODUCTION YEAR:
2016
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Nanosecond Pulsed Laser Systems
CATALOG NAME:
Nanosecond Pulsed Laser Systems NPL41B
DESCRIPTION:
Thorlabs' Nanosecond Pulsed Laser Diode Systems are designed to provide a convenient, turn-key source of nanosecond pulse trains at repetition frequencies up to 10Â MHz. These compact instruments consist of a laser head, an external +15Â V power supply with location-specific plug, and two ECM225 mounting clamps. The drive electronics and temperature stabilization circuits for the laser diode are all integrated into the laser head, as are safety interlocks. A safety shutter can be rotated to cover the optical output port, as shown in the images below. The maximum peak pulse optical output powers vary from 13Â mW to 1600Â mW, depending on Item #, as specified in the table to the right.
PRODUCER:
Thorlabs
PRODUCTION YEAR:
2019
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Surftest SJ-210- Series 178-Portable Surface Roughness Tester
CATALOG NAME:
Surftest SJ-210- Series 178-Portable Surface Roughness Tester
DESCRIPTION:
*The 2.4-inch color graphic LCD provides excellent readability and an intuitive display that is easy to negotiate. The LCD also includes a backlight for improved visibility in dark environments. The Surftest SJ-210 can be operated easily using the buttons on the front of the unit and under the sliding cover. Up to 10 measurement conditions and one measured profile can be stored in the internal memory. An optional memory card can be used as an extended memory to store large quantities of measured profiles and conditions. Access to each feature can be password-protected, which prevents unintended operations and allows you to protect your settings. The display interface supports 16 languages, which can be freely switched. An alarm warns you when the cumulative measurement distance exceeds a preset limit.
PRODUCER:
Mitutoyo
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FR-pOrtable
CATALOG NAME:
FR-pOrtable
DESCRIPTION:
FR-pOrtable is a unique USB-powered solution for accurate & precise non-destructive characterization of transparent and semi-transparent single films or stack of films. FR-pOrtable can perform reflectance & transmittance measurements in the 370-1020nm spectral range. The compact design of FR-pOrtable, guarantees highly accurate and repeatabley of measurements. FR-pOrtable, can be either mounted on the supplied stage or can be easily transformed to a handheld thickness measurement tool to be placed over the area under characterization. This way, FR-pOrtable is the only optical characterization tool for in-field applications. Reflectance, Transmittance, Absorption and Color parameters can be measured.
PRODUCER:
ThetaMetrisis
PRODUCTION YEAR:
2017
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
High-resolution X-ray diffractometer Rigaku SmartLab
CATALOG NAME:
Rigaku SmartLab 3kW
DESCRIPTION:
SmartLab is a highly versatile XRD equipment for state of the art structure analyses of thin films, nanomaterials, powders and even liquids. In addition to the common thin film and powder analyses, using our supplemental accessories we can perform the followings: pole figure measurement, in-plane diffraction, x-y mapping down to 100 µm spatial resolution, in-situ high temperature measurements up to 1100°C.
PRODUCER:
Rigaku, Japon
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
JASCO FTIR spectroscopy platform (near-mid-far IR) - spectral range 12000 - 30 cm-1
CATALOG NAME:
JASCO 6600 NIR + JASCO 6800 FV-BB
DESCRIPTION:
Fourier transform infrared spectrometry platform able to access an extended (near-mid-far IR domain) spectral range of 12000 - 30 cm–1 (DRIFT, ATR - diamond, integrating sphere with InGaAs detector, conventional (incidence angle 15 deg.) and VW specular reflection modes are available).
PRODUCER:
JASCO, Inc.
PRODUCTION YEAR:
2020
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
100.001 € – 500.000 €
DATA SHEET:
Robocasting 3D printing system
CATALOG NAME:
Nordson EFD (EV series) equipped with Ultimus V high-precision dispensing system
DESCRIPTION:
The Nordson 3-Axis EV Series Automated Fluid Dispensing tabletop Robot equipped with the Ultimus™ V high precision air-powered fluid dispenser delivers facile automation for precise fluid/paste extrusion and deposition, while the proprietary DispenseMotion™ dispensing software and the simple vision pencil camera, makes it easy to setup and program complex applications.
PRODUCER:
Nordson Corporation
PRODUCTION YEAR:
2020
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
10.001 € – 50.000 €
DATA SHEET:
Phone:
+40-(0)21-2418100
Fax:
Atomistilor
,
405A
,
Magurele
077125
,
Ilfov
Romania
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