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Research & Development Centre for Materials, Electronic, and Optoelectronic Devices (MDEO)
University of Bucharest
Short link:
https://eeris.eu/
ERIF-2000-000G-1459
605
Visits
The Research & Development Center for Materials, Electronic, and Optoelectronic Devices is focused on the fabrication and complete characterization of 2D-architectures, nanostructures, nanomaterials, and electronic and optoelectronic devices. We offer a great variety of fabrication methods, including thermal evaporation, magnetron sputtering, and electrochemical deposition, together with many characterization techniques, such as X-ray diffraction, electron microscopy, atomic force microscopy, an...
Stefan
ANTOHE
santohe@solid.fizica.unibuc.ro
Professor
SCIENTIFIC TEAM
7
Stefan ANTOHE
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Vlad-Andrei ANTOHE
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Sorina IFTIMIE
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Lucian ION
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Ana-Maria PANAITESCU
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Adrian RADU
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Ana-Maria RADUTA
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Micro and Nanotechnology Facilities
RI Domain of activity
Materials Synthesis or Testing Facilities
RI Domain of activity
RI Category
IOSIN
Type Of RI:
Distributed RI
RI Life Cycle Status:
Active RI
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
UV-Vis-NIR measurements
SERVICE DESCRIPTION:
Optical characterization (absorption spectroscopy, transmission spectroscopy, reflectance spectroscopy) of organic and inorganic thin films and solutions in the spectral domain of 200 nm - 3300 nm. We are using a Perkin Elmer Lambda 750 equipment, operating at room temperature.
SERVICE PERSONS:
Sorina IFTIMIE
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Ana-Maria RADUTA
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Atomic Force Microscopy measurements
SERVICE DESCRIPTION:
Morphological characterization of organic and inorganic materials in contact and non-contact mode. We are using an A.P.E Research machine, operating at room temperature, with STM (Scanning Tunneling Microscopy) and PFM (Piezoelectric Force Microscopy) capabilities.
SERVICE PERSONS:
Vlad-Andrei ANTOHE
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Ana-Maria RADUTA
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Ana-Maria PANAITESCU
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van der Pauw measurements
SERVICE DESCRIPTION:
Electrical characterization of inorganic thin films in the temperature range of 300 K - 10 K.
SERVICE PERSONS:
Adrian RADU
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Stefan ANTOHE
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Solar Simulator measurements
SERVICE DESCRIPTION:
Current-voltage curves drawn in AM 0 and AM 1.5 conditions, under ambient atmosphere.
SERVICE PERSONS:
Adrian RADU
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Stefan ANTOHE
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XRD and XRR investigations
SERVICE DESCRIPTION:
Structural investigations of inorganic, organic and composite materials.
SERVICE PERSONS:
Lucian ION
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Electrochemistry deposition
SERVICE DESCRIPTION:
We offer services for electrochemical deposition for thin films and 2D-nanostructures; for thin films, we have expertise in inorganic materials and for 2D-nanostructures - inorganic materials and metals.
SERVICE PERSONS:
Vlad-Andrei ANTOHE
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Research Equipment
scanning electron microscope
CATALOG NAME:
TESCAN VEGA XMU
DESCRIPTION:
scanning electron microscope with EBL module and control of the gas pressure in the chamber.
PRODUCER:
TESCAN Brno s.r.o.
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
03/06/2008
PRICE RANGE (at the time of purchase)
100.001 € – 500.000 €
DATA SHEET:
X-ray diffractometer Bruker D8
CATALOG NAME:
Bruker D8
DESCRIPTION:
High Resolution X-ray Diffractometer Bruker D8 Discover for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, q/2q measurements and structural phase identification.
PRODUCER:
Bruker Corporation
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
10/07/2008
PRICE RANGE (at the time of purchase)
100.001 € – 500.000 €
DATA SHEET:
atomic force microscope
CATALOG NAME:
DESCRIPTION:
Atomic Force Microscope able to operate in the following modes: STM, C-AFM, M-AFM.
PRODUCER:
A.P.E. Research
PRODUCTION YEAR:
2007
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
thin films deposition system
CATALOG NAME:
TECTRA
DESCRIPTION:
TECTRA complex system containing the DC and RF Magnetron-Sputtering, E-beam and Thermal Vacuum Evaporation deposition techniques. The thickness of the grown thin films is done in-situ with a Quartz resonator based system.
PRODUCER:
TECTRA GmbH
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
spectrometer UV-Vis
CATALOG NAME:
Perkin Elmer Lambda 35
DESCRIPTION:
190 – 1100 nm wavelength, equipped with integrating sphere, specular reflectance accessories, operating in transmission, reflection and absorption modes.
PRODUCER:
Perkin Elmer
PRODUCTION YEAR:
2006
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
thin films deposition system by thermal vacuum evaporation
CATALOG NAME:
FAN 4362
DESCRIPTION:
deposition system for organic thin films by thermal vacuum evaporation
PRODUCER:
FAN Romania
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
thin films deposition system by thermal vacuum evaporation
CATALOG NAME:
PP601
DESCRIPTION:
deposition system for inorganic thin films by thermal vacuum evaporation
PRODUCER:
LP
PRODUCTION YEAR:
1980
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
setup for low temperature electrical characterization of materials
CATALOG NAME:
SHI-4ST-1
DESCRIPTION:
System for electrical characterization: temperature dependent resistivity and Hall effect, magnetoresistance; temperature range 2,6-325 K.
PRODUCER:
Janis Research Company
PRODUCTION YEAR:
2005
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
setup for low temperature electrical and optical characterization of materials
CATALOG NAME:
Janis 22
DESCRIPTION:
8 – 325 K range, with optical access to the samples through 4 quartz windows, used for electrical and optical material characterization
PRODUCER:
Janis Research Company
PRODUCTION YEAR:
1998
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
HPC Computing Cluster
CATALOG NAME:
DESCRIPTION:
computing cluster for modeling the electronic structure of materials, 52 nodes (408 cores), 768 GB RAM
PRODUCER:
PRODUCTION YEAR:
2014
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
system for photovoltaic characterization
CATALOG NAME:
DESCRIPTION:
Experimental set-up for photovoltaic characterization, controlled by PC, including a Newport Oriel AM 1.5 solar simulator (for research, up to 5 cm^2 area)
PRODUCER:
Newport Oriel
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
system for electrochemical deposition
CATALOG NAME:
PGZ 100
DESCRIPTION:
electrochemical deposition and cyclic voltammerty
PRODUCER:
VoltaLab
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
setup for optical and optoelectronic characterization
CATALOG NAME:
DESCRIPTION:
CCD camera, Ar ion laser, monochromators controlled by PC
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
oven for annealing
CATALOG NAME:
DESCRIPTION:
Maximum temperature: 1200 Celsius degrees, capabilities of annealing in inert gases atmosphere
PRODUCER:
Nabertherm Company
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Glove-box
CATALOG NAME:
GSV0828
DESCRIPTION:
3 gloves, type: MEGA 2, LSG window, mounting plate for feedthroughs, vacuum antechamber d=400mm, automatic inertisation, flow rate meter, O2-sensor for flushing box, - H2O-sensor for flushing box
PRODUCER:
GS Glovebox Systemtechnik
PRODUCTION YEAR:
2015
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Phone:
+40 21 4575141
Fax:
+40 21 4574418
mdeo.eu
Atomistilor
,
405
,
Magurele
077125
,
Ilfov
Romania
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