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INDICO - INFRASTRUCTURE FOR CHARACTERIZATION AND DIAGNOSIS BY OPTICAL AND COMPLEMENTARY METHODS
National Institute of R&D for Optoelectronics
Short link:
https://eeris.eu/
ERIF-2000-000M-1448
541
Visits
INDICO permits the characterization of materials, components and systems with application in optoelectronics, by optical and complementary methods. The methods refer to the measurement of the specific optical parameters for optoelectonic applications (identification and characterization of the composition of some materials used in optoelectronics, measurement of the output level in optical fibers and amplifiers, laser emitted energy, laser pulse width, laser beam diameter, intensity distributio...
Madalin
Rusu
madalin@inoe.ro
Dr.Eng.
Electrical and Optical Engineering Facilities
RI Domain of activity
Materials Synthesis or Testing Facilities
RI Domain of activity
* Lasers and Fiber optics based Devices. * Optical components and Thin films characterization.
RI Domain of activity
Type Of RI:
Single sited RI
RI Life Cycle Status:
Active RI
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
Measurement of Laser Energy, Power and Pulse Width
SERVICE DESCRIPTION:
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Measurement of M2, Waist and Divergence
SERVICE DESCRIPTION:
Measurement of energetic distribution, divergence, waist, gaussian beam deviation
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OTDR and Optical Powermeter Measurements for Optical Fibers
SERVICE DESCRIPTION:
Loss vs. distance and Optical power
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Measurement of Prism Angles, Focal Lenghts and Surface Planeity
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Thin Films -Ellipsometry Characterization
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Measurement of transmission and kinetics for liquids and optical components
SERVICE DESCRIPTION:
Spectral range: 160 nm to 3300 nm Spectra with polarized light Spectral change with temperature variation
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Measurement of polarization state for optical components
SERVICE DESCRIPTION:
Muller Matrix
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Vacuum thin films deposition by RF magnetron sputtering
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Vacuum thin fims deposition by thermal evaporation
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Determination of Muller Matrix for optical components
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* Access to laboratory infrastructure and data
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* Training in optical characterization techniques
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Research Equipment
Laser energy/powermeter GENTEC model SOLO-PE
CATALOG NAME:
DESCRIPTION:
One of the most important characteristic of a laser source is its energy (for a pulsed laser) or its power (for a CW laser). Measurements can be done at high acquisition rates allowing thus an accurate determination of pulse-to-pulse energy fluctuation. All measured data are stored and processed to get statistics (average, standard deviation, RMS, maximum, minimum, peak-to-peak). Report contains also measurement uncertainty data. Laser energy can be measured using a Gentec SOLO-PE Energy/Powermeter together with the next measuring heads (QE 50 SP-MB and XLE4): Measured energy range 100 nJ – 75 J, Wavelength range 190 nm – 20 µm; Laser power can be measured using a Gentec SOLO-PE Energy/Powermeter together with the next measuring heads (PH100-Si, PH20-Ge, UP12E, UP25N and UP55N): Measured power range 600 pW - 400 W, Wavelength range 190 nm - 1650 nm,
PRODUCER:
GENTEC
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Fast photodiode Thorlabs model SV2-FC
CATALOG NAME:
DESCRIPTION:
Temporal behavior of the pulsed lasers is characterized by the pulse width (duration). Because the commercially available lasers have pulse widths of few ns, the pulse width measurement requires an ultrafast photodiode. Wavelength range: 320 – 1100 nm, Fotodioda rapida SV2-FC, Detector material : Si, Detector diameter : 0.4 mm, Bandwidth (-3 dB point): ~2 GHz, Raise and fall time: <150 ps, Dark current: <0.005nA @ 20V.
PRODUCER:
Thorlabs
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Oscilloscope Tektronix model DPO 7254
CATALOG NAME:
Tektronix model DPO
DESCRIPTION:
Temporal behavior of the pulsed lasers is characterized by the pulse width (duration). Because the commercially available lasers have pulse widths of few ns, the pulse width measurement requires a wide band oscilloscope. Rise time < 175 ps, Bandwidth > 2 Ghz, Spectral range 170 – 1100 nm, Sensitive area Ø 0.4 mm, NEP 1.5·10-15 W/√Hz, Dark current 1 pA.
PRODUCER:
Tektronix
PRODUCTION YEAR:
2014
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
10.001 € – 50.000 €
DATA SHEET:
Beam profiler with M2 option Melles-Griot BeamScope P7
CATALOG NAME:
DESCRIPTION:
A laser beam profiler provides important information characterizing the laser, as the energy (pulsed lasers) or power (CW lasers) distribution in a cross section of the laser beam, the waist of the beam, its divergence and M2 factor (that quantifies the beam quality of laser beams). It provides with 3 heads: Si (190–1100 nm), Ge (800–1800 nm) and InAs (1500–4000 nm)
PRODUCER:
Melles-Griot
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Optical Time Domain Reflectometer (OTDR) EXFO model FTB-150-QUAD-GeX (with built-in optical powermeter)
CATALOG NAME:
DESCRIPTION:
Optical Time Domain Reflectometer (OTDR) EXFO model FTB-150-QUAD-GeX (with built-in optical powermeter). Reflectometer: Wavelengths: 850 ± 20/1300 ± 20 (multimode), 1310 ± 20/1550 ± 20 (singlemode); Pulse width (ns), Linearity (dB/dB): ±0.03, Loss threshold (dB): 0.01, Loss resolution (dB): 0.001; Built-in powermeter: Calibrated wavelengths (nm): 850, 1300, 1310, 1490, 1550, 1625, 1650, Display resolution (dB): 0.01 = max to —54 dBm, 0.1 = —54 dBm to —64 dBm.
PRODUCER:
EXFO
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Goniometer Moeller-Wedel model Goniometer II-VIS
CATALOG NAME:
DESCRIPTION:
Telescope/collimator: f = 300 mm, Accuracy of angle measurement: (mean error of series measurements) < 0.6 arcsec. Spectral range: 436 - 650 nm, Accuracy of refractive index measurements (mean error of series measurements): 10-5 Alignment: visual with autocollimator
PRODUCER:
Moeller-Wedel
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Interferometer Moeller-Wedel, model Melos 530-8, Software INTOMATIK-S for fringe evaluation
CATALOG NAME:
DESCRIPTION:
Type of interferometer: Fizeau CCD Camera : 752 x 582 pixels, Laser: fiber coupled He-Ne 632.8 nm, Exit aperture: 50 mm, Measurement accuracy: l/10 (p-v) visual, l/20 (p-v) with software evaluation, Adjustment range: 530 mm, Fine adjustment range: 1 µm, Measurement range: 530 mm.
PRODUCER:
Moeller-Wedel
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Focal length measurement device Moeller-Wedel, model Melos 530-3
CATALOG NAME:
DESCRIPTION:
Range of focal lengths: 5 mm ... 500 mm (positive), -5 mm ... -580 mm (negative), 2 mm ... 530 mm (back focal lengths) Free aperture: 28 mm, Max. specimen diameter: 200 mm, Reproducibility: 0,04 % (focal lengths) or 0,03 % ... 0,2 % (back focal lengths), Measurement accuracy: 0,3%
PRODUCER:
Moeller-Wedel
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Spectroscopic Ellipsometer UVISEL
CATALOG NAME:
DESCRIPTION:
UVISEL FUV-NIR, 190 -2100 nm
PRODUCER:
Horiba Jobin Yvon
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV-VIS-NIR Lambda 1050
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Perkin Elmer
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Polarization Analyzing System
CATALOG NAME:
DESCRIPTION:
It is a free-space polarimeter, with interchangeable external sensor head, the wavelength range is 400 - 700 nm and 1000-1350nm, the dynamic range is 70 dB, the sampling rate is up to 333 samples/s and the accuracy is ±0.2 ° on the Poincare sphere.
PRODUCER:
Thorlabs
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
OSA 201C, Optical Spectrum analyzer
CATALOG NAME:
DESCRIPTION:
350 - 1100 nm
PRODUCER:
Thorlabs
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
OSA 202C, Optical Spectrum analyzer
CATALOG NAME:
DESCRIPTION:
600 - 1700 nm
PRODUCER:
Thorlabs
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
SLS 201L/M, Stabilized Tungsten Light Source
CATALOG NAME:
DESCRIPTION:
450 - 5500 nm, with SLS 202C collimation package
PRODUCER:
Thorlabs
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
I-MON 512 USB, Interrogation monitor for FBG fiber sensor systems
CATALOG NAME:
DESCRIPTION:
1510 - 1595 nm
PRODUCER:
Ibsen Photonics
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Pulse/Arbitrary Waveform Generator
CATALOG NAME:
DESCRIPTION:
Dual-Channel, 500 MHz maximum bandwidth, 20 Vpp maximum output amplitude, high fidelity output with 80 dB dynamic range
PRODUCER:
Siglent Technologies Co. LTD
PRODUCTION YEAR:
2017
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (2277.34 kb)
Power Supply PS-3003
CATALOG NAME:
DESCRIPTION:
DC Switching Power Supply with accuracy 3 digital meter. The ouput voltage can be adjusted from 0 to 30 V and the ouput current is from 0 to 3A.
PRODUCER:
PRODUCTION YEAR:
2017
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (44.51 kb)
Digital Phosphor Oscilloscope TDS3032
CATALOG NAME:
DESCRIPTION:
500 MHz, 300 MHz, and 100 MHz Bandwidths Sample Rates up to 5 GS/s 2 or 4 Channels Full VGA Color LCD on all Models Built-in Floppy Disk Drive For Easy Storage and Documentation 21 Automatic Measurements
PRODUCER:
Tektronix
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (171.35 kb)
Soldering & Reworking Station SP-1011DLR
CATALOG NAME:
DESCRIPTION:
Soldering & Reworking Station is suitable for soldering and desoldering all type of surface mounted IC and prevents any damage to the PCB or components. This tool is used in the fields of electronic research, teaching and production, especially in the repairing and reworking on the electronic appliances and communication equipments.
PRODUCER:
SOLDER
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (493.35 kb)
Laser Beam Profiler NanoScan2s
CATALOG NAME:
NanoScan 2s Pyro/9/5
DESCRIPTION:
NanoScan 2s is a PC-based instrument for the measurement and analysis of laser beam spatial irradiance profiles in accordance with the ISO standard 11146. The scan heads also measure power in accordance with ISO 13694.
PRODUCER:
Ophir optics, Israel
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Phone:
0214575757
Fax:
0214574522
Atomistilor
,
409
,
Magurele
077125
,
Ilfov
Romania
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