EERIS
Engage in the European Research Infrastructures System
Browse the registry for
technological services
equipment
infrastructures
research
innovation
Login
Sign Up
Condensed Matter Department
The National Institute of Research and Development for Electrochemistry and Condensed Matter
Short link:
https://eeris.eu/
ERIF-2000-000W-1054
890
Visits
Marinela
Miclău
marinela.miclau@gmail.com
CS II Dr.
SCIENTIFIC TEAM
6
Cornelia BANDAS
View profile
Mihaela BIRDEANU
View profile
Marinela Nicoleta MICLĂU
View profile
Paula SFÂRLOAGĂ
View profile
Daniel URSU
View profile
Alina ZAMFIR
View profile
Materials Synthesis or Testing Facilities
RI Domain of activity
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
Study of the crystalline structure by x ray diffraction; Primary training in X ray diffraction.
SERVICE DESCRIPTION:
SERVICE PERSONS:
Marinela Nicoleta MICLĂU
View profile
Daniel URSU
View profile
ACCESS THIS SERVICE
You need to be logged in to request access to this service. Click
here
to login.
If you don’t have an ERRIS account yet, please register
here
.
Scanning Electron Microscope
SERVICE DESCRIPTION:
Scanning Electron Microscopy allows the investigations of: Metallic materials; Ceramics; Polymeric materials; Composites; Powder and layers materials; Implants and prosthesis; Textiles and cellulose.
SERVICE PERSONS:
Paula SFÂRLOAGĂ
View profile
ACCESS THIS SERVICE
You need to be logged in to request access to this service. Click
here
to login.
If you don’t have an ERRIS account yet, please register
here
.
Atomic Force Microscope and Scanning Tunneling Microscope
SERVICE DESCRIPTION:
Typical Applications: thin films powders monocristals surface roughness measurements number of particles particles analysis particles diameter particles high particle volume particle surface
SERVICE PERSONS:
Mihaela BIRDEANU
View profile
ACCESS THIS SERVICE
You need to be logged in to request access to this service. Click
here
to login.
If you don’t have an ERRIS account yet, please register
here
.
Mass spectrometry analysis
SERVICE DESCRIPTION:
The mass spectrometry laboratory provides a complete structural analysis for different biological compounds with the identification of new substances and/or biomarkers present in small quantities in the sample.
SERVICE PERSONS:
Alina ZAMFIR
View profile
ACCESS THIS SERVICE
You need to be logged in to request access to this service. Click
here
to login.
If you don’t have an ERRIS account yet, please register
here
.
Photonic spectroscopy
SERVICE DESCRIPTION:
Service description: - analysis of common and secure dyes and inks; - colorimetry; - determination of dyes concentration in textiles, plastics, liquids, suspensions; - qualitative and quantitative determination of some components in food; - transparency of organic and inorganic glasses, mat or glossy, coloured or not, in the 175-3300 nm wavelength range; - efficiency of UV light absorbing coating foils on glass windows; etc.
SERVICE PERSONS:
Cornelia BANDAS
View profile
ACCESS THIS SERVICE
You need to be logged in to request access to this service. Click
here
to login.
If you don’t have an ERRIS account yet, please register
here
.
Research Equipment
X’Pert PRO MPD
CATALOG NAME:
DESCRIPTION:
X ray diffraction is a non-destructive technique which allows the achievement of precise information regarding the chemical composition and crystalline structure of natural and synthesis materials. The basic characteristic of this method is the study of the connection between x ray scattering and spatial arrangement of the atoms. If we send an x ray beam upon an atoms ensemble, their electronic clouds will interact with the incident wave, scattering it. When radiation is scattered on a given object, both elastic scattering, which takes place without losses of energy and without modification of the wave length λ is produced, and also non-elastic scattering appears. The main role is played by the elastic scattering and this is because it determines the diffraction figure, whose analysis allows establishing the place of the atoms inside the material. Diffraction on crystals can be interpreted as a “reflection” of the x rays on the crystalline network planes. The “reflection” is produced only when the waves, scattered by the parallel planes, are in phase and amplify each by each other, meaning if the half way achieved by scattering and gathered from the neighboring planes is equal to an integer n of wavelengths λ: λ=2dhkl sinθ This represents the Wulf-Bragg formula, which makes the connection between the propagation direction of the scattered beams (θ angles) and the distances between the dhkl planes in the network, n being the reflexion order. If this condition is not achieved, then due to the existence in the crystal of a high number of planes, the phase differences which make the reflexion appear on them, will lead to the total extinguish of the beams scattered under any other angles, different from that given by the Wulf-Bragg condition. X-Ray Diffraction Laboratory was founded in 2008 within the Condensed Matter Department, whose main activity is the synthesis of advanced crystalline materials.
PRODUCER:
PANalytical, Netherlands
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning Electron Microscope Inspect S
CATALOG NAME:
DESCRIPTION:
Laboratory of electronics and optics microscopy was founded in 2007 within Condensed Matter Department, department whose main activity is synthesis of crystalline advanced materials. The needs imposed by the determination of elemental composition (EDAX), topography (optical and electron microscopy) the roughness, the dimensional analysis of obtained materials, our laboratory has equipment performing the last generation Scanning Electron Microscope (SEM) Inspect S, Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM) NanosurfR EasyScann 2, Analysette 22 FRITCH. Although recently established, the laboratory is currently in certification, offering in the next period the maximum development of the specialty equipment by training the staff, attract the new partnerships and services, and not least the promotion and involvement of students in master and lab activities. Technical characteristics: Source: tungsten filament Voltage: 20 V at 30kV Resolution: 3.0 nm in high-vacuum mode and <12 nm at 30 kV in low-vacuum mode Magnification: 6x>1,000,000x Visual field: the same in high-vacuum and low-vacuum mode Focus domain: 3-99 mm Fascicle current: > 2μA Characteristics of the samples analyzed: The samples must be conductors. Nonconductor samples are coated with a thin layer of conductive metal (Au, Ag, Pt). Short description of work techniques: Scanning Electron Microscope is used for qualitative (imaging) and quantitative (EDAX- spectrometer with energy dispersive) analysis of the materials. Can be analyzed conductive and/or prepared samples by conventional methods (coated). X-ray microanalysis techniques used the radiation X generated by a sample bombed with electrons to identify the elementary constituents from sample chemical composition.
PRODUCER:
FEI Company, Netherlands
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Atomic Force Microscope and Scanning Tunneling Microscope (type Nanosurf® EasyScan 2 Advanced Research)
CATALOG NAME:
DESCRIPTION:
Short description of the technique: The atomic force microscope (AFM) and scanning tunneling microscopy (STM) allow a direct visualization of surfaces until atomic level, and obtain in this way useful informations about strucure dependence of surface in accordance with obtaining methods. Tehnical characteristics: Maximum scanning of surface : 2048x2048 points Scan image rotation: 0-3600 Stimultaneous display of data in charts types (line graph, color map, 3D view) On-line processing funcions: mean fit, polynomial fit, derived data Quick evaluation functions distance, angle, cross section Data export: BMP, ASCII, CSV, etc. Components: Atomic Force Microscope (type Nanosurf® EasyScan 2 Advanced Research AFM) The AFM scanning techniques: Contact Mode Tapping Mode Non-contact Mode AFM scan head 10μm: Maximum Scan range:10μm2 (tolerance+/- 15%) Maximum Z-range: 2μm Drive resolution XY: 0.15 nm Drive resolution Z: 0.027 nm AFM scan head 110μm: Maximum Scan range:110μm2 (tolerance+/- 10%) Maximum Z-range: 22μm Drive resolution XY: 1.17 nm Drive resolution Z: 0.34nm Scanning tunneling microscopy (type Nanosurf® EasyScan 2 Advanced Research STM) STM scan head 500nm: Maximum Scan range 500nm Maximum Z-range 200nm Drive resolution Z 3pm Drive resolution XY 7.6pm
PRODUCER:
Nanosurf® EasyScan 2
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
HCT ULTRA and QTOF Mass Spectrometers
CATALOG NAME:
DESCRIPTION:
Mass spectrometry is an analytical tool used for measuring the molecular mass of a sample; it can be coupled with high performance chromatography and chip ionization. Technical characteristics: HCT mass spectrometer (MS) The HCT MS is connected to a PC that runs the CompassTM 1.2 software which comprises the HystarTM 3.2.37 and Esquire 6.1.512 modules for controlling the instrument and recording the mass specters and total ion chromatograms. Data Analysis 3.4.179 software is used for processing all the acquired data. QTOF mass spectrometer The Q-Tof Micro MS is a hybrid quadrupole time-of-flight mass spectrometer, available with electrospray ionisation (ESI) and atmospheric pressure chemical ionisation (APcI). This type of instrument is incorporated with a high performance, research grade quadrupole mass analyser, encompassing a prefilter assembly in order to protect the main analyser from contaminating deposits, and also an orthogonal acceleration time of flight (TOF) mass spectrometer. Ions emerging from the mass analyser are detected by the microchannel plate (MCP) detector and ion counting system. A PC computer runs the MassLynx NT software system to control the instrument, to acquire and process the obtained data. The NanoMate Robot (Advion BioSciences, Norfolk, UK) can be in-laboratory coupled either with high capactity ion trap mass spectrometer (HCT MS) or with quadrupole time-of-flight MS (QTOF MS) via a specially designed mounting bracket. The robot can be controlled and manipulated by ChipSoft 8.1.0 software operating under Windows system.
PRODUCER:
Bruker Daltonics – Bremen, Germany; Waters - Manchester, UK
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Lambda 950 UV-Vis-NIR Spectrophotometer
CATALOG NAME:
DESCRIPTION:
When electromagnetic radiation in the UV-Vis-NIR wavelength range interacts with a sample, four results are possible: the radiation is absorbed, transmitted, reflected or scattered. Typically UV-Vis-NIR spectrometers are equipped to measure the transmittance or absorbance of a transparent solid or homogenous solution as a function of wavelength. However, when equipped with the proper accessories, UV-Vis-NIR instruments can measure the reflected and scattered energy from a sample. Reflected radiation can be either specular or diffuse. Our Lambda 950 UV-Vis-NIR spectrophotometer is equipped with the accessories necessary for all the above mentioned measurement types. Specifications: Double-beam, double holographic grating monochromators, computer interfaced; Measuring range: 175nm - 3300 nm; Nitrogen purging possibility of both optical and sample chambers for measurements below 185 nm; Maximum resolution: 0.05 nm (UV-Vis); 0.20 nm (NIR) ; Wavelenght accuracy : ± 0.08 nm (UV-Vis) ; ± 0.3 nm (NIR); Photometric stability: < 0.0002 A/h; Multiple functional parameters controlled by “UV-WinLab” software. Accessories: Universal Reflectance Accessory (URA) module This accessory allows absolute and relative specular reflectance measurements for different radiation incidence angles on the sample. Sample characteristics: smooth mirror-like solid surfaces Integrating sphere module: The instrument is also equipped with an integrating sphere module accessory. The sphere has a diameter of 150 mm which is internally covered with Spectralon and works in the 250 – 2500 nm wavelength range. It allows diffuse reflection and also diffuse transmission measurements on a wide range of materials. Sample characteristics: solids (minimum dimensions 8 x 8 mm, maximum dimensions 100 x 100 x 30 mm), powders, suspensions.
PRODUCER:
PerkinElmer
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Simultaneous Thermal Analysis TG-DTA
CATALOG NAME:
DESCRIPTION:
Thermogravimetric analysis (TGA) is a method of thermal analysis in which changes in physical and chemical properties of materials are measured as a function of increasing temperature (with constant heating rate) in a controlled atmosphere. TGA is commonly used to determine selected characteristics of materials that exhibit either mass loss or gain due to for example : decomposition, deshydratation, oxidation, corrosion etc. LABSYS evo is a user friendly, robust and highly powerful high temperature TGA platform for operation up to 1600 °C. At the heart of the LABSYS evo is an advanced coiled metal furnace and a top loading thermostated balance that uses the technique of a beam articulated around a torsion band. The crossing furnace is ideally designed to be efficiently coupled to a gas analyzer. Various fields of application are possible including polymers and plastics, advanced materials,pharmaceutical compounds, inorganic substances, thermodynamics, energy, etc. Specifications: Temperature range Ambient to 1600°C Isothermal temperature accuracy +/- 1°C Programmable temperature scanning rate (heating and cooling) 0.01...100°C min-1 Furnace cooling 32 min (1600°C to 50°C) TG Maximum balance capacity: 20 g Weight range: +/- 1000 mg; +/- 200 mg Weighing precision: +/- 0.01% TG Resolution: 0.2 µg, 0.02 µg Vacuum: < 10-1 mbar Evolved Gas: Simultaneous MS, FTIR couplings Power: 230 V – 50/60 Hz
PRODUCER:
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
TEGAM- Model 3550
CATALOG NAME:
DESCRIPTION:
The characterization of the dielectric / piezoelectric / ferroelectric materials is performed by evaluating the temperature and frequency dependence of the real part of the complex permittivity (ε`r) and the loss factor (tan δ). Dielectric spectroscopy is performed using an RLC-meter model TEGAM- Model 3550. The sample holder can be heated during measurements (figure on the right). - working frequency: 42 Hz - 5 MHz; - measurable parameters: L, C, R, │Z│, Y, D, Q, R, θ, G, X, B in serial or parallel mode; - working temperature: -120˚ C ..... 450˚C
PRODUCER:
TEGAM
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Multiwave 3000 Anton Parr
CATALOG NAME:
DESCRIPTION:
Multiwave 3000 is a modular microwave digestion system specially designed to greatly reduce the working time between sample collection and spectrometric analysis. The main advantages of the Multiwave 3000 system are the ease, safety and quick handling of the module. The reaction autoclaves, the rotor and the accessories are easily adapted to meet the individual requirements for the preparation of the sample in the microwave field. - 2 magnetron; - Microwave power - 1400 W; - Performance sensors for reaction control; - Cooling system; - Database for work programs; - Magnetic stirring; - Reaction autoclaves: ceramic and quartz; - Maximum working temperature: 300ºC; - Maximum working pressure: 140 bar; - Solution volume: quartz - max 80 mL; ceramic - max 100 mL; - IR temperature sensor.
PRODUCER:
ANTON PARR
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Nabertherm model R50 / 250/12
CATALOG NAME:
DESCRIPTION:
An atmosphere furnace provides the perfect environment for various procedures in many laboratories, providing the controlled temperature and atmosphere specific projects require. The controlled atmosphere is desired to complete tasks that require exact temperatures with no room for error. This is the best way to ensure the successful outcome of your project because it is sealed tightly to ensure the proper environment. Maximum temperature: Tmax 1200 ° C with quartz tube or 1400 ° C with ceramic tube Diameter of outer tube: 50 mm to 170 mm, Heated length: from 250 mm to 1000 mm Working tube: ceramic C 530 Controller: B400 / B410 Controlled atmosphere: Ar, N2, Air, O2, Ar / H2. Data Recording: USB
PRODUCER:
Nabertherm
PRODUCTION YEAR:
2018
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
High temperature burner with controlledatmosphere. GSL-1100
CATALOG NAME:
DESCRIPTION:
- The oven is fitted with a stainless steel vacuum flange with valve, manometer and quartz tube. - High precision temperature controller: heating / cooling rate programming, temperature ranges - maximum 30 digital programmable segments. - The oven is used for heat treatments (maximum working temperature 1100 oC) in the controlled atmosphere: Ar, N2, Air, O2, Ar / H2 - Temperature range: 200 0C ~ 1100 0C - Temperature accuracy: +/- 1 0C; - Heating rate: ≤10 0C / min - Maximum heating rate: ≤300C / min; - Constant temperature zone: 80 mm; - Vacuum pump; - Gas flow meter.
PRODUCER:
MTI Corporation
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Thin film deposition system
CATALOG NAME:
DESCRIPTION:
Manual printer designed to meet the requirements of solar cell research based on sensitized dye. The glass substrate can be easily mounted and positioned using the adjusting screws in the x and y direction. The printer is used for substrate sizes up to 10 cm x 20 cm.
PRODUCER:
PRODUCTION YEAR:
2016
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
K975X (Quorum Technologies Ltd)
CATALOG NAME:
DESCRIPTION:
K975X Module (Quorum Technologies Ltd) is a multifunctional device used for depositing thin metal layers by the method of thermal evaporation or cathodic spraying, respectively Carbon deposits by the method of decomposition of graphite electrodes into arc vaults. The turbomolecular pump coupled with a preliminary vacuum pump, allows to reach a high vacuum level, up to 10-5 mbar. The samples that can be inserted into the enclosure can have diameters up to 200 mm, respectively about 140 mm2 for samples with an irregular contour. The support for thermal evaporation can be a Wolfram filament, a Wolfram plate or a ceramic crucible inserted in the Wolfram filament.
PRODUCER:
Quorum Technologies Ltd
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Vacuum electrolyte filling system
CATALOG NAME:
DESCRIPTION:
The device is used to fill with electrolyte the solar cells based on sensitized dye (DSSC) and batteries under a vacuum atmosphere. The electrolyte filling device is connected to a vacuum pump that allows the vacuum required to remove the air inside the DSSC or the battery. - The vacuum inside is -1 bar - The size of the cells can be between 1 × 1 cm to 5 × 5 cm. - You can introduce the electrolytes which are prepared using different solvents, due to chemical resistance of its components. - The lower part of the device is made of Teflon - The upper part is made of glass.
PRODUCER:
PRODUCTION YEAR:
2016
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Keithley 2450-EC
CATALOG NAME:
DESCRIPTION:
The Keithley 2450-EC electrochemistry lab system brings speed, flexibility and simplicity at your fingertips thanks to the innovative graphical interface (GUI) and advanced technology. Having a capacitive touch screen allows the intuitive and easy use of the stars, the data collection and the achievement of the characteristic curves of the measurements. Potential range: -20 V ≤ E ≤ +20 V Current measurement ranges: 10 μA, 100 μA, 1 mA, 10 mA, 100 mA, 1 A Source limit (compliance): 100% of the current range selected Scan rate: from 0.1 mV / s to 3500 mV / s Potential step size during scanning: 100 μV (0.1 mV / s ≤ scan speed <35 mV / s) 1 mV (35 mV / s ≤ scan speed <350 mV / s) 10 mV (350 mV / scan speed ≤ 3500 mV / s)
PRODUCER:
Keithley
PRODUCTION YEAR:
2016
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Solar simulator
CATALOG NAME:
DESCRIPTION:
The solar simulator is equipped with a 300 W Xenon lamp, excellent for simulating sunlight. The high temperature of the xenon lamps (6050 - 6350 K) is close to the solar temperature. Spectral range is between 260 -1200 nm. Lighting field: 40 mm diam. Radiation resistance: ± 10% Irradiation: 1 sun (min.) @ 160 mm Working distance: 160 mm (recommended) Temporal stability: 1% RMS Lamp type: Xenon short arc, 300 W, without ozone, Average duration: 1000 h Input: 90 - 250 VAC, 48 - 63 Hz
PRODUCER:
LOT Quantum Design
PRODUCTION YEAR:
2014
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Ultrasonic soldering station
CATALOG NAME:
DESCRIPTION:
The Dyesol ultrasonic soldering iron is very suitable as a mechanical activation procedure for the flux-free bonding with active soldering alloys. The cavitation at the iron tip of the ultrasonic solder interrupts the oxide films that form on the molten material. This process allows the active alloys to melt and create bonds with all metals and ceramics. Ultrasound frequency: 60KHz ± 5KHz Output ultrasound oscillations: 1 - 12W, adjustable with 0.1W Heating temperature setting: 220 ° C - 500 ° C Additional temperature: 10 ° C Power supply: AC100V / 240V 50 / 60Hz 200W Dimension: 210 × 235 × 90 (mm) Approximate weight: 5 kg Oscillator (PZT): 60KHz Soldering tip: Special stainless steel) Tip diameter: Di 1.0 - 4.0 mm, adjustable with 0.5 mm Heater: High performance heater 65W
PRODUCER:
Dyesol
PRODUCTION YEAR:
2017
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Agilent E5100A
CATALOG NAME:
DESCRIPTION:
The piezoelectric constants are determined by the resonance method, using a network analyzer model Agilent E5100A (10KHz - 300MHz), equipped with a sample support Agilent 41901A (SMD Pi-network test fixture). The physical quantities that can be determined by the resonance method are: - the resonance frequency and the antir resonance frequency respectively; - inhibiting the resonant Zm; - electromechanical coupling coefficient k31 / k33 / k15 / kp; - Poisson coefficient ζ; - Young Y31 module; - speed of sound; - the mechanical quality factor Qm; - piezoelectric load constants d31 / d33 / d15; - piezoelectric voltage constants g31 / g33 / g15; - elastic constants C11 / C13 / C33 / C44 / C55 / C66 respectively S11 / S13 / S33 / S44 / S55 / S66.
PRODUCER:
Agilent
PRODUCTION YEAR:
2008
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Ferroelectric hysteresis
CATALOG NAME:
DESCRIPTION:
The characterization of piezoelectric - ferroelectric materials is achieved by studying the hysteresis cycle. This method involves determining the polarization of the material in the alternative electric field (P), depending on the intensity of the applied electric field (E). The hysteresis cycle is based on the use of the Sawyer-Thomson method, where a high voltage alternating current is applied to the study dielectric material. - maximum electrical voltage at the terminals of the sample carrier: 3 kV alternatively (sinusoidal, trapezoidal, triangular or sawtooth signal); - signal frequency: 50 Hz - 1 kHz - the sample carrier is immersed in silicone oil during the measurements; - The sample to be studied can be heated during the measurements.
PRODUCER:
PRODUCTION YEAR:
2012
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
UV Ozone Cleaner
CATALOG NAME:
DESCRIPTION:
UV ozone cleaning is a photo-sensitised oxidation process in which short-wavelength UV radiation is absorbed by organic molecules in order to dissociate them from a surface (via chemical reactions with ozone molecules). It is an excellent technique for cleansing surfaces of photo-resists, resins, residues from cleaning solvents, flux, oils, and for surface sterilization all of which can influence the properties of the surface of your sample. Unlike other cleaning techniques (e.g. oxygen plasma treatment), UV ozone cleaning does not cause significant surface damage. The UV ozone system uses a high-intensity UV light source which illuminates the target surface with light of two wavelengths, 185nm and 254nm. Molecular oxygen (O2) present within the system is dissociated by UV radiation with a wavelength less than 200 nm, resulting in two free radicals of oxygen (O•). Each of these free radicals can subsequently react with further molecular oxygen to produce ozone (O3) molecules (Figure 1). UV radiation above 200nm that is not absorbed by residual oxygen is strongly absorbed by organic chemical bonds present on the surface of the substrate. Upon absorption this causes the creation of excited states or organic radicals. These reactive organic species, when in contact with the unstable ozone molecules result in the formation of volatile species such as CO2, H2O, N2 and short chain organic compounds. These volatile compounds can easily desorb from the surface leaving it clean.
PRODUCER:
Ossila
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
High voltage power supply
CATALOG NAME:
DESCRIPTION:
The Gamma "ES" series provides a portable High Voltage Source of power for scientific and industrial applications, with power levels to 20watts and voltage levels to 100KV. The 100KV supply in this series weighs approximately 11-lbs, making it ideally suited for portable or laboratory applications. Output voltage: 0 to 60 KV Output Current: 330uA at 20 Watt 166uA at 10 Watt 85uA at 5 Watt
PRODUCER:
Ormond Beach
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Osciloscop ATTEN - Model ADS1152CML
CATALOG NAME:
DESCRIPTION:
ATTEN ADS1102CML is a portable digital storage oscilloscope with top performance and various advanced functions. It has 2 channels, 100 MHz bandwidth, sampling frequency of 1 GSa/s and 2Mpts memory depth. 1 GSa/s sampling rate and 50 GSa/s equivalent sampling rate 2 Channels 7" Color LCD 12 menu languages - English, French, German, Russian, Spanish, Simplified Chinese, Traditional Chinese, Portuguese, Japanese, Korean, Italian, Arabic Memory Depth: 2Mpts Trigger types: Edge, Pulse Width, Video, Slope, Alternative Unique digital filter function and waveform recorder function Support Pass/Fail function. Thirty two parameters Auto measure function. Save/recall types: setups, waveforms, CSV file, picture Support Multilingual On-line help system Adjustable waveform intensity and grid brightness Easyscope Software Standard Configuration Port: USB Host: Support USB flash driver save/recall function and update firmware; USB Device: Support PictBridge compatible printer and support PC remote control; RS232, Pass/ Fail output.
PRODUCER:
ATTEN
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Precision Diamond Wire Saw - Well 3242
CATALOG NAME:
DESCRIPTION:
The Precision Diamond Wire Saw Well 3242 produce smooth, sharp-edged surfaces on almost any cut material. The cutting tool employed is a stainless steel wire with diamonds embedded into the surface of the wire. It uses gravity and/or weights as the method for achieving and maintaining consistent feed rates. Also, it has a continuously variable wire speed adjustment. A slotted table enables the operator to position the sample in both axis while the sample holder rotates throughout 360 degrees for proper orientation of the proper cutting axis. It affords the operator the option of positioning the sample inside the wire loop thereby allowing a clear view for positioning and watching the cutting in process. Also, two micrometers are available, one for accurate positioning of the sample, the other for setting the depth of a slice or cut.
PRODUCER:
Walter Ebner
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Power Amplifier PHONIC MAX 860
CATALOG NAME:
DESCRIPTION:
Phonic's MAX 860 power amplifier provides 300 watts of power at 4 ohms -- ideal for medium sized venues, clubs, churches, etc. Phonic entry level power amplifiers maintain a solid performance at an affordable price. The MAX series amplifiers provide a range of different power options and features, and are rich in added features. Input to the MAX amps is achieved via an XLR and a phone jack, and output can be achieved through either Speakon connectors or traditional binding posts. MAX 860 features ground switches, user defeatable clip limiters, selectable high pass filters, and the option to choose between stereo, parallel and bridged operating modes, making the MAX series amplifiers ideal for real world, large scale application. Output power: 300W @ 4 ohm Professional quality performance High-current toroidal transformers for greater power and low noise Independent user-defeatable peak limiters reduce distortion Selectable high-pass filter at 30Hz or 50Hz XLR and 1/4 in. TRS input jacks Binding post and Speakon outputs Front mounted gain controls for easy access Signal and Peak LED indicators to monitor performance Short circuit, thermal, subsonic, RF protection, output DC offset, power on/off muting
PRODUCER:
PHONIC
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Lathe machine SN 502
CATALOG NAME:
DESCRIPTION:
SN 502 rotates a workpiece about an axis of rotation to perform various operations such as cutting, sanding, knurling, drilling, deformation, facing, and turning, with tools that are applied to the workpiece to create an object with symmetry about that axis. Tip width: 2000 mm Max. Workpiece diameter: 510 mm Max. Workpiece length: 1000 mm Spindle bore: 105 mm Rotational speed range: 25-1800 rpm. Metric thread: 0.5 - 88 mm Inch thread: 88 - 1 Module: 0.25 ... 44 M Gradient: 176 - 2 mm Shank diameter: 80 mm Shaft stroke: 200 mm Tailstock taper: MK 5 Main motor power: 7.5 kW Required total power: 12.3 kW Machine dimensions: 3600 x 1300 x 1360 mm Machine weight: 2270 kg
PRODUCER:
Intreprinderea de masini-unelte Arad
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Lathe machine ENHELL MTB 3000
CATALOG NAME:
DESCRIPTION:
Einhell MTB 3000 rotates a workpiece about an axis of rotation to perform various operations such as cutting, sanding, knurling, drilling, deformation, facing, and turning, with tools that are applied to the workpiece to create an object with symmetry about that axis.
PRODUCER:
ENHELL
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Universal milling machine - FUS 32
CATALOG NAME:
DESCRIPTION:
Dimensions of table working surface 950x450 mm Travel X-axis 560 mm Travel Y-axis 320 mm Travel Z-axis 400 mm Working feed 5_400 mm/min Rapid feed 1,4 m/min Spindle taper ISO 40 . Spindle speed 202000 - /min. Main motor power 2,8 kW Machine dimensions l x w x h 1546x1222x1780 mm Machine weight 1650 kg
PRODUCER:
FUS
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Rigol DSA832 SPECTRUM ANALYZER
CATALOG NAME:
DESCRIPTION:
The DSA800 family features a widescreen display, compact design, and easy-to-use interface making it ideal for benchtop or field apps in RF and wireless testing and production. The spectrum analyzer offers the ability to measure smaller signals using our digital IF filter, which allows for smaller bandwidth settings and reduces displayed noise levels. The DSA815 distinguishes between signals with a frequency difference as little as 10 Hz. The DSA832, DSA832E, and DSA875 have a DANL (displayed average noise level) down to -161 dBm (typical). In addition, Rigol offers great options including an EMI filter and quasi-peak detector kit, VSWR measurement package, and tracking generator ("-TG" version) for all of these models. A Preamplifier is standard on all models in the family. Whether your application is radio verification at 455 MHz or monitoring the 3rd harmonic of 2.4 GHz signals find the right spectrum analyzer in the DSA800 Series.
PRODUCER:
Rigol
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Phone:
+40256222119
Fax:
Dr. A. Păunescu Podeanu
,
144
,
Timisoara
300569
,
Timis
Romania
Loading Infrastructure
[T: 1.4852, O: 552]
Notification!
EERTIS
has replaced eeris. From now on, all updates and account activities will be on
EERTIS
. However, you can still migrate your remaining data from eeris to
EERTIS
.