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CEUREMAVSU-Euro-Regional Centre for Studies of Advanced Materials, Surfaces and Interfaces
National Institute of Materials Physics
Short link:
https://eeris.eu/
ERIF-2000-000W-0706
1688
Visits
The Center is dedicated to advanced studies on multifunctional materials, including two new laboratories (A1, A2) and 5 modernized laboratories (B1-B5): A1. The High-resolution Transmission Electron Microscopy Laboratory, with: (i) a Jeol ARM 200F high resolution electron microscope (atomic resolution, 0.8 Ångström) and (ii) focused ion beam sample preparation system with scanning electron microscope monitorization (Tescan); (iii) complex SPM scanning microscopy system. A2. The Cleanroom, cons...
Cristian Mihail
Teodorescu
teodorescu@infim.ro
Dr.
SCIENTIFIC TEAM
10
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Mihaela BAIBARAC
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Corneliu GHICA
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Victor KUNCSER
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Corneliu MICLEA
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Liviu NEDELCU
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Ioana PINTILIE
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Mariana STEFAN
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Cristian Mihail TEODORESCU
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Lucian TRUPINA
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Micro and Nanotechnology Facilities
RI Domain of activity
Materials Synthesis or Testing Facilities
RI Domain of activity
Analytical Facilities
RI Domain of activity
Research Data Management Plan:
No information available
Access Policy to Research Infrastructure and Related Services:
No information available
Research Services
Advanced TEM microstructural and compositional analysis
SERVICE DESCRIPTION:
• Morphological determination: shape and size of inorganic nanoparticles, nanowires/nanotubes, thin films. • Microstructural determinations: identification of crystalline phases, through electron diffraction and high resolution electron microscopy, distribution of crystalline phases in heterogeneous samples (thin films, alloys). • Compositional determinations: chemical elemental analysis using EDS technique, compositional maps using STEM-EDS.
SERVICE PERSONS:
Corneliu GHICA
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Complex electrical characterization of thin films
SERVICE DESCRIPTION:
Capacitance, current, charge measurements can be performed in various conditions of magnetic field, electric field, temperature, frequency and illumination. The service is dedicated to dielectric, ferroelectric, multiferroic, semiconductor materials and related heterostructures.
SERVICE PERSONS:
Ioana PINTILIE
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Analysis of impurities and crystalline phases in materials using the electron spin resonance (ESR) spectroscopy
SERVICE DESCRIPTION:
Electron spin resonance (ESR) spectroscopy detects chemical species and point defects with unpaired electrons (paramagnetic centers) in semiconductor and insulating materials (bulk and nanostructures), glasses, ceramics, polymers, biological compounds etc. - Characterization of the paramagnetic centers: nature, valence, structure, localization, concentration, stability, production and recombination mechanisms. - Information about the host material, using the paramagnetic centers as local probes: local structure and symmetry, presence of local strains, degree of lattice disorder, mechanisms of structural and chemical transformations.
SERVICE PERSONS:
Mariana STEFAN
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Complex characterization by using gamma resonant spectroscopy (Mosbauer)
SERVICE DESCRIPTION:
Mössbauer Spectroscopy is a spectroscopic method based on the recoil-free, resonant absorption and emission of low energy gamma rays (Mössbauer effect) in solids. The method allows us the study of hyperfine interactions in solids containing 'Mössbauer elements' e.g. Fe, Sn, Eu etc. The detection limit of this method is ~ 10-8 eV. Based on the hyperfine parameters obtained from Mossbauer spectra one can obtain useful information in different scientific fields. In the following a couple of successful applications are highlighted: valence state, electronegativity, ligand effects, chemical kinetics, corrosion, catalysis; magnetization states, superparamagntic effects, local environment, structure and the relative phase ratio; phase transitions studies understanding the structure and function of iron containing enzymes and bio materials; amorphous and nano material's study physical metallurgy, monitoring and the optimization process of alloys and special steels preparation; geology for identifying the composition of iron- containing specimens including meteorites, Moon and Mars planet rocks; cosmology (gravitational red shift, second-order transverse Doppler effect predicted by the theory of relativity), due to the very high energy resolution, etc.; Study of surfaces (0-300 nm) by means of the conversion electron detection (CEMS).
SERVICE PERSONS:
Victor KUNCSER
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High sensitivity magnetometry to characterize the magnetic properties of materials
SERVICE DESCRIPTION:
Modern equipment of high performance and sensitivity (SQUID magnetometer, VSM) allow a full characterization of the magnetic properties of samples, in magnetic fields up to 14 T and in an extended temperature range (2-1000 K).
SERVICE PERSONS:
Victor KUNCSER
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Characterization of thermodynamic and transport properties (thermal, electric) of materials
SERVICE DESCRIPTION:
High tech equipment allows the characterization of thermodynamic properties and heat and electrical transfer in a wide range of parameters (temperatures between 2 K and 1300 K and magnetic field between 0 and 14 T). It can measure specific heat, diffusivity and thermal conductivity, thermoelectric coefficients, electrical resistivity, magnetoresistances and Hall coefficients, the last three in continuous or alternative current.
SERVICE PERSONS:
Corneliu MICLEA
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Characterization of materials and devices in the microwave domain
SERVICE DESCRIPTION:
Antennas characterization (directivity characteristic) in anechoic room 900 MHz – 40 MHz • Two-port characterization, amplitude and phase distribution parameters 10 MHz – 67 GHz • Structural characterization in 75 GHz – 500 GHz band guide • Dielectric characterization of materials with low loss and high electrical permissiveness using the Hakki-Coleman method • Characterization of materials through perturbation method in rectangular cavity mode TE106 in X band • Characterization of materials (high precision for liquids) using the reflectometer method Agilent 85070 0,5 – 40 GHz band
SERVICE PERSONS:
Liviu NEDELCU
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X-ray absorption spectroscopy
SERVICE DESCRIPTION:
The EXAFS method provides structural information on local surrounding of absorbers atoms: • The number and the chemical nature of the nearest neighboring atoms • Interatomic distances • the degree of structural disorder around absorbing species The EXAFS spectroscopy presents some significant advantages compared with traditional techniques in RX diffraction: • atomic selectivity, consisting of separate description of local structure around each atomic species from a material however complex (due to the specificity of the atomic absorption limits with different energies of an atomic species to another); • high sensibility, permeating the investigation of highly diluted or scattered species • the same mathematical formalism in data analysis for periodic structures (crystals) or disorderly (amorphous, glass).
SERVICE PERSONS:
Cristian Mihail TEODORESCU
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X-ray photoelectron spectroscopy, various techniques (ARPES, SARPES)+scanning tunneling microscopy (STM)
SERVICE DESCRIPTION:
XPS method (X-ray photoelectron spectroscopy), also known as ESCA (electronic structure for chemical analysis) allows the obtaining of the following information: • Elemental analysis, ie identifying atomic species present in a sample • The binding energies of each internal electronic blanket depend on the initial state of ionization of the atom which has undergone the process photoionization process • Emitted photoelectrons have, in general, the kinetic energies ranging from tens of eV to about 1.5 keV • Photoelectron detection with low binding energy is a distinct field, which is also called Photoelectron spectroscopy of the valence band
SERVICE PERSONS:
Cristian Mihail TEODORESCU
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Surface morphology and properties investigation by SPM techniques (AFM, PFM, SNOM)
SERVICE DESCRIPTION:
Atomic force microscopy enables 3D analysis in nano and micrometer field of the surface topography and determination of local physical properties such as: electrical resistance, leakage currents, piezoelectric response, magnetization, elasticity. One can also study the morphology and roughness levels of thin layers of organic and inorganic material, submitted by various methods.
SERVICE PERSONS:
Lucian TRUPINA
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Raman spectroscopy applied to materials
SERVICE DESCRIPTION:
Raman spectroscopy is a technique of the vibrational spectroscopy based on the inelastic spread of the light phenomenon (Raman effect). The method provides essential information about the chemical composition, molecular structure, low frequency excitation in solids (e.g. acoustic phonons, plasmons, magnons), crystalline orientation, temperature, mechanical stress in the material, phase transitions.
SERVICE PERSONS:
Mihaela BAIBARAC
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Processing materials in clean room environment
SERVICE DESCRIPTION:
In the "Cleanroom" laboratory, with the necessary infrastructure for operation under conditions of high performance, synthesis and characterization of nanostructured materials can be performed, with complex equipment for the preparation and characterization of the samples. Clean room was designed, conducted and specifically operated according to international standards, especially EN ISO 14644, regarding the classification of such objectives as characteristic parameters, i.e. number of particles per air volume unit, temperature and humidity. NIMP clean room consists of two Class 1000 and 100 chambers, and offers sample preparation services of nanostructured materials and functional structures based on these materials and / or achievement the following operations: • Photolithography and nanoimprint; • substrate cleaning and chemical etching; • Surface processing samples with beam electron, ion beam; • Deposition of thin layers by Thermal Evaporation with / without Electron beam; • Preliminary characterization.
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Research Equipment
Ferroelectrics Tester TF 2000 E
CATALOG NAME:
DESCRIPTION:
The equipment can be used for the characterization of the ferroelectric thin films, performing: dynamic and static hysteresis loops; PUND; imprint; fatigue; leakage current.
PRODUCER:
(Aix ACCT)
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Near Field Optical Microscope
CATALOG NAME:
DESCRIPTION:
For optical characterization of organic, biological and inorganic samples combining Near Field Optical Microscopy with Scanning Probe Microscopy offering simultaneously optical and topographical information with a minimal preparation of the sample.
PRODUCER:
ABL Jasco
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Cryoprober with vertical magnetic field
CATALOG NAME:
Model CRX-VF Cryogenic Probe Station
DESCRIPTION:
The Model CRX-VF is a cryogen-free, closed-cycle refrigerator probe station enhanced with a ±2.5 T vertical field superconducting magnet.
PRODUCER:
Lakeshore
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Pulsed Fourier transform ESR spectrometer ELEXSYS E580
CATALOG NAME:
DESCRIPTION:
- X-band ESR spectrometer with E560 DICE II pulsed ENDOR and E580-400 pulse ELDOR accessories - Temperature range: 3.8 K - 300 K; - Magnetic field range: 0.03 - 1.45 T; Cw ESR operation: - Frequency range: 9.2 – 9.9 GHz; - Sensitivity 1.2 x 10^9 spins/Gauss; Pulsed ESR operation: - Central frequency: 9.7 GHz; - Pulse resolution 1 ns; - 1 kW microwave power.
PRODUCER:
BRUKER BIOSPIN GMBH
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
High-Resolution Transmission Electron Microscope
CATALOG NAME:
JEM ARM 200F
DESCRIPTION:
Configuration : · Field Emission Gun (FEG), 200 kV maximum accelerating voltage; · Cs-corrector for STEM mode; · STEM Unit; · EDS Unit: JEOL JED-2300T; · EELS Unit: Gatan Quantum SE; · CCD Cameras : wide angle Gatan Orius 200D, bottom mounted Gatan Ultrascan 1000XP, GIF camera Gatan Ultrascan 1000FT;
PRODUCER:
JEOL Ltd., Japan
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (85.81 kb)
Vector Network Analyzer
CATALOG NAME:
Network Analyzer E8361A PNA
DESCRIPTION:
Used for characterization of dielectric materials used for wireless telecommunications.
PRODUCER:
Agilent
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
FIB-SEM focused ion beam sample preparation system
CATALOG NAME:
Lyra 3XMU
DESCRIPTION:
SEM with field emission gun FIB, EDS, EBSD. Morphological and compositional determinations using EDS technique, compositional maps using SEM-EDS, FIB processing of micro-objects, TEM sample preparation.
PRODUCER:
Tescan
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (478.51 kb)
Mössbauer Spectrometer with magnetic field, low temperature (down to 2 K) cryostat
CATALOG NAME:
Mössbauer Spectrometer with magnetic field, ultralow temperature cryostat
DESCRIPTION:
The system consists in two parts: A. Superconducting magnet and low temperature cryostat (ICE Oxford -England); • Cryogenic low temperature superconducting magnet system for Mössbauer measurements provide a magnetic field at the sample up to 6 Tesla with vertical field direction (perpendicular on gamma rays direction) and a homogeneity of the magnetic field better than +/-1% in a 10 mm dsv. • The sample temperature can be varied in the range of 1.4 to 300K. The system includes temperature controller, superconducting power supply, pump and lines for operating the temperature insert, helium level meter, helium storage vessel and turbo molecular pump. B. Mössbauer spectrometer WissEL (Germany) • The Mössbauer spectrometer (WissEl- Germany) consists in two components: an electro mechanic system which create the conditions for the resonant absorption of gamma rays in the sample and the system for the detection and acquisition of gamma rays, emitted by the radioactive source, after crossing the sample under study. o The first component contains the velocity transducer and the drive unit and moves the radioactive source with velocity up to ±300 mm/s with linearity better than 0.15 % up to ± 100 mm/s. In constant acceleration mode, the velocity waveforms SINE or TRIANGLE can be optionally selected. o The second component, for the detection and data acquisition is a NIM standard and contains the following devices: proportional counter, preamplifier and amplifier, high-voltage supply, NIM BIN with power supply and MCS/PHA card for data acquisition.
PRODUCER:
Engelmann Scientific Technologies-Blieskastel (Germany); WissEL (Germany) and ICE Oxford (England)
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Download data sheet file (11.46 kb)
PPMS system for physical properties measurements
CATALOG NAME:
DESCRIPTION:
The Physical Property Measurement System, QD-PPMS-14, manufactured by Quantum Design (USA), is an open architecture system which is optimized to perform a variety of measurements at variable temperatures and magnetic fields. It can be easily configured to own designed experiments, by combining magnetometry, heat capacity and electrotransport measurements. The maximum attainable field is 14 T, while the temperature at the sample place can range from 2 K up to 1000 K (depending on the option).
PRODUCER:
Quantum Design
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
SQUID Superconducting Quantum Interference Device magnetometer
CATALOG NAME:
DESCRIPTION:
The Magnetic Properties Measurement System, QD-MPMS-XL-7AC, manufactured by Quantum Design (USA), employs the Superconducting Quantum Interference Device (SQUID) technology, to achieve the state of art sensitivity and reproducibility of magnetic measurements (10-8 emu resolution in magnetic moment, maximum field of 7 T, 10-4 T resolution in the maximum field, temperature range from 2 K to 400 K, with a maximum stability of 10^-3 K).
PRODUCER:
Quantum Design
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Two He Liquefaction Machines
CATALOG NAME:
DESCRIPTION:
For production of liquid He.
PRODUCER:
CRYOMECH
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
LEEM-PEEM Low energy and Photoelectron Electron Microscope
CATALOG NAME:
DESCRIPTION:
Methods available: Low energy electron microscopy (LEEM) in bright and dark field with a lateral resolution of 4 nm; Photoemission electron microscopy (PEEM) with two UV excitation sources (Hg lamp and He I - He II lamp), lateral resolution about 15 nm; Mirror electron microscopy (MEM); Micro-Low energy electron diffraction (Micro-LEED); k-space mapping with sub-micron lateral resolution (individual grains). recording LEEM, PEEM, MEM, LEED movies in real time during thermal treatments, ion sputtering or thin layer growth.
PRODUCER:
Specs
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Scanning electron microscope and nanolithography system
CATALOG NAME:
DESCRIPTION:
Equipment components : Hitachi S3400 SEM Raith ELPHY Quantum Electron Beam Lithography Raith High Precision Positioning Stage with Laser Interferometer Deben PCD Beam Blanker Probe current meter Keithley 6845 Picoammeter Beamblanker Driver Electronics Dedicated Software
PRODUCER:
Raith, Hitachi
PRODUCTION YEAR:
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
SPM Scanning Microscopy Station
CATALOG NAME:
DESCRIPTION:
Available techniques: Atomic Force Microscopy (AFM) with: (Contact mode) Force modulation technique. Topography and local elasticity images. (Contact mode) Contact Capacitance Technique. Topography and local capacitance images. (Contact mode) Lateral force imaging. (Contact mode) Piezo Force Microscopy. (Contact mode) Spreading resistance imaging. (Semicontact mode) Phase contrast imaging. Lithography operations. Two ways for lithography impact (BV/SP). Two ways for lithography execution (Raster/Vector). Heating stage operations. Operations in liquid.
PRODUCER:
NT-MDT
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Small dimension line measurement station
CATALOG NAME:
Model CPX-HF Cryogenic Probe Station
DESCRIPTION:
The CPX-HF is designed to enable true 90° wafer probing on wafers up to 25 mm (1 in) in diameter. The continuous refrigeration station uses either liquid helium and can be operated with liquid nitrogen; however, the superconducting magnet requires liquid helium to operate. The CPX-HF operates over a temperature range of 4.2 K to 400 K with the option to extend the base temperature to 2 K.
PRODUCER:
Lake Shore
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Photolithography System
CATALOG NAME:
DESCRIPTION:
Technical Specifications of EVG620NT (EV Group GmbH): Mask Aligner Exposure modes: hard-, soft- and vacuum contact Proximity separation distance 0-300 μm adjustable via software Wafer thickness 0.1 – 10 mm Semi automatic loading with mechanical prealignment 5 Ms-Windows® -based process software for recipes, diagnostic and operation Unlimited storage of recipes Remote diagnostics 500 W Hg UV lamp Alignment stage with precision micrometers Automatic wedge compensation WEC contact force 0.5 – 40 N adjustable Mask holder for 4” x 4” masks with loading frame Vacuum Contact wafer chuck 3” , 2” and pieces
PRODUCER:
EVG
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Terahertz Time-Domain Spectrometer up to 7 THz
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Aispec
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Metallization system for deposition of noncontaminated metals
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Bestec
PRODUCTION YEAR:
2011
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Metallization system for deposition of contaminated metals
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Bestec
PRODUCTION YEAR:
2011
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
XAS X-ray Absorption Spectrometer
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Rigaku
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Class ISO 1000 and 100 Cleanroom Assembly
CATALOG NAME:
DESCRIPTION:
In conditions of minimum particle contamination, the cleanroom is fitted with the infrastructure for: ƒ Preparation of material samples and precursors; ƒ Preparation of samples of nanomaterials ƒ Sample processing ƒ Optical lithography and nanolithography; ƒ Preliminary characterization of samples; ƒ Fabrication of prototype devices ƒ Measurements and preliminary characterization of electrical and/or optical properties of devices;
PRODUCER:
EDAS-EXIM
PRODUCTION YEAR:
2010
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Angle- and Spin-resolved Photoelectron Spectroscopy
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Specs
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Raman Microscope
CATALOG NAME:
DESCRIPTION:
PRODUCER:
Jobin Yvon
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Triple Raman System with confocal microscope attachment, model T64000
CATALOG NAME:
DESCRIPTION:
Raman system T64000 is equipped with a confocal Olympus BX41 microscope that permits experiments on micrometer size samples, with an improved lateral and depth resolution; a macro chamber is also available; excitation laser sources are: (a) Argon laser (the main lines at 514.5 nm and 488 nm), (b) Krypton laser (lines at 647.1 nm and 676. 4 nm) and (c) solid lasers (562 nm and 633nm). Raman spectra are recorded with a resolution of 2 cm-1 for the 1800 gr/mm diffraction grating.
PRODUCER:
Horiba Jobin Yvon
PRODUCTION YEAR:
2009
COMMISSIONING DATE:
PRICE RANGE (at the time of purchase)
DATA SHEET:
Phone:
+40-(0)21-2418100
Fax:
Atomistilor
,
405A
,
Magurele
077125
,
Ilfov
Romania
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